Discrete Semiconductor Testers
check connected individual semiconductor components.
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Semiconductor Solutions
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Bruker's suite of technologies for semiconductor manufacturing address critical metrology and process needs across the broadest range of applications from R&D to process improvement. 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation products.
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Thyristors - Phase Control Discrete
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Phase control discrete thyristors from Vishay are available in more than a dozen package types and with voltage ratings from 4 V to 2600 V.
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Semiconductor Packaging System
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Inspects the quality of finished cells by measuring the gap between the battery electrode laminate and aluminum can.
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Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Compound Semiconductor
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Scientific Computing International
Semiconductors that are made from two or more elements.
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Discrete Devices Test
FTI 1000
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The FTI 1000 tester consists of independent test channels that allow all DC and AC MOSFET parameters to be tested either separately, or in one handler insertion or prober touch-down.
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Hi-Speed Discrete Test System
QT-6000
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QT-6000 Test System, with built-in capacitance test (DC+CAP) and Scanbox etc, is applicable to devices like medium & small power transistors, MOS-FET, diodes and Wafer.
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Semiconductor
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PackageFunctionSMV(2.9mm*2.8mm)AND GateUSV(2.0mm*2.1mm)NAND GateFM8(5.0mm*4.5mm)NOR GateSM8(2.9mm*4.0mm)OR GateUS8(2.0mm*3.1mm)INVERTER
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Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Benchtop Discrete Component Tester
Imapact 7BT
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The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
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PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Semiconductor Curve Tracer
CS-5000 Series
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*Max. Peak Voltage : 5,000V（HV mode）*Max. Peak Current : 1,500A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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Semiconductor Products
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International Testware Corporation
International Testware supports all major ATE models for today's semiconductor products.CredenceAdvantestCaesarHewlett-PackardLTXIMSSchlumbergerAndo...and MANY moreTeradyneMosaidOur Solutions offer:Mixed-SignalEMI ReductionR/FCustom TailoredLow NoiseReliable PerformancePrecise Length MatchingSuperior Impedance ControlCrosstalk "Immunity"Minimal Inductance
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Semiconductor Test Hardware Solutions
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A critical element of every semiconductor test solution is the interface between the device and ATE. The hardware team at Test Spectrum has produced thousands of successful test interface solutions for some of the most challenging semiconductor products on all major ATE platforms. Our in-house team of PCB design experts has an added advantage of direct access to our senior test engineering staff.
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Discrete Devices High-speed Testing System
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QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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32-CH Discrete Input Modules
HSL-DI32-M-N/HSL-DI32-M-P
Digital Input Module
- Slave ID consumption: 2 consecutive from odd- "N" type for NPN sinking type sensor or dry contact; "P" type for PNP sourcing type sensor or wet contact- Photo couple isolation voltage: 2500 Vrms- Input impedance: 4.7 KΩ- Input current: ± 10 mA (Max), ± 12.5 mA (Peak)- Input voltage: ± 40 V (Max)- LED indicator: Power, Link and Input status- Power supply: +10 V to +30 VDC
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16-CH Discrete Input 16-CH Discrete Output Daughter Board Module
HSL-DI16DO16-DB-NN
Strain/Bridge Input Module
- Slave ID consumption: 1 16-CH NPN sinking type sensor inputs or dry contact and 16-CH - NPN sinking type outputs- Photo couple isolation voltage: 2500Vrms- Input impedance: 4.7KΩ- Input current: ??10mA(Max), ??12.5mA(Peak)- Input voltage: ??40V (Max)- Output switching capacity:300mA/ch at 24VDC- Terminal Base:HSL-TB64 or HSL-TB32-DIN- LED indicator: Power, Link and I/O status
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Compact Semiconductor ATE
QST286
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Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
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Bit Error Rate Tester - MATRIQ
Tester
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Discrete Detectors
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TRAL test station is a quasi-universal test station designed to measure parameters of discrete (or small linear array) infrared detectors sensitive in a wide spectral range from about 700nm to about 16 000 nm (NIR/SWIR/MWIR/ LWIR detectors or broadband non selective detectors). All main types of infrared detectors can be tested: photonic detectors: photovoltaic/photoreconductive, cooled/non-coooled, thermal detectors, pyroelectric detectors etc.
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Discrete C-Size Switch Cards
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Compatible for use on VXI platforms, these switch products were formerly sold under the Racal Instruments brand name.
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Trusted Semiconductor Die/Wafer Source
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To offer a complete Turn-Key Solution requires the ability to source both leading edge high density and older die/wafer products. DPACI has factory direct access to Static Ram, Flash and DRAM Die/Wafer. For obsolete parts, DPACI can assist you with sourcing or recommend an upgrade. DPACI has access to roadmaps, data sheets and die maps to assist you with your choices.
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Power Semiconductor Device
IGBT/SIC
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Hitachi High Voltage IGBTs have been corresponding to a wide range of applications such as railway applications and various power conveters, leading companies for domestic and overseas adopt them, since they were adopted as a railway application in 1992. Will continue to contribute to the developing energy society by pursuing more easy-to-use, high-performance and high -quality products with leading-edge research and development.
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Semiconductor Test
Ismeca NY32
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32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.
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Semiconductor Large Range Type Tester
HS-PSTT
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HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
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Manual Semiconductor Metrology System
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Front USB port enables easy storage of measurements and other data to flash drivesMTI Instruments’ Proprietary Capacitance Circuitry for Outstanding Accuracy and DependabilityNon-contact measurements76-300 mm diameter wafer rangeOptional wafer measurement ringsWafer stops for exact centeringEthernet interfaceFull remote control software (Windows compatible)Optional calibration wafers
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Semiconductor Test Services
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Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
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68-Pin SCSI Micro-D Female Discrete Wire
40-962-068-F
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This connector is designed to allow users to directly terminate with IDC connections to the 68-Pin SCSI Style Micro D connector. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Semiconductor Test Software Solutions
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The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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3U OpenVPX Multichannel Discrete I/O Board
68DT1
Multifunction I/O
The 68DT1 is a 3U OpenVPX™ board featuring up to 96-Channels of Standard Functionality (SF) DT1 module-type or Enhanced Functionality (EF) DT4 module-type Discrete I/O functions [foptioned, factory configurable].48-Channels are dedicated as input (voltage or contact sensing with programmable, pull-up/pull-down current sources). An additional 24 or 48-Channels are programmable for either input or output (current source, sink, or push-pull) switching up to 500 mA per channel from an applied 3 – 60 V external VCC source (or sink to ISO-GND). The 68DT1 can sense broken input connections and whether an input is shorted to +VCC or to ground. Additional features of the DT4 EF are listed below. The 68DT1 offers unparalleled programming flexibility, a wide range of operating characteristics, and a unique design that eliminates the need for pull-up resistors or mechanical jumpers.
