Discrete Semiconductor Testers
check connected individual semiconductor components.
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Product
3U OpenVPX Multichannel Discrete I/O Board
68DT1
Multifunction I/O
The 68DT1 is a 3U OpenVPX™ board featuring up to 96-Channels of Standard Functionality (SF) DT1 module-type or Enhanced Functionality (EF) DT4 module-type Discrete I/O functions [foptioned, factory configurable].48-Channels are dedicated as input (voltage or contact sensing with programmable, pull-up/pull-down current sources). An additional 24 or 48-Channels are programmable for either input or output (current source, sink, or push-pull) switching up to 500 mA per channel from an applied 3 – 60 V external VCC source (or sink to ISO-GND). The 68DT1 can sense broken input connections and whether an input is shorted to +VCC or to ground. Additional features of the DT4 EF are listed below. The 68DT1 offers unparalleled programming flexibility, a wide range of operating characteristics, and a unique design that eliminates the need for pull-up resistors or mechanical jumpers.
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Semiconductor Technology
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Semiconductor technology has maintained exponential performance growth, transforming society at a blistering pace. Now, all eyes are on the industry to keep up that rate – commonly associated with Moore’s law – to accommodate for challenges such as the steeply growing amount of data, low-power edge computing for artificial intelligence and high-performance computing to crack some of the world’s toughest problems.
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Semiconductor
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Semiconductor technology requirements often outpace the test coverage that traditional ATE provides for analog, mixed-signal, and RF test. Semiconductor test engineers need smarter solutions that address cost, scalability, design, and device challenges.
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Semiconductor Test
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Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Product
32-CH Discrete Output Modules with U Profile
HSL-DO32-UD
Digital Output Module
*UD type is suitable for screw type wiring. Each wire to sensors or actuators can be fixed by the screw terminal*RJ-45 phone jack for easy installation*Compact and single board design to meet space limitation and cost-effective requirement*Support 32 DO channels*Transmission speed: 3/6/12 Mbps
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NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Semiconductor
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You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
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Product
32-CH Discrete Output Module
HSL-DO32-M-N/HSL-DO32-M-P
Digital Output Module
Slave ID consumption: 2 consecutive from odd"N" type for NPN sinking type outputSwitch capacity: Single channel 500 mA; all channels 60 mA at 24VDCPhoto couple isolation voltage: 2500 VrmsResponse time: ON→OFF: 180µs, OFF→ON :1.2µsLED indicator: Power, Link and Output statusPower supply: +10V to +30 VDCOperating temperature: 0 to 60°C
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Product
Module, Receiver, RTCASS, Signal, 210 Position, Discrete Wiring
510113146
Receiver Module
Module, Receiver, RTCASS, Signal, 210 Position, Discrete Wiring.
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Product
Semiconductor Optical Amplifiers
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A Semiconductor Optical Amplifier (SOA) is essentially a laser diode (LD) with no feedback from its input and output ports and hence is also referred to as a Traveling-Wave Amplifier (TWA). Semiconductor Optical Amplifiers (SOAs) have proven to be versatile and multifunctional devices that are key building blocks for optical networks.
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Discrete Input Event Recorder
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Wabtec M Series Recorders provide a compact recording solution for discrete electrical and pneumatic signals and provide compliance to FRA Crash Hardening requirements.
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Product
ITA, G18, 18 Module With Discrete Wiring And PCB Capability
410120101
ITA
ITA, G18, 18 Module with Discrete Wiring and PCB Capability
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Product
Semiconductor Equipment Manufacturers
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Integrated Dynamics Engineering
With shrinking process geometries, new structural elements and a major increase in substrate size, the challenges to improving process yield and overall throughput have increased exponentially. These demands drive a stringent requirement for system stability and overall immunity from internal and external forces.
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Product
Semiconductor Package Wind Tunnel
WT-100
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Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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Product
Smartchem Discrete Analyzers
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Fully automated, multi-parameter, direct read discrete analyzers, available in bench-top or floor-stand models, for simple and automated chemistries. Up to 200 samples and up to 600 tests/hour.
