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Test Handlers
Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.
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Turret Test And Scan Handlers
Turret platforms for semiconductor test, inspection and packaging.
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Observational Systems: Data Handlers And Battery Packs
Data loggers allow users to connect a variety of sensors to a single controller that manages, stores, and sends the collected data as a single data stream.
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Power Discrete Tester
Mostrak-2
M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
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Test Handler
JOT M5
Simple, cost-effective way to automate PCB and pallet based testingSafe, reliable product handlingQuick-adjust ease: no product-specific partsFaster handling of smart productsIndustry 4.0 autonomous interconnectivityTruly scalable for growing test needsReusable, application-specific test boxesM-TestBoxes compatible with M1 handlerBoxes are fully independent, just pull out from M5 rack and use in off-line testingFail product separation to integrated magazineSpacious service-friendly constructionErgonomic workspaceTouchscreen UI with base statistics and service capabilityEasy start-stop operabilityAutomated width adjustment
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Prototype Engineering Test
PET-2/PET-3
Exatron's Prototype Engineering Test (PET) Fixture is a semi-automated solution that bridges the gap between a fully automated handling system and a low cost, lower volume handler.
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High Speed Pick and Place Handler
Commander 2000
At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
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Modular Gravity Handler For Small Devices
Rasco SO2000
Modular designed gravity handler with various input and output possibilities. SO2000 can handle the smallest possible packages for gravity and provides a broad range of Sensor and MEMS applications.
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ICT: In-Circuit Testing
XILS In-Line Handling Solutions
Designed to cover a large number of test points, with long panels for future expansion, the XILS series of Handlers, PCB test systems in the line of EIIT - Innovative Engineering Solutions, is ready for the most demanding applications.
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Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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Inline Test Handler W/Bypass
6TL36
The 6TL36 test handler is the first ATE handler on the market that easily integrates the radio frequency tests into mass production lines.The modular approach of the 6TL36 offers the possibility of adding handlers together for a work in parallel that reduces the cycle time and saves costs as well as space when compared to traditional parallel solutions. Therefore, the system can be ordered with only one conveyor, with two conveyors (bypass or dual-line), and with three conveyors (Retour conveyor).
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Test Handler
M6242
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Full Range Active Thermal Control Handler
3110-FT
Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.
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Gravity Test Handlers
Extremely small to very large packages, very wide temperature range, high throughput octal site and quad site testing.
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Inline Handler W/By-Pass Line Master Push Down
6TL33
A perfect basis for a heavy-duty, reliable, high precision, and automatic integrated Test system for medium to high demanding environments. Important technical and economic advantages due to their modular structure and expansion capability are evident. The production testing environment will be flexible and efficient, helping towards the always valued Return of Investment.
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Universal Manipulator
LSC
The LSC is a versatile universal manipulator, compatible with probers, vertical plane handlers, and dock-from-below test systems.
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6TL36 Inline Handler
AM304
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Gravity Handler
State of the art model, which features a high throughput capability, eight sites, and high and low temperature measurements, and meets all high-frequence contact requirements. Complete measures to prevent jamming and lead deformation enable high availability. This model is highly regarded by top users around the world because of its high throughput and high reliability.
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Test Handler
Test Handler is an equipment that automates the final testing of semiconductor devices. It handles device transportation, controls temperature during semiconductor testing, and sorts devices based on test results.
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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Test Handler
M4841
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Capacitor Leakage Current Meter
DU2316/2317
Delta United Instrument Co., Ltd.
Leackage Current range display: 0.0001uA ~ 20.00mAAutomatic or Manual trigger with CHARGE/TEST/DISCHARGE100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceHi / Lo current limit setting & PASS/FAIL judgment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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MEMS Inertial Test
Cohu´s inertial solutions enable high precise Gyroscope and Accelerometer test with best-in-class cost of test due to high parallelism and package flexibility. All Cohu stimulus modules guarantee high precision and velocity stability as well as high temperature accuracy. With use of our high efficient handler portfolio we can offer the ideal solution with optimized cost of test.
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Sensors And MEMS Test
Easy docking and undocking of the MEMS modules to the standard test handler whether Gravity, Pick and Place or Test in StripTest in the complete tri-temp range for ambient, hot and cold (automotive certified)Easily convertible to other packagesDownscaled stand-alone engineering set-up availableGlobal support by experienced Cohu Field Service and Applications staff
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Interface Solutions
Cohu is the market leader in semiconductor test sockets and has 50+ years of semiconductor test expertise providing optimal test contactor and probe pin solutions for every type of application and challenge, using innovative and sophisticated R&D methods.We offer a full suite of test contactors that provide the electrical interface between the tester and the semiconductor device presented by the test handler; optimizes signal performance via an array of consumable probe pins.
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MEMS Handler
4664-IH
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Fully Automated In-line Test System For LED Light Engines
We are pleased to announce that we have received an order for the supply of a fully automated in-line test system for testing LED light engines from ASD Lighting, based in Rotherham. The solution provided, consists of an in-line handler fitted with a vision system. The camera software is capable of learning the position of all LED’s on a new pcb, thereby reducing the time to introduce a new product. In addition to identifying the location of any missing or faulty LED’s the tester measures the colour temperature of every pcb. An image is taken of faulty units with the location of any missing LED’s identified
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LCRZ Tester
DU-6218
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Kitless Pick-and-Place Handler
900
Exatron now offers a new breed of Benchtop Pick & Place Handlers: the Model 900 series. The Model 900 is an extremely efficient yet inexpensive PC controlled Pick & Place System
