In-line
In-line test equipment is specifically designed for testing production items on the manufacturing line.
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In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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In-Line / Board Handler
Circuit Check’s in-line board handler fixturing exceed the high performance requirements associated with high-volume production. Circuit Check supports in-line fixturing for all the leading ICT handlers including Keysight 5i, Teradyne TSh Multi-Site, IPTE and Pematech. Circuit Check is the go-to partner for in-line functional test fixtures to speed production throughput.
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Single-in-Line Reed Relays
Series 116
SIL relays - Smallest board area. 1A version requires 0.15 x 0.27 inches .(3.8mm x 6.8mm). 1 or 2 switches with 10 Watts rating. 5 or 12 Volt coils with optional diode
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Inline Test Systems
A perfect basis for an automatic integrated Test System for medium to high manufacturing volumes. Important technical and economic advantages due to their modular structure and expansion capability are evident.
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Thru Hole Donut Load Cell
Futek Advanced Sensor Technology, Inc.
The Thru Hole Donut Load Cell Series offers 5 models built for Off-Center Loading, Press, or Inline compression applications. These models have a very robust construction available in 17-4 Stainless Steel, with an I.D. range of 1/8" to 1 1/4".
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Fibre Channel Test & Simulation Interface for PCI Express
PCIe-FC4
Avionics Interface Technologies
Half-size four lane PCIe board - Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speedsComprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Full Error Injection and Detection - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent Analyzer - Supports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Compatible with AIT’s fcXplorer GUI Bus Analyzer Software
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Fibre Channel Test & Simulation Interface for PCI-X
PCI-X-FC4
Avionics Interface Technologies
Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speeds - Comprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Full Error Injection and Detection - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent AnalyzerSupports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Compatible with AIT’s fcXplorer GUI Bus Analyzer Software
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Incline Shock Tester
HIACC Engineering & Services Pvt. Ltd.
Inline shock test system simulates a real shock environment to estimate the impact resistance or damage level of a product. The simulated environment replicates shocks produced during product handling, stacking shelves, loading/unloading and transportations. The incline shock test system is widely used in the packaging industry, scientific research institutions and transportation industry.
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Rockwell Hardness Tester
The most popular and widely used method of Hardness Testing, The Qualitest range of Rockwell Hardness Tester Range start from low cost analog models up to sophisticated and advanced load-cell type models. The popular, HardRocker, QualiRock, Rocky series hardness tester models have configurations suitable for Regular and/or Superficial Rockwell Hardness Testing, while our advanced Universal Hardness Tester Range can test the full Rockwell scale in addition to Brinell & Vickers. Qualitest also offers Automatic In-line hardness testers for high volume testing.
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Automated Metrology System
EVG®50
High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.
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Inline Optical Power Meter - MATRIQ
Power 1600 Series
The Power 1600 Series optical power meter provides quick and accurate inline power monitoring from -50 dBm to +20 dBm with 1, 2 or 4 channels in a compact form factor.
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Inline Test Handler W/Bypass
6TL36
The 6TL36 test handler is the first ATE handler on the market that easily integrates the radio frequency tests into mass production lines.The modular approach of the 6TL36 offers the possibility of adding handlers together for a work in parallel that reduces the cycle time and saves costs as well as space when compared to traditional parallel solutions. Therefore, the system can be ordered with only one conveyor, with two conveyors (bypass or dual-line), and with three conveyors (Retour conveyor).
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Inline 3D-CT Automated X-ray Inspection Systems (3D-AXI)
3Xi Series
Saki's 3D-AXI (X-Ray) series adds significant inspection capability. The system utilizes Planar Computed Tomography (PCT) providing high precision CT imaging at high speed.
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Inline Handler W/By-Pass Line Master Push Down
6TL33
A perfect basis for a heavy-duty, reliable, high precision, and automatic integrated Test system for medium to high demanding environments. Important technical and economic advantages due to their modular structure and expansion capability are evident. The production testing environment will be flexible and efficient, helping towards the always valued Return of Investment.
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Specialist Inline Inspection
NDT Global treats each pipeline individually from the offset. Before a project even begins, a feasibility study of the pipeline detail is conducted by NDT Global, to determine the appropriate tool and required modifications to complete the inspection. NDT Global has an extensive engineering capability in this regard and has a proven track record in providing tailored solutions to deal with a wide variety of pipeline characteristics.
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PoE Tester
PE-100
The PoE Tester/Power Monitor is designed for testing standard PoE and measuring power of PoE systems, by performing both PSE (Power Source Equipment) detecting and PSE/PD (Powered device) inline testing. Compliant with IEEE802.3 af, 802.3at standard and 802.3bt ultra 4-pair up to 60W-100W. PSE detecting display PoE type (af or at), power source (Endspan or Midspan) and perform a load test for voltage drop with REV LED indicates a reversed power. Inline PSE/PD testing-measure and display in rotation between voltage (Volts), current(Amps) and power(Watts) via dual 4 digit 7 segment LEDs which provides voltage available, current flowing and how much power an PD actually need ensure sufficient power for PD to make the PoE is sustainable.
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Abnormal Noise Detection System In-Line Tester
MV-6000B
This product sets criteria found with waveform analysis software, and runs automatic judgment in-line.
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Rain Xplorer Inline
The CISC RAIN Xplorer Inline is a unit for high-speed performance testing of RAIN inlays and tags during the production process. It offers quality assurance during the production process from start to end. RAIN Xplorer Inline is available with a GUI but also allows full integration into assembly machines through serial interfaces, trigger lines, and API.
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6TL36 Inline Handler
AM304
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Inline Module Band
Computer Gesteuerte Systeme GmbH
The transport belt runs over a spring-loaded belt-clamping unit and is made of ESD material. The clamping unit ensures that the belt is tensed properly and is automatically readjusted, resulting in a longer life when compared to conventional conveyor systems.
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In-line Plastic Mixers
Ideal for one-use fluid dispensing, Nordson EFD’s disposable static mixers eliminate the need to worry about premature curing of materials.
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Intelligent Refractive Index Sensor – Inline Process Refractometer
IRIS+
The MISCO IRIS+™ Intelligent Refractive Index Sensor is an enhanced version of the popular IRIS Sensor. The main differences are that the IRIS+ has an integrated stainless flow-through adapter, slightly expanded operational temperature and pressure limits, and slightly better precision.
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Stimulation/Fracturing
Atmospheric Rotational, Pressurized Rotational, In-Line Viscometers, Friction Flow Loop, and Formation Response.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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TestStation Multi-Site Inline
TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
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Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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Inline Wafer Electrical quality Inspection
ILS-W2
the Ultimate Wafer Electrical Quality Inspection Unit for Wafer Inspection Systems
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Single-in-Line (SIL / SIP) Reed Relays
The SIL / SIP reed relay is the industry standard when high reliability and consistent performance are desired in a compact package. Pickering Electronics Series 100 - 110 SIL / SIP reed relays feature the highest quality instrumentation grade reed switches making them suitable for the most demanding applications.
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In-line ICP® Charge Converters
In-line ICP® charge converters play a vital role in converting high impedance charge mode piezoelectric sensor signals into low impedance voltage signals, facilitating input to readout, recording, and analysis instruments. Specifically engineered for compatibility with high temperature piezoelectric sensors, these units are capable of operation in environments reaching up to 500°F (260°C). The series boasts ±2.5V or ±5.0 V output, offering a range of gain options, all packaged within a compact and durable casing. As a cost-effective alternative to laboratory charge amplifiers, in-line ICP® charge converters present an appealing choice for multi-channel applications.
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