EMI Test Systems
See Also: Faraday Cages
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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AC Dielectric Test Systems
700-DI
The HIPOTRONICS standard line of AC Dielectric Test Systems are designed to perform high voltage AC tests on electrical apparatus in accordance with IEC60, IEEE 4 and IEC 270 and other national test standards. A variety of mechanical configurations are available to suit different installation conditions. Some models can be supplied in mobile versions when it is difficult to move the test object to the test area. AC Dielectric Test Sets are available in a wide range of voltage and power ratings with exceptional reliability, durability and functionality. No matter what your requirement is, HIPOTRONICS has an affordably priced, highly reliable test solution to meet your needs.
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D-Mic Auto Test System
BK9013
If your company produces millions of D-mics per month, take a look at the BK9013. Based on our BK3012V2 D-Mic Tester, the fully automatic BK9013 is our fastest D-Mic test system. With 4 or 8 couplers, the BK9013 can simultaneously test and sort up to 8 D-Mics into 8 passing grades and 7 different causes of failure in just a few seconds! You can view the results in real time or store them to analyze later.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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Automatic Transformer Test System
TH2840NX
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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Vibrator Test System
Sandwich Box Kit
"Gold standard” for vibrator tests provides more information than radio, wireline similarities or internal analysis. Other forms of vibrator QC use the vibrator controller accelerometers to measure vibrator motion. The Sandwich Box system includes external accelerometers which are used to independently record vibrator motion, thus providing a check of the whole vibrator system including the accelerometers.
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Test System
2000/DATS
WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
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Function Test Systems
These specialist Automeg models test the function and integrity of wiring harnesses combined with active components such as relays, switches, contactors, diodes, LEDS, actuators and other active components.Our software takes the complex and traditionally long task of creating functional tests away from the test engineer and allows these to be created automatically, from existing ECAD data and our component library and automated software routines. All the different routes and subtests are automatically calculated in seconds.
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Automatic Transformer Test System
TH2840BX
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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Custom Motor Test Systems
Magtrol's Customized Motor Test Systems (CMTS) are PC-based, turnkey systems custom designed and built to meet your specific motor testing requirements. By integrating Magtrol's motor test equipment with power supplies, adaptable fixtures, custom tables/cabinets, printers, etc., Magtrol's engineering team can customize PC-based, turnkey systems and modular test benches for almost any motor test application.
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Capacitance & Tan-Delta Test System
TD-1
By measuring the electrical properties such as capacitance and Tan-Delta regularly on periodical basis, it is possible to ensure the operational unexpected breakdown. Dissipation factor (Tan Delta) is one of the most powerful off-line nondestructive diagnostic tool to monitor the condition of solid insulation of various high voltage equipment.
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Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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Eddy Current Test System
CIRCOGRAPH® Product Family
Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Test Fixture
N1295A
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Automotive Test Systems
Ono Sokki Automotive Test Systems - flow meter, non-contact speedometer, engine tachometer, crank angle detector, and more
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Instrumented Pendulum Impact Testing System
JB(INSTRUMENTED)
Jinan Testing Equipment IE Corporation
JB-450I/750I Instrumented Pendulum Impact Testing Machine is equipped with high precision instrumented strain-gauged striking edge & high-speed data acquisition system. This instrumented test system can measure the force of a test specimen during an impact event. Then, the instrumented test data can be used to calculate the energy absorbed by the test specimen. In addition, the crack initiation and arrest loads can be used in fracture mechanical models.
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Universal PD & EMI analyzer
Spark P3
Doble Spark P3 is a universal partial discharge (PD) and electromagnetic interference (EMI) analyzer that uses a software defined radio signal detector to identify characteristics of insulation system deterioration that could lead to the failure of high voltage equipment. It detects signals from suitable sensors in a frequency range between 9 kHz to 2 GHz for PD and EMI, and DC to 500k Hz for acoustic and reference voltage measurements.
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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High Voltage Cable/Harness Test System
CKT1175-50
The CKT1175-50 is a high-voltage wiring analysis system that features a switching matrix that can be distributed around the workshop or in and around the assembly to be tested. This system is expandable in 100 or 150 test point increments to 96,000 test points, and is available with a variety of adapter cable interface connectors, with the standard being the CKT MAC interface system
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EMI Filter/TVS Arrays
ProTek offers TVS protection and EMI Filtering all in one package. These space saving devices are ideal for use in portable electronics such as Cellular Phones, Cellular Phone Accessories, Laptops, and PDAs.
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Macro-Vickers Hardness Testing System
LV Series
LECO's LV Series Macro-Vickers Hardness Testing Systems offer an affordable testing system suitable for larger, heavier samples used in welding and other demanding applications. Models include analog and digital, with options to upgrade to automatic configurations.
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Flexible Test System Automation Platform
RF2000A
The Ranatec RF2000A is a flexible test system automation platform that helps you to integrate your complete test system into a single box. No more cables and discrete parts on your desktop!
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Simulation Systems
Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.
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Automotive Electronics Functional Test Systems
Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Short Circuit Test System
Shanghai Guantu Technology Co., Ltd.
The short-circuit test system refers to what kind of short-circuit test is carried out by which equipment, and how long is the test time. But I have one thing to tell you, the short circuit test is a kind of destructive test, mainly to test the working condition of the used equipment in a crisis situation, or to test how strong the anti-destructive ability of the used equipment is. Just like a lot of equipment in the military must undergo a short-circuit test, some for 3 minutes or longer, in order to resist breaking calls against the enemy during wartime.
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Receiver, 9025, 25 Module, EMI Gasket
310104431
The 25 Module Receiver is a rugged system devised to accommodate medium I/O. With high contact point availability, the 25 Module Receiver is suited for larger test and measurement systems. This 9025 offers a gasket for EMI applications.
