JTAG Emulators
Exercise a processor's (DUT) on-chip debug services to perform JTAG emulation and debug.
See Also: JTAG, JTAG Controllers, JTAG Debuggers, iJTAG, P1687
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Product
Wireless Network Emulators
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Keysight’s industry-leading range of wireless network emulators and device test solutions enable the entire mobile device ecosystem to accelerate the market introduction of new wireless devices by streamlining the workflow from early prototyping, development, and design verification to conformance, carrier acceptance, and high-volume manufacturing.
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Product
Network Emulation System
Mini Maxwell
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Mini Maxwell -- Easy to use, portable, network emulator. Mini Maxwell''''s low cost of $1995 can fit into any testing budget. The Mini Maxwell is great if you have low power requirements, or need ultra quiet operation. Mini Maxwell supports packet drop/loss, duplication, delay (latency)/jitter, reorder, and burst. Includes: processor, memory, and three Ethernet interfaces in one enclosure with separate power supply, Linux OS, Mini Maxwell network emulator engine, graphical user interface, and 90 Day Warranty.
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Product
Ultra Multi-Channel Battery Emulator
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Peritec Ultra Multi-Channel Battery Emulator is used for the development of electric car(EV). The hardware has great extendability, it can also simulates up to 192ch synchronized DC power supply with high isolation and you can make the test sequence with Mirosoft Excel.It can be used as a power source such as a simulator of new energy development for the evaluation. In addition, we can correspond flexibly to customize provide the best solution to suit the needs of our customers.
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Product
Host emulator
E84
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Precision Development Consulting Inc
A USB controlled and self-powered emulator for functional testing SEMI E84 implementations. (E84-1000) This was developed because there was nothing like it in the marketplace, and it was clearly needed. This product enables a factory automation engineer to perform E84 functional testing anywhere in the world. Weighing less than 5oz, it is neither a burden, nor a power hog. You will never need to look for an additional power receptacle in the fab. The emulator gives the user full control over the sequence so that any test can be performed. Existing products were large and unwieldy, and provided canned tests that could not be modified to meet the requirements that Fab managers impose on their suppliers.
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Product
Emulation of the Mobile Wireless Environment from 2G to 5G
Base Station Emulator sUTP 5018
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Bring a whole mobile network to your lab or production: NOFFZ Base Station Emulator (BSE) creates a customized cellular wireless environment. This makes testing wireless devices easier than ever before.Compact, cost-effective testing of multiple DUTs in parallel from 2G to 5G, including endurance testing for several days.
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Product
Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
Controller
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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Product
JTAG Boundary-Scan I/O Modules
SCANIO Family
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The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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Product
High-Performance LAN & USB JTAG Controller
NetUSB II™
Controller
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.
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Product
JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
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High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
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Product
ROM Emulator Instrumentation
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High-speed and static 3U and 6U PXI and PCI digital I/O instrumentation. Offering test rates to 200 MHz and programmable logic levels of -10 V to +15 V, our digital products feature the highest performance and most cost effective digital test solutions in the industry.
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Product
1x/2x/4x/8x Fibre Channel SAN Emulator
VirtualSANTM
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VirtualSAN is a high-performance Fibre Channel SAN Emulator that replicates real world network effects such as latency and errors on user traffic in a controlled environment. The VirtualSAN emulator uses customized ICs to support full line rate performance at all frame sizes and impairment settings. The emulator can be transparently installed in-line as shown in the diagram below. VirtualSAN emulator has an intuitive and easy to use GUI interface and a very powerful TCL based CLI to aid in configuration and testing.
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Product
Mobile Comm DC Source w/ Battery Emulation, DVM
66321D
Battery Simulator
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections.The Keysight 66321D mobile communications dc source provides fast transient response, exceptional sourcing, output resistance programming, and precision measurement. This product is specially designed for testing next generation digital wireless communications products. The 66321D mobile communications dc source offers a new capability that simulates the internal resistance of a battery or battery pack. Additionally, these high performance models offer improved transient response and stable output operation with either short or long load leads. The 66321D dc source provides all of the capabilities of the 66321B with the addition of a built-in digital voltmeter.
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Product
JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
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8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Product
Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions
ScanExpress JET Advanced Solutions
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ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.
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Product
Regenerative AC Emulator, 600 VAC, 63 A, 45 KVA, 3‑Phase
SL1202A
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The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
eNodeB Emulator
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The eNodeB Emulator includes UE simulation, and can be used to test the complete LTE Packet Core or individual Core Network elements, MME, SGW, PGW. It implements all the required protocols - S1AP/SCTP to communicate with MMEs over S1-MME interface and GTP-u to communicate with S-GW over S1-U interface.
