ESD Test Systems
See Also: ESD Test, ESD Simulators
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Product
PXI - Test System
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We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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Product
Semiconductor Test System
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Product
Microindentation Hardness Testing Systems
LM Series
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Perfect for a production facility or a research lab, LECO's LM Series Microindentation Hardness Testing Systems offer a variety of models (including analog and digital) with the advanced features that meet your requirements and budget.
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Product
TOV Test System
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Shanghai Guantu Technology Co., Ltd.
1. Safety protection: traffic light indication status, emergency stop and interlocking of the test product door2. Equipped with a computer, set the TOV power supply parameters through the software interface, and automatically test3. Equipped with alarm function, equipped with emergency brake switch, equipped with safety cover and door switch4. The computer interface displays real-time voltage and current data5. Automatically draw voltage and current waveforms, and can save the waveforms as BMP format pictures, which is convenient for editing experiment reports.6. Automatically record test time, test current, test voltage, etc., and save the recorded data to files7. Installation method: cabinet installation.
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Product
Airbag Test System
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Dongguan City Simplewell Technology Co. Ltd.
Airbag Test System by Simplewell
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Product
EW System Test Set
MS 1107
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PSS LRU Test Set is used to test the RWR (Radar Warning Receiver) system by simulating the input signals and testing the output signals.
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Product
DWV/IR Test Systems
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When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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Product
RF TEST AND MEASUREMENT SYSTEM
OE8000
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RF Test Measurement System (TMS) utilizes microwave photonics techniques for automated measurement of ultra-low phase noise oscillators.
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Product
Multi-Cell Test System
Cellcia
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Next-generation wafer probing system for 300mm wafers. The multi-layer system structure maximizes the efficiency of testing, further reducing the total testing cost.
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Product
Transmission Performance/Endurance Test System
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This system is suitable for vehicle drive test with only the transmission unit in combination with the real-time model calculation by the measurement/control panel and low inertial motor. Simulation test of an actual vehicle running condition can be executed by modeling engines, tires or vehicles other than transmission. The engines, tires and vehicles are modeled by MATLAB® / Simulink®, so they can be evaluated under various conditions by changing parameters or replacing models.
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Product
Multi-Function Test & Measurement System
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Optoplex’s Multifunction Test and Measurement System (TM100 Series) is designed to provide a flexible and cost effective optical test and measurement solution, particularly for manufacturing lines. The mainframe can be mounted in 19” rack or stationed on desk-top for ease of use. There are many selections of the pluggable modules, from tunable laser, optical spectrum analyzer, EDFA, power meter, ASE light source, optical tunable filter, optical performance monitor, …, etc.
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Product
Keypad Test system
Mistral
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Engineering Solutions Inc. (ESi)
The Mistral Keypad Test System has been designed to be the least expensive, easiest to use full featured tester for membrane switch assemblies. The idea is to combine a small, smart "pod" with a PC running software that makes full use of the Windows® graphical interface. Make it as easy to set up and use as possible yet include all the features you need.
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Product
Armature Test Systems
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Automation Technology's ATS-3800 is at the top of the class when it comes to Armature Test Systems. The ATS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; it is backed by ATI's industry leading two-year limited warranty. The ATS-3800 offers the most comprehensive testing of armatures available.
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Product
Electronic Equipment Testing System
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The task set forth the need to create a special universal software core, the main tasks of which are the provision of measurement and control processes, as well as the interaction of software components intended for collection, visualization, mathematical processing and documenting of data. For each stand, specific program modules were additionally developed according to test methods specific products. The overall modular architecture of the system makes it easy to supplement and correct test algorithms.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Product
SSD Test System
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The Neosem’s SSD test system combines advanced SSDtest hardware, software and environmental chamber into a single platform and supports all popular storage interfaces including PCIe, SAS & SATA and fast emerging protocols such as NVMe and AHCI.
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Product
Environmental Test Systems
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Manufactured products can be exposed to both thermal and mechanical stresses.These should not be considered separately, as the effects may be linked.IMV can supply vibration-test systems combined with climatic chambers to provide complete vibration, temperature and humidity environmental testing.These systems can be custom-designed to meet your application.
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Product
Test Case Management System
Kiwi TCMS
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The leading open source test case management system. *Efficiently manage test cases, plans and runs*Improve testing productivity & reporting*Integrates with popular issue trackers*External API interface*GPL 2 licensed
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
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The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
Shock Test Systems
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Sanwood Environmental Chambers Co ., Ltd.
Is featured with advanced design, high degree of automation and reliability, simple operation and convenient maintenance. The system meets the requirements of both shock and collision test, can perform conventional half-sine wave, post-peak sawtooth wave, square wave and other waveform shock tests.
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Product
Ionic Contamination Test Systems
CM+ Series
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The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.
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Product
Visible / Infrared / Imaging Test System
System 1808
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Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Product
Backplane Test System
402LV
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Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
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Product
Electrodynamic Shock Test System
FS SERIES
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The system can test the sensor and ECU for an airbag and also reproduce the shock by assuming an automotive collision and full-scale crash. The system can be incorporated into the production line for total inspection. It can maintain the operating quality of the airbag to make a contribution to lifesaving against a traffic accident.
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Product
Instrument Transformer Test Systems
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Our systems for testing voltage (VT) and current (CT) instrument transformers are conceived among other things for testing accuracy and insulation.
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Product
Systems Integration & Test
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Watring Technologies, Inc. is an experienced, diversified high technology company proficient in total system integration services including test & evaluation, custom tooling design, and automated hardware validation and verification. We give customers access to a sole- source, multi-disciplinary staff of specialists offering turn-key solutions.
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Product
Optics Test Systems
MTF Measuring Device For Endoscopes
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Optik Elektronik Gerätetechnik GmbH
Manual MTF measuring device for endoscopes. The measurement setup is based on modular individual components that can be arranged on a breadboard according to the type of endoscope (angle between light entrance and eyepiece).
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Product
Electrodynamic Vibration Test Systems
PET-series
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Vibration controller: Enables complicated vibration tests being coupled with the vibration controller.
