Partial Discharge Test
See Also: Partial Discharge, Partial Discharge Detection, Partial Discharge Monitors, PD, PD Test
-
Product
ESD Discharge Simulator
Model 9910 PurePulse/PinScan
-
Model 9910 PurePulse / PinScan is used to determine the ESD susceptibility level of electronic devices up to ±4kV. PurePulse generates ESD pulses up to 4kV for testing electronic devices for susceptibility to Electrostatic Discharge (ESD) using HBM, MM and HMM models. PinScan provides automatic sequencing of ESD testing of up to 128 pin devices, applying a discharge, thenperforming a curve-trace test to identify a failure.
-
Product
Partial Discharge Testing Of Transformer & Localization System
AE-150™
-
The is designed to detect and localize Partial Discharge activity by correlating acoustic and electric sensors' data. The AE-150™ has many acquisition modes, each used for detecting and locating Partial Discharge activity in a transformer. The AE-150™ unit is mounted on the transformer tank using its powerful magnets that also hold four acoustic sensors.
-
Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
-
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
-
Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
-
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
-
Product
LTE RRM Test System
T4010S
-
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
-
Product
Digital Test Instrumentation
EDigital-Series™
-
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
-
Product
Electrostatic Discharge (ESD)
Immunity
-
The sudden, momentary flow of electric current between two objects with different electrical charges.
-
Product
Medalist i1000D
U9401B
-
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
-
Product
Electrostatic Discharge Testing
-
MET Labs offers special ESD testing services at controlled temperature and humidity, in a specially-designed and dedicated chamber.The chamber consists of ESD waveform verification setup and tables that accommodate a variety of EUTs. The chamber has a capability to vary the relative humidity from 15% to 65% and temperature from 18°C to 24°C.
-
Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
-
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
-
Product
EV Power Components End of Line Test Platform
-
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
-
Product
Sealed Beam Bulb Testing System
H710019SSL
-
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
-
Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
-
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
-
Product
Partial Discharge Calibrator
TPK-H
-
The high voltage-resistant Partial Discharge calibrator is used to determine the correction factor in the PD test circui.
-
Product
CPE Design Verification System
Jupiter 310
-
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
-
Product
Advanced SoC/Analog Test System
3650-EX
-
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
-
Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
-
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
Battery Discharger & Capacity Tester
IDCE-CT
-
Fuzhou Fuguang Electronics Co., Ltd.
Each wireless module can monitor 4 batteries simultaneously comparing with the traditional method that each module only canmonitor 1 battery, the new wiring operation become easier because the quantity of new modules needed is only a quarter of old-fashioned modules.
-
Product
Electrostatic Discharge Simulator
ESD61000-2
-
ESD simulator (Electrostatic Discharge Generator or Electrostatic Gun) is in full compliance with IEC 61000-4-2, EN61000-4-2, ISO10605, GB/T17626.2, GB/T17215.301 and GB/T17215.322. The ESD generator is designed for the assessment of electrical and electronic equipment to withstand ESD performance. ESD61000-2/ESD61000-2A has LCD display in both English and Chinese, they equipped with an infrared remote control which can allow you do the test in some special place.
-
-
Product
Partial Discharge Testing Equipment
3i
-
The portable multipurpose 3i device (Intellectual Insulation Indicator) is for eff ective high-voltage equipment insulation monitoring on-line. The 3i device measures and analyses partial discharges (PD). For eff ective PD measurement and noise rejection, there are two types of sensors used in the device: the acoustic sensor and the TEV sensor. Both the sensors are built into the device case, and so do not need any connection cables. The device is supplied in a strong metal case; at the faceplate there are the colored screen and two buttons: power button and function button.
-
Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
-
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
-
Product
Scienlab Battery Test System – Module Level
SL1001A Series
-
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
-
Product
Wireless Device Test
-
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
-
Product
Cable Discharge Solutions
-
Cable Discharge Event, or CDE, is an electrostatic discharge event that occurs when a cable is connecting to a piece of equipment with different potential. It occurs because there is a potential differential between the charge on a cable to be connected and the equipment. It doesn't matter if the cable is charged or if the equipment is charged. It's the potential differential that causes the discharge. ESDEMC develops commercial system for CDE reliability test and evaluation.
-
Product
PD (Partial Discharge) Tester
-
Weshine Electric Manufacturing Co., Ltd
Using the Windows system operating platform, you can freely choose ellipse, straight line, sine wave display, two-dimensional, three-dimensional graphic analysis mode, spectrum window, Q-V-F three-dimensional characteristic window, and static detailed measurement, observation and analysis of partial discharge pulse of one-cycle test voltage .
-
Product
OLED Lifetime Test System
58131
-
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
-
Product
Test Sets For Diagnostic Testing
-
Test Sets For Diagnostic Testing are designed to test Oil Resistivity, Tan Delta, High Voltage Surge Comparison, etc. These test sets are automated instruments used to measure electrical features to insulate transformer oil, liquids and varied other insulating materials. They are ideal for revealing different localized problems and varied weak spots in the insulation. These modern testing sets are designed to provide high accuracy in results. In addition to this, they are easy to maintain testing sets available to ensure accurate readings.
-
Product
Microwave Testing
1100B
-
The Model 1100B Picoprobe sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics.
-
Product
Test Samples
-
Performance testing of metal detection equipment is a crucial part of a food safety and quality management system. Confirming the correct performance of your detector at regular intervals ensures your system is compliant with programs like FSMA, SQF, GFS, BRC and other relevant auditing schemes.
