Test Fixtures
UUT interconnect interchangeable with tester.
See Also: Fixtures, Mechanical Fixtures, Vacuum Fixtures, ATE Fixtures, PCB Test Fixtures, Board Test Fixtures, Bed of Nails, Spring Probes, Test Jigs, Test Probes
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Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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System Level Test and Burn-in Solutions
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System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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In-Line Functional Test Fixtures
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Add an advantage to in-line production with fast change over interchangeable fixturing. Circuit Check’s in-line board handlers and in-line board handler fixturing exceed the high performance requirements associated with high-volume production. Circuit Check supports in-line fixturing for all the leading handlers.
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Product
High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
Digital I/O
The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Each digital channel features a wide drive / sense voltage range of -14 V to +26 V (maximum swing of 24 volts) which can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) for DC measurements.
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Product
PXI 12x8 RF Matrix 300MHz 50 SMB
40-726A-511
Matrix Switch Module
The 40-726A is a 12x8 RF Matrix Module suitable for switching frequencies up to 300MHz (50Ω version). The 40-726A is available in either 50Ω or 75Ω versions with a choice of coaxial connectors. The module is designed to provide a simple and scalable bidirectional matrix for RF frequencies. Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture. This maximizes isolation and RF performance.
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Product
Interface Pin
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Smiths Interconnect offers interface probes for all major test equipment manufacturers. We also provide a variety of interface pins for use in test fixtures.
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Adjustable Press Plate Bed of Nails Testers
Prober Adjustable Family
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Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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Product
Press Down Rods Bed of Nails Testers
RandHDPE HDPE Family
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HDPE plastic plates for extra easy machine ability and upgradeability. Designed for Research & Development and Pre-Production where product engineering changes are a weekly issue. The primary design focus is easy upgradeability. In R&D and Preproduction, design changes can happen every week. This fixture unlike normal test fixtures was designed to be easily taken apart and updated. Disassembling a normal bed of nails test fixture over and over again can be a major disaster with wire breakage and test pin bending issues. The modular design of the Rand fixture allows for easy disassembly without flexing the wires or risk of bending test pins. The Rand fixture provides complete easy access for machining, drilling and wiring updates.
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Product
PXI 10A Fault Insertion Switch 6-chan 2-bus
40-192-012
Fault Insertion Unit
This PXI fault insertion switch uses solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test: Open-Circuit. Short-Circuit between UUT connections. Short-Circuit to external signals. Through relays on each channel enable signals to the UUT to be set open-circuit. Fault Insertion Buses allow any channel to be shorted to any other channel and also enable any channel to be connected to an external signal such as Power, Ignition or Ground to simulate fault conditions. The module is supplied with 2 fault buses.
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Product
Exchangeable Test Fixture
MA 2109/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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Exchangeable Test Fixture
MA 2111/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Product
Actuation Methods for In-Circuit Test Fixtures
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Commonly referred to as In-Circuit Test (ICT), loaded board test can be defined as the task of measuring values of components that have been installed on a printed circuit board (PCB). A second basic category of loaded board test measures simple open and shorts on the board to verify manufacturability standards. Circuit Check supports all forms of in-circuit test strategies with its Performance Grade and Value Line test fixtures.
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Test Fixture, Shielding Effectiveness
EM-2108 | 1.5 GHz – 10 GHz
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The EM-2108 is a standard test fixture for evaluation of the electromagnetic shielding effectiveness (SE) of planar materials.
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Product
Press Down Rods Bed of Nails Testers
Protector Press Rods Family
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Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Latch-on Test Fixtures
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Latch-on Test Fixtures provide a convenient way for production personnel to quickly and reliably make electrical connections to a product for programming or final test. These custom fixtures eliminate the need to hand-wire products in order to power them up and communicate with them. Typical applications for latch-on test fixtures are metering devices, control panels, and any type of controls that connect via terminal strips.
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Product
Electrical Tester
R580
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Nidec-Read's R580 Electrical Tester provides an affordable test system for your bare board electrical test needs. You can easily integrate the R580 with your existing manual test fixtures or select from several fixture options from Nidec-Read. The R580 is supplied with opens/leakage test ability. In addition, you can include other advanced electrical test techniques.
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In-Circuit Test Fixtures
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Every type of in-circuit test fixtures (wired, wireless, pneumatic, vacuum) for all major tester brands.
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Product
Bench Mounted Tester
Flex 10
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The Flex 10 bench mounted ATE is the smallest ‘standard’ tester in our range. The system comprises a single unit, measuring 600mm x 360mm x 660mm. A VPC S6 interface is normally used on this system allowing multiple test fixtures to be used with the system.
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SMD Test Fixture
16034G
Test Fixture
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Product
Accessories
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Hunan Linkjoin Technology Co., Ltd.
Linkjoin accessories - electromagnet, core test fixture, epstein frame, DC permeameter, AC permeameter, reference magnet, magnetic flux fixture, solenoid, helmholtz coil, temperature controller, etc
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ADI Test Fixture
TA-6500
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The TA-6500 test fixture combines the features of the OEM's Instrument Servo Tester(T307962), the Pointer/Flag Test Fixture(T307951) and the AD-650/600 Test Panel(T334043) all into one panel to facilitate testing of these Attitude Director Indicator's. The panel switches and adjustment pots are labeled to match the test procedure numbers and the duplicity in marking makes it easier for the technician to understand each function. The UUT interface is through a 96 pin zero insertion force(ZIF) type connector to minimize contact wear. The expanded localizer and nav input pins J2-34/35 are exposed on the panel to facilitate the insertion of a 200 ohm shunt when required. The fixtures rear panel has connectors for the required dual API/Synchro transmitter interface while the panel switches provide the correct routing of each.
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Product
PXI Fault Insertion Switch, 6-channel, Two Fault Buses, 10 A
40-192A-012
Switch Module
The 40-192A-012 is a PXI fault insertion switch using solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
One Port Vector Network Analyser
TE3001
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The TE3001 One Port Vector Network Analyser is built for the professional who understands the calibration process and has a network analysis task to perform. The unit features a larger output signal than the TE3000 for better noise immunity, and is supplied with a 6 piece custom calibration kit to remove the effect of test fixtures and cables. Together, these features make the TE3001 ideal for broadcast and plasma applications that require a length of cable for connection and may be high in noise or interference.
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Product
SHC68-C68-D4, 68-Pin, Male VHDCI to 68-Pin, Male VHDCI, 50 Ω, Shielded Digital Cable - 2m
781293-01
Digital Cable
The SHC68-C68-D4, 2m, Digital Cable connects NI 6535/6/7, 654x, 655x, and 657x digital instruments with other NI accessories like the CB-2162 Connector Block or SMB-2163 Terminal Block. You can also use it with certain Digital I/O Adapter Modules for FlexRIO, Digitizer Adapter Modules for FlexRIO, Signal Generator Adapter Modules for FlexRIO, and high-speed serial instruments. It is flexible and easily fits around custom test fixtures and other equipment. It is a shielded, 50 Ω cable and is offered in different lengths.
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Stand-Alone Test Fixture
MA 2012/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 15,50 kg
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28 cm2 Test Fixture Operations Kit
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The 28 cm2 Cell Test Manifold Kit offers a highly effective solution for testing of individual planar solid oxide fuel cells. The kit contains all items necessary to easily mount cells with ~100 cm2 substrates. Designed for both long and short term experiments to measure properties such as fuel utilization, thermal gradients, red-ox cycling and longevity/degradation, these kits will accelerate your research and development activities.