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Product
MC-MLPPP Analyzer And Emulator
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The Point-to-point protocol (PPP) is a link layer protocol, which encapsulates other network layer protocols like IP for transmission on synchronous (like T1/E1) and asynchronous communications lines. When transmitted over T1/E1 line, PPP frames are based on HDLC frame structure. Two major features of PPP protocol are:*Authentication*Encapsulation of higher layer protocols
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Product
Mixed Signal JTAG Tester
JT 5705
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The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.Use the ‘mixed-signal’ features to measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of CoreCommander FPGA our generic bridge/translator system.
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Product
PoE LLDP Emulation (PD) & Analysis for 802.3at & 802.3bt
802.3at and 802.3bt PD Emulation and Protocol Analysis
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Integrated PoE LLDP and Load Emulation in a Single Instrument. IEEE 802.3at and 802.3bt LLDP Compliance Analysis. Independent, Per-Port 802.3at and 802.3bt LLDP Emulations. Flexible Single and Dual Signature PD LLDP Emulations. One-Click LLDP Protocol Capture and Analysis. Pop-Up Excel Spreadsheet Reports Assess Protocol Content and Timing. Enables One-Click Emulated Power-Ups and Standard Waveforms with LLDP Power Granting PSE's. Enables 2-Pair and 4-Pair PSE Conformance Test Suties with LLDP Capable PSE's. Enables 2-Pair Multi-Port Suite with LLDP Capable PSE's. Available for PSA-3000 and PSL-3000 Platforms.
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Product
Regenerative AC Emulator, 1200 VAC, 65 A, 90 KVA, 3‑Phase
SL1213A
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The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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Product
ABex Terminal Module for JTAG Technologies JT 37x7 BSCAN Cards
ABex TM-JT37x7
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The ABex TM-JT37x7 is an ABex terminal module for the JTAG Technologies Boundary Scan Controller PXI/PXIe JT 37×7. In combination with the JT 2147/ABex from JTAG Technologies it integrates the POD functionality into the module.In combination with the PXI/PXIe JT 37×7 and the JT 2147/ABex it’s possible to connect up to four JTAG/Boundary Scan TAPs. All signal wires on the PCB are impedance controlled. In addition, all signals can be switched off via relays.
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Product
JTAG based Test & Flash Programming Services
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We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Product
JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test
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The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):
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Product
JTAG Boundary Scan Tools
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Blackhawk has teamed with Corelis, an EWA company, to offer customer Intuitive and High Performance JTAG Boundary Scan Tools that are compatible with our JTAG emulator product line. This allows developers not only to debug code on TI devices but also leverage boundary scan testing using the same emulator hardware.
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Product
JTAG Boundary-Scan Controllers
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Corelis has developed a wide range of high-performance boundary-scan controllers that are compatible with buses such as USB 2.0, PCI, PCI Express, and Ethernet. Many of Corelis’ boundary-scan controllers operate up to 100 MHz sustained TCK frequency.
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Product
Live PD Emulation
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Flexibly Mimic Class 0 to 4 Powered Device Per PSA/PSL-3000 Test Port. Configure up to 192 Simultaneous IEEE 802.3 PD’s. User-Defined Class 0 - 4 Powered Device Modeling with or without Cable Loss. Emulate 802.3at PoE-LLDP Negotiations and Power Adjustments. Monitor Multi-Port Live Emulation Status. Available to PSA-3000 and PSL-3000 Platforms as optional license feature.
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Product
4-TAP PXI Express JTAG Controller
PXIe-1149.1/4E
Controller
The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring a high-speed PXI Express (PXIe) interface with four independent and configurable Test Access Ports (TAPs) along with direct serial programming capability, the PXIe- 1149.1/4E enables of boundary-scan integration with PXIe systems.
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Product
JTAG Debug Probe for Cortex-M
J-Trace PRO
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SEGGER Microcontroller GmbH & Co. KG
J-Trace PRO for Cortex-M is setting a new standard for trace probes. It enables continuous streaming trace via its Gigabit Ethernet interface, lifting the limitations by internal buffers and slow data transmission.J-Trace PRO can capture omplete traces over long periods - thereby enabling the recording of infrequent, hard-to-reproduce bugs. This is particularly helpful when the program flow 'runs off the rails' and stops in a fault state. It also supports extended trace features, such as code coverage (so engineers have visibility of which parts of the application code have been executed) and execution profiling (providing visibility as to which instructions have been executed and how often - so hotspots can be addressed and optimization opportunities identified).
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Product
Emulate Test in simulation
STIL-VT
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Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
