System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Product
PXI Precision Resistor Module 9-Channel, 1.5 to 925
40-297-021
Programmable Resistor Module
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Product
PSG RF Analog Signal Generator, 100 kHz to 9 GHz
E8663D
Signal Generator
Tackle demanding radar & satcom measurements with metrology-grade performance, including high output power & superior level accuracyUse as an ideal reference in phase noise test systems or for analog-to-digital converter testing with the lowest phase noise in a commercial sourceCharacterize devices & circuits by adding AM, FM, M & pulse modulation to your signalImprove existing test system performance: E8663D is built on the outstanding legacy of the 8663A & is fully code compatible
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Product
3U 7th Generation Intel® Core™ i3-7100E Processor-Based PXI Express Gen3 Controller
PXIe-3937
Controller
The ADLINK PXIe-3937 PXI Express embedded controller, based on the 7th gen Intel® Core™ i3 processor, is specifically designed for hybrid PXI Express-based testing systems, delivering maximum computing power for a wide variety of testing and measurement applications.
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Product
AC Power Sources
CSW Series
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AMETEK Programmable Power, Inc.
The CSW Series represents a new generation of AC/DC power sources that address the increasing demands on test equipment to perform additional functions at a lower cost. By combining a flexible AC/DC power source with a high performance power analyzer, the Compact CSW Series is capable of handling complex applications that have traditionally required multiple systems. The sleek integrated approach of the CSW avoids cable clutter that is commonly found in test systems. All connections are made internally and the need for digital multimeters, power harmonics analyzers, and current shunts or clamps is eliminated.
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Pressure Decay Test Systems
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Pressure decay leak testing technology has become a mainstay in the arena of high volume production testing. Pressure decay testing methods offer the world's manufacturers a cost-effective and easily applicable solution to the leak testing challenges they encounter on a given day. Fundamentally, pressure decay testing is a straightforward measurement technique; Cincinnati Test Systems (CTS) pioneers new and innovative ways to integrate our technology into custom turnkey systems that exceed the industry standards for reliability and repeatability. CTS' 30+ years of experience goes way beyond the pressure test unit by offering our customers comprehensive, custom turnkey solutions to the most challenging leak testing problems.
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Product
SWB-2813, 4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781420-13
Matrix Switch Module
4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2813 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
PXI Resistor Module 4-Channel 1R to 127R with SPDT
40-293-112
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
Automated Testing Systems
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Instron’s automated testing systems bring precision, productivity, and safety to materials testing by automating routine tensile, flexural, and compression operations. Available as full turnkey platforms or modular add-ons for existing test frames, these systems — including the AT3 three-axis, AT6 six-axis robotic, AT2 automated XY stages, CT6 cobot integration, and carousel stations — allow labs to boost throughput, reduce operator variability, and free up staff for higher-value activities. The systems are engineered to support a wide spectrum of materials (plastics, metals, films, composites, medical devices) and comply with international ASTM and ISO test standards while enhancing repeatability and workflow efficiency.
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Product
PCI High Density Resistor Card 10-Channel, 12-Bit, 0 To 4k Ohm
50-295A-121-10/12
Programmable Resistor Module
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
HSI System Test Panel
TA-500
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This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.
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Product
Camera Testing
SWIR
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CI systems' SWIR turn-key test stations simulates low light conditions to test special application cameras. An intuitive user friendly software carries out a variety of tests. The test stations are radiometrically calibrated to perform comprehensive SWIR tests.
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Product
Bump Test Machine
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Labtone Test Equipment Co., LTD
Bump test systems for electrical products repeating impact testing during transportation
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Product
PXI Resistor Module 2-Channel 2R to 16.3k
40-293-031
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Mechanical Design
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In support of system, test and our tooling business, our mechanical engineering team is second to none in offering innovative, yet cost effective solutions for your needs.Whether it is a scalable test fixture solution or a complex, high accuracy torque tooling solution, our team of dedicated mechanical engineers can offer the right solution, with the right level of innovation to give your solution a competitive edge.
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Product
DRO/VCO Modules
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The Analog Devices portfolio of dielectric resonant oscillators (DROs) and voltage controlled oscillators (VCOs) offer excellent output power and phase noise performance over temperature and cover a range of applications and uses to meet the needs of industrial, medical, aerospace and defense, EW, ECM, and communications markets. Our DRO modules are a natural choice for applications in fixed tuned or narrowband tunable configuration, while our selection of VCOs play a key role in providing reliable frequency generation for RF and microwave communication and test systems.
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Product
PCI Programmable Resistor Card 2-Channel 3 Ohm To 16.3k Ohm - SPST
50-294-131
Programmable Resistor Module
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
NI-9222 , ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
783283-01
Voltage Input Module
±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.
