System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Product
PXIe Vector Network Analyzer, 300 kHz to 9 GHz
M9372A
Vector Network Analyzer
Pay for only the frequency range you need with a choice of six frequency ranges up to 26.5 GHz Improve accuracy, yield and margins with the best PXI VNA speed, dynamic range, trace noise and stability Add functionality to your test system with a full 2-port VNA that fits in a single PXI slot Address your multiport applications needs by cascading multiple models Increase throughput and lower costs by adding modules in a multi-site configuration
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Product
Protective Cover, G12, Receiver
310113402
Protective Cover
The Receiver Protective Cover prevents damage to your modules and contacts and keeps your test system in proper working order.
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Product
Simulation Systems
System
Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.
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Product
System-Level Interconnect Solution For ScanExpress Boundary-Scan Tools
ScanExpress Merge
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Combine Multiple Assembly Test Files Corelis ScanExpress Merge, a member of the ScanExpress suite of boundaryscan test tools, is a software application designed to import and join test files for multiple independent assemblies and assist in configuration of a combined test procedure.Using completed ScanExpress TPG test files and module interconnection data, ScanExpress Merge quickly combines combined test plan files for system testing with minimal user effort.
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Product
32 Channel Relay Output Switch
DP-VME-4224
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DP-VME-4224 is a 32 Channel Relay Output Switch. Applications for this module includes hardware simulation, digital simulation, high-reliability systems, and automatic test equipment, and relay output for soft PLCs.
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Rebuilt Testers
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Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
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Primary Injection Test Systems
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Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
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Product
PXI Precision Resistor Module 4-Channel, 1.5 to 3.55k
40-297-123
Programmable Resistor Module
.This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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AXIe Chassis and Controllers
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AXIe is a new open standard for high-performance, modular instrumentation, and incorporates the best features of other modular formats including VXIbus, LXI and PXI. Keysight has designed a new line of scalable chassis in this new format. Along with controller options, these new AXIe chassis will form the basis of a high-performance, AXIe-based test system.
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Product
Offline In-Circuit Test Solutions
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TestStation’s offline test systems are designed for a human operator or collaborative robot for product handling. TestStation systems scale to support from 128 to 15,000 test points. Our newest Multi-Site systems double productivity per system, reducing Capex and Opex for manufacturers.
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Product
DynEDGE Controller
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The DynEDGE controller offers an integrated, multi-loop control and data acquisition system in an off-the-shelf solution for dynamometer applications, including system modernizations, new installations, turnkey systems, and complete test cell control and data acquisition systems. The controller provides both speed and torque control with four control channels that can be configured for ±100 mA, ±10 V, and ±20 mA.
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Product
JTAG Debugger Software
JSCAN
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JSCAN lets you view and control JTAG pins in real-time without having to touch your board! With a simple click of your mouse, you can set pins HIGH or LOW and observe the results right on your PC.J-SCAN works independently of any logic inside the JTAG device, you do not need any special firmware, code or logic installed. View and control pins in real-time, program FLASH memories, create test macros, for system test, easy to use graphical interface and affordable.
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Product
ECM Noise Under RF Test System
BK8020
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The BaKo Type BK8020 ECM Noise Under RF Test System tests microphones under RF noise, using a ‘Direct Injection Test’ in the frequency range of 5MHz~2.5GHz with an amplitude modulated (AM) disturbance signal of 1kHz. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When you finish testing, you can print data as an MS Excel report or save it for comparison and analysis.
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Product
PXI-2540, 350 MHz, 8x9 PXI RF Matrix Switch Module
778572-40
Matrix Switch Module
350 MHz, 8x9 PXI RF Matrix Switch Module—The PXI‑2540 is an RF signal switching matrix. With its non-blocking design, you can simultaneously connect any row or column within the switching matrix and maximize the flexibility of your test system. Isolation relays on the module disconnect unused parts of the switching matrix to maintain RF performance and high isolation. The density and bandwidth of the PXI‑2540 is ideal for routing signals between digitizers, function generators, and other RF generators and analyzers.
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Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Bus Management Test System
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Solution to test redundant Architecture of BMUComprehensive test system performing tests of > 3000 I/O's Special test circuits using hybrid / ceramic components to operate in Thermovac chamber Tests various subsystem functionalities like, AOCS, Sensor Electronics, Telemetry, Tele-command with Self test and application test software
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Product
PCI High Density Pecision Resistor Card, 3-Channel, 4Ω To 2.97MΩ
50-298-151
Programmable Resistor Module
The 50-298-151 is a high density programmable resistor card with 3 channels which can be set between 4Ω and 2.97MΩ with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Multi Channel Optical Fibre Verification
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The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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Product
PXI-2547, 2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module
778572-47
Multiplexer Module
2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module—The PXI‑2547 is an RF signal multiplexer switch module. The higher channel count of the PXI‑2547 makes it ideal for test systems that require the switching of a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
FPGA PXI High-Performance Digital I/O Card
GX3700
Digital I/O Module
The GX3700 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features 47,500 logic elements and 2.1 kb of memory. The GX3700 is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera’s free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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Product
Wear Testing Machine
M-2000
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Jinan Testing Equipment IE Corporation
Model M-2000 Wear Testing Machine is to be used test the anti-wear performance for metal and non-metal specimen under the sliding, rolling, and sliding-rolling condition. The Wear Testing Machine can also test various materials under dry-friction and wet-friction. The wear testing system can calculate friction work & friction coefficient by the data acquired. The Wear Testing Machine is widely used in universities, research & scientific institutes.
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Targets
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Targets from group A are developed to support mostly testing infrared imaging systems understood as thermal imagers. These targets can be used also in testing visible/near infrared cameras or SWIR cameras but such application is not optimal. IR targets are mostly used in DT systems for testing thermal imagers and in MS systems for testing multi-spectral systems.
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Cable Harness Test System
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Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Laser Diode Light Current Voltage (LIV) Test Instruments
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The Yelo LIV test instrument allows LIV measurements to be taken from laser devices loaded into a Yelo module. This module can also be used with the Yelo Y1000L Low Power Burn-in system. The LIV test instrument has been designed for easy operation. Once powered on, and with laser supply enabled, the touch screen can be used to initiate, monitor and review measurements of laser devices.
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Microcomputer Three-phase Relay Test Set
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Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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Product
PXI Resistor Module 4-Channel 1R to 63.7R with SPDT
40-293-111
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXIe-2739 , 256-Crosspoint, 16x16, 2-Wire PXI Matrix Switch Module
782835-39
Matrix Switch Module
256-Crosspoint, 2-Wire PXI Matrix Switch Module—The PXIe‑2739 is a high‐density 16x16 PXI matrix switch module designed for routing signals within automated test systems and using electromechanical relays to perform immediate switch operations. It also offers features to monitor the health of deployed systems and plan for predictive maintenance, including onboard relay count tracking, a temperature sensor, and functional and resistive relay self-tests available through the NI Switch Health Center.
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Arbitrary Waveform Generator
AWG5200
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The AWG5200 Arbitrary Waveform Generator meets demanding signal generation needs with high signal fidelity and the ability to scale up to 32 or more channels with multi-unit synchronization at an affordable price. Ideal for advanced research, electronic test and radar, and electronic warfare system design and test.
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PXI Programmable Resistor Card 2-Channel 3 Ohm to 65.5k Ohm
40-294-033
Programmable Resistor Module
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Optical tables
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The primary goal of a well designed optical table is to eliminate relative motion between components of test system located on the surface of the optical table because such motion can generate measurement errors.
