Partial Discharge Test
See Also: Partial Discharge, Partial Discharge Detection, Partial Discharge Monitors, PD, PD Test
-
Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
-
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
-
Product
Electrostatic Discharge Test
-
The electrostatic discharge test is designed to determine the ability of equipment to perform its intended function without permanent degradation of performance as a result of an air discharged electrostatic pulse. Electrostatic discharge is the result of an unbalanced electrical charge. Typically, it is created by insulator surfaces rubbing together or pulling apart. A transfer of electrostatic charge between bodies (materials, components, etc.) at different electrostatic potentials is caused by direct contact.
-
Product
Partial discharge measurement with remote wireless reading
PD-LT
-
The PD-LT allows online partial discharge detection on cable accessories such as cable head for safety and maintenance purposes.The PD-LT indicates the intensity of the partial discharges, converting the electrical charge units (pC) into decibels (dB). Thus the reading is kept as a simple intensity level indication, proportional to the probability of a fault's presence in the tested medium voltage accessory.The remote display gives a dB value of the probe's measurement. The dB value will vary along with the discharges indicators on the PD-LT probe. The measurement range is from 0 to 65dB and the display will show ''OL'' if the reading is over 65dB.
-
Product
Photonics Wafer Probing Test System
58635
-
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
-
Product
Seno-Con Test System
PANTHER 2K QST
-
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
-
Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
-
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
-
Product
Online Partial Discharge Alarm System
PD Annunciator™
-
The PD Annunciator™ unique design consists of a three channels acquisition module paired with sensors of your choice, most commonly TEV and Acoustic or HFCT. With many advancements and innovations, the PD Annunciator™ handles partial discharge monitoring on metallic cabinets using our proven and advanced technologies.
-
Product
ESD Test System
58154 Series
-
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
-
Product
Advanced SoC/Analog Test System
3650
-
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
-
Product
PXI Integration Platform
ATS-3100
-
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
-
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
-
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
SMD Array Type LCR Test Fixture
16034H
-
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
-
Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
-
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
-
Product
SoC Test Systems
-
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
-
Product
Partial Discharge Tester
19501-K
-
Chroma Systems Solutions, Inc.
The Chroma 19501-K Partial Discharge Tester is an instrument equipped with AC hipot test and partial discharge detection functions, providing 0.1kV~10kV of AC output, 0.01μA~ 300μA of leakage current, and 1pC~2000pC partial discharge detect ion range for measurement. Chroma 19501-K Partial Discharge Tester is compliant to the IEC60270-1 standard in particular the partial discharge testing requirements for high voltage.
-
Product
Functional Test for Engineering Lab
Spectrum BT
-
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
-
Product
FADEC/EEC Test Platform
-
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
-
Product
Mini In-Circuit Test System
U9403A
-
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
-
Product
LitePoint RF Test System
J750
-
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
-
Product
Partial Discharge Tester
GTPD-2C
-
GTPD-2C Digital partial discharge tester is the digital partial discharge measuring and analyzer adopting the complete new generation technology. It is suitable for partial discharge detection in manufacturing factory and field handover test of transformers, generators, CT/PT, bushings, GIS, capacitors, power cables, switches and other high-voltage electrical equipment with various voltage levels and capacities.
-
Product
SoC/Analog Test System
3650-S2
-
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
-
Product
End of Line Test System for Automotive Seats
AS519
-
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
-
Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
-
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
-
Product
Single Site Test Handler
3210
-
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
-
Product
Photodiode Burn-in Reliability Test System
58606
-
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
-
Product
Scienlab Combined Battery Test Solution
SL1133A
-
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
-
Product
Partial Discharge Testing
-
Weshine Electric Manufacturing Co., Ltd
Using the Windows system operating platform, you can freely choose ellipse, straight line, sine wave display, two-dimensional, three-dimensional graphic analysis mode, spectrum window, Q-V-F three-dimensional characteristic window, and static detailed measurement, observation and analysis of partial discharge pulse of one-cycle test voltage .
-
Product
Test Workflow Standard
-
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
-
Product
Cable Free ATE
CABLEFREEATE
-
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