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Product
Power Quality Monitoring Terminal Detection Platform
PQC1650
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PQC1650 power quality terminal detection platform is a test system specially designed for power quality terminals. It can fully complete the power quality test method and accuracy test of power quality terminals.
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Product
Superior Electromechanical Universal Testing Machine
WDW-S Series
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Jinan Testing Equipment IE Corporation
WDW series computer control electromechanical universal testing system for tension,compression, flexure testing is designed according to ASTM, ISO, DIN, EN standards etc.. The electromechanical universal testing system for tension,compression, flexure testing is computer-controlled and precision. Our electromechanical universal testing system for tension,compression, flexure testing is widely suitable for metallic and nonmetallic materials for tension, compression, bending, shearing and low cycle test. The electromechanical universal testing machine features high precision, high stability and high reliability. Graph, test result display, data processing and printing can be done easily by its PC system and printer. Completed with modulus for metal, spring, textile, rubber, plastic and other material test, the electromechanical universal testing system for tension,compression, flexure testing is widely used in many fields such as industry factories, research and development, test institutes and training centers etc. WDW-S series superior materials testing systems adopt robust load frames, precise load weighting system, advanced measuring and control system, and intuitive modular application software. Configured with wide range of accessories for applications, the materials testing systems can provide the best testing solutions for your individual application needs. With 20 years’ experience of materials testing industry and based on abundant application knowledge, we are completely capable of configuring the best solutions and more accurate testing systems for the manufacturers involved in load frame, core measuring and control elements, software package, grip/fixture that based on their specified test application and other requirements.
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Product
PXI High Density Precision Resistor Module, 9-Channel, 2.5Ω to 1.81kΩ
40-298-022
Programmable Resistor Module
The 40-298-022 is a high density programmable resistor module with 9 channels which can be set between 2.5Ω and 1.81kΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PXI Programmable Resistor Card 4-Channel 2 Ohm to 255 Ohm
40-294-013
Programmable Resistor Module
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
PXI High Density Precision Resistor Module, 9-Channel, 3Ω to 52.4kΩ
40-298-033
Programmable Resistor Module
The 40-298-033 is a high density programmable resistor module with 9 channels which can be set between 3Ω and 52.4kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
In-line vacuum test systems
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Ensuring that products meet the highest quality standards is absolutely essential in the manufacture of food, pharmaceutical and cosmetic products in particular.Leak-tight product containers have a major role to play here. Leak-tight product containers have a major role to play here. Leakages allow the contents of a container to get out, but more importantly they also allow germs to get in, rendering the contents unusable.INDEC vacuum test systems monitor containers for leak tightness fully automatically within the production process. A wide range of containers, including bottles, jars and cans as well as tubs and trays, are tested for leak tightness by means of a non-contact inspection.The means to this end is a pre-existing vacuum or a vacuum created in the container expressly for the purpose of leakage testing. Containers which are not leak-tight are reliably identified and automatically rejected.These processor-controlled test systems are highly reliable and extremely easy to use, qualities which have played no small part in making them the first choice already for many companies throughout the world.
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HEV / EV / Grid Emulators and Test Systems
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With Scienlab test systems and test software, Keysight offers customized test environments for the development and testing of electronic components according to hybrid and electric vehicle testing standards. Our solutions help you to accelerate your e-mobility applications from the battery, Battery Management System (BMS), inverter, the charging interfaces of Electric Vehicle (EV), and Electric Vehicle Supply Equipment (EVSE).
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Product
Collimators
STC Series
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The STC Series Off-axis Newtonian Collimators from Santa Barbara Infrared provide superior performance in a compact, light weight, readily integrated package. These collimators accurately project targets at infinite focus for critical visible, IR, SWIR, MWIR and LWIR system testing. STC Series Collimators integrate with SBIR’s Infinity Blackbodies and 300 Series target wheels to create the 14000 Series Target Projectors. These target projectors are available in many standard sizes to satisfy the test requirements of most sensor systems. Additionally, their modular design allows for easy customization of components.
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Automated Test Systems
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Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Dynamic and Fatigue Testing Systems
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Instron offers an extensive range of fully-integrated dynamic and fatigue testing systems from 1000 N up to 5000 kN. Incorporating servohydraulic, servo-electric and linear motor technologies, these test instruments cover a broad range of fatigue, dynamic, and static testing applications. These applications include high-cycle fatigue, low-cycle fatigue, thermo-mechanical fatigue, fracture mechanics, crack propagation and growth studies, fracture toughness, bi-axial, axial-torsional, multi-axial, high strain rate, quasi-static, creep, stress-relaxation, and other types of dynamic and static tests.
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Product
RF Bias Burn-In System
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These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