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Product
Semiconductors
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Multiphysics Analysis Solutions for Chips and 3D IC Systems. Ansys cloud-native solutions provide unparalleled capacity to speed up completion times for even the largest finFET integrated circuits (IC) and 3D/2.5D multi-die systems. These powerful multiphysics analysis and verification tools reduce power consumption, improve performance and reliability, and lower project risk with foundry-certified golden signoff verification.
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Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Semiconductor
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Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.
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Product
Protective Cover, 9050, VXI and Discrete Wiring, ITA
410112582
Protective Cover
When storing the ITA, the cover snaps on to protect the modules and contacts. The body of the cover is clear chromated aluminum and the mounting blocks are made of Delrin.
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Scorch Tester
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TESTEX Testing Equipment Systems Ltd.
Scorch Tester, to determine fabrics Ironing color fastness and sublimation color fastness, and dimensional stability under hot dry conditions. Sublimation Fastness Tester complies with ISO 105, BS 1006, AATCC 92/114/117/133. Sublimation machine price is reasonable.
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Drop Testers
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This process is vital for ensuring that products travel to customers safely and securely, eventually arriving damage free. In turn, drop test systems help companies save money and maintain positive brand-owner reputations by helping to design packaged products that will deliver products with their intended inherent quality intact. Lansmont Drop Test Systems are the gold standard for accurate and repeatable drop testing. Every drop tester we manufacture is factory-tested to ensure it meets flatness-of-drop requirements and exceeds industry specifications.
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Product
Line Tester
CAT 1 TEST
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Monacor International GmbH & Co.
Line tester for continuity testing of Cat 5, Cat 6 and ISDN network cables*Connection test with LED display for 8 individual wires and shielding*Continuity, miswire, open, short, crossover, and ground detection*Connector compatibility with the following modular plugs: RJ45 (8P8C), RJ12 (6P6C), RJ11(6P4C, 6P2C)*Network standards supported: Token Ring, 10Base-T, 10Base-T2, 285A, TIA568A/568B*Separate receiver for particularly long and complex cables*The main unit and separate receiver can be attached to one another using a guide rail on the side*Power supply via 9 V block battery (not included)*Supplied with protective bag
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Adhesion Testers
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From the largest man-made structures to the smallest household appliances, most manufactured products have a protective or cosmetic coating. Premature failure of this coating can, at the very least, result in additional costs of rework. Adhesion testing after the coating process will quantify the strength of the bond between substrate and coating, or between different coating layers or the cohesive strength of some substrates. Routine adhesion tests are used as part of inspection and maintenance procedures to help detect potential coating failures.
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Emulates Dallas Semiconductors DS89C420
FE-C420
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* Emulates Dallas Semiconductors DS89C420 * 16K Code Memory * Real-Time Emulation * Frequency up to fmax at 3V and 5V * ISP Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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ESD Tester
GZ600 HID
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• Personal equipment tester with badge reader• Compact• LCD digital display• Identification by RFID badge• Possibility to program test parameters for each employee• Allows communication with the company network or the dedicated server (SQL database)• Supplied with a shoe test mat• 4 test modes: bracelet / shoes / bracelet and shoes / bracelet or shoes
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Continuity Tester
69133
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Quickly reveals shorts or broken circuits in all types of electrical devices and controls.Tests for continuity of circuit with power off.Bulb in handle glows when circuit is complete (bulb included).Pointed 3-3/4'' (95 mm) probe gets right to the problem.Deluxe 4'' (102 mm) long handle with removable nylon cap holds replaceable bulb and battery.36'' (914 mm) test lead with alligator clip.Uses one AAA battery (not included).Replacement bulb (Cat. No. 69131)
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EMC Testers
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The KES7000 System is a conductive immunity test system that is fully compliant with ISO7637-2 and ISO7637-3, international standards for EMC testing required for automotive electronic components. This system consists of the KES7700 Series Transient Surge Tester, KES7400A Series Voltage variation simulator and KES7100 application software dedicated to the KES7000 system. This product configuration supports JASO standards and the special test requirements of car manufacturers with options or custom orders.
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Product
Softness Tester
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TESTEX Testing Equipment Systems Ltd.
Softness Tester, to determine the softness of leather and coated fabrics and other soft materials. Softness tester does not need samples to be cut from leather prior to testing.
