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In-Line Functional Test Fixtures
Add an advantage to in-line production with fast change over interchangeable fixturing. Circuit Check’s in-line board handlers and in-line board handler fixturing exceed the high performance requirements associated with high-volume production. Circuit Check supports in-line fixturing for all the leading handlers.
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Programmable Low-Ohm Meter
DU5210/5211
Delta United Instrument Co., Ltd.
20m ~ 2Mtest range, 0.1% accuracy Provided Level and Pulse measurement modes, can be lower temperature influence in Pulse Mode Provided HI/LOW limit and BIN Sorting comparator function, to meet your needed 100 sets of memory, can be saved test parameter and comparator setting, easy to use. Auto Calibration Program Function, to easier your calibration procedure. (Specificity calibrator needed) Cover up free, system firmware upgrade can be update via RS-232, easy to maintenance High speed FADC, max. test speed up to 80 meas./sec, faster your automation equipment 240*64 Graphic LCD display, can be read the reading clearly and easier. User friendly programmable interface, easy to use Provided RS-232C and Handler combinatorial interface option, to meet your needed
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Docking / ATE
The iDock Series is a series of connectors ideal for use with automatic machine handlers in production testing. Floating bushings allow up to .04" of re-alignment. Use with a combination of various I/O modules and a max of 5,952 signal contacts simultaneously. The iDock series is rated up to 100,000 cycles.
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Automatic System Function Tester
3240
Chroma 3240 is an innovative handler for high-volume multi-site IC testing at the system level.
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Precision LCR Meter
TH2816B
Changzhou Tonghui Electronic Co., Ltd.
TH2816B is a new precision LCR meter combined with years of technical experience and newest measurement technology of instrument industry. With powerful measurement functions, high performance and low cost, TH2816B has been one of the world advanced instruments, and it provides users a super value measurement resolution and experience. The meter offers stable 6 digit resolution, wide frequency range ( 50Hz to 200kHz for TH2816AB), programmable signal level (0.01V to 2.0V), up to 30 meas/sec measurement rate, 9 measurement ranges, 30Ω or 100Ω constant output impedance and friendly operation interface. TH2816B can be used for incoming inspection of components, quality control of product line and high accuracy laboratory use. The HANDLER, GPIB, RS232C interfaces make it easy to build an automatic component test system,
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Software Tool Especially Designed for Production Process Supervision
LEON OP
The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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TestStation Automated Inline Handler | In-Circuit Test Solution
Teradyne’s High-Speed Inline Automated Board Handler with TestStation Multi-Site Test Insert is designed for productivity, fast change-over, and low operating cost. Our in-circuit test solution fits seamlessly into automated production lines to provide “hands-off-lights-out” operation.
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50Hz-100kHz LCR Meter
11022/11025
Chroma Systems Solutions, Inc.
0.1% basic accuracyTransformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies21ms measurement time (≥100Hz)Agilent 4263B LCR Meter commands compatible4 different output resistance modes selectable for non-linear inductor and capacitor measuringHigh resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ rangeAdjustable DC bias current up to 200mA (constant 25Ω) (11025)1320 Bias Current Source directly control capability0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)Dual frequency function (11022 option) for automatic productionBIAS comparator functionComparator function and 8/99 bin-sorting functionPass/fail judge result for automatic productionHandler interface trigger edge (rising/falling) programmableTest signal level monitor functionStandard RS-232, GPIB, and Handler I/FOpen/short zeroing, load correctionLabView® Driver
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Miniature IC Handler
3270
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing, especially for CIS Testing, at the system level.
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300KHz Precision LCR Meter
Model 4300R
Aplab Precision LCR Meter Model 4300R is a new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V~10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
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Striptest Contactors
ULTRA® CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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In-Line / Board Handler
Circuit Check’s in-line board handler fixturing exceed the high performance requirements associated with high-volume production. Circuit Check supports in-line fixturing for all the leading ICT handlers including Keysight 5i, Teradyne TSh Multi-Site, IPTE and Pematech. Circuit Check is the go-to partner for in-line functional test fixtures to speed production throughput.
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Test Handler
HA1200
The new HA1200 handler can be linked with a tester to utilize our unique active thermal control technology for testing singulated and/or partially assembled dies. This technology enables testing of powerful high-end SoCs with 100% test coverage. This helps reduce yield loss at final test, thus reducing losses of final multi-die assembled products.
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Automated ICT System
With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
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Test Handlers
Boston Semi Equipment test handlers are designed for optimum production performance on your test floor.
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Single Site Test Handler
3210
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Precision LCR Meter
TH2817A
Changzhou Tonghui Electronic Co., Ltd.
TH2817A is a new precision LCR meter combined with years of technical experience and newest measurement technology of instrument industry. With powerful measurement functions, high performance and low cost, TH2817A has been one of the world advanced instruments, and it provides users a super value measurement resolution and experience. The meter offers stable 6 digit resolution, wide frequency range (50Hz to 100kHz for TH2817A ), programmable signal level (0.01V to 2.0V), up to 30 meas/sec measurement rate, 9 measurement ranges, 30Ω or 100Ω constant output impedance and friendly operation interface. TH2817A can be used for incoming inspection of components, quality control of product line and high accuracy laboratory use. The HANDLER, GPIB, RS232C interfaces make it easy to build an automatic component test system,
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Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Cantilever Spring Pin ULTRA
CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Test Handler
M4872
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Tube-To-Tube Gravity Handler
Rasco SO1000
The SO1000 test handler’s mature design and high reliability it provides excellent cost of test. Highly flexible as a result of a broad range of device kits can be combined with various Sensor and MEMS applications.Featuring a fast plunger with up to four plunger heads for high speed and high throughput with index time down to 500 ms. Available in single, dual, and quad configurations.
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Package Test Loadboards/DIB
DTS Package Test (DIB) loadboards are designed to specific devices and configured for both hand test and fully automated handler applications. DTS loadboards incorporate any brand of socket or contactor and can be configured for multi-site testing. Designs incorporate all necessary components, connectors, mechanical hardware and stiffeners to provide a complete plug-n-play solution. DTS has a vast database of tester and handler information which allow designs to be started and completed quickly without burdening the customer to supply excessive information. DTS designers are experienced in all device types, including digital, analog, mixed signal and RF devices.
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RF Solution Integrated Handler
3240-Q
The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
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High Volume Manufacturing Handling, Stimulus
ULTRA P
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Die Sorter Handler
4605-HTR
4605-HTR is a MAP Sorter which picks up devices from wafer ring and sorts to tape or bin according to the MAP file created by film frame test handler or prober. 4605-HTR is a high speed handling system, available for 12 inches wafer rings. When used in combination with 4170-IH, 4605-HTR much improves efficiency in testing process of leadless devices as a high speed sorting machine.
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Film Frame Test Handler
4170-IH
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
