Flash Memory
retains data absent of power. Also known as: Flash Device
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Product
Memory Recorder
MR8847A
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High-speed 20MS/s, 16-channel, Fully Isolated Memory Recorder for On-site Jobs and R&D
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Product
Light/Laser Flash Analyzers
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Light or laser flash is a measurement technique used to determine the thermal diffusivity, thermal conductivity, and specific heat capacity of materials. Light flash measurements are essential for characterizing the heat transfer and storage properties of a variety of materials, whether the sample of interest is expected to insulate, conduct, or simply withstand temperature changes.
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Product
Programmable Read Only Memory (PROM)
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Is a Static Random Access Memory. The pinout is the JEDEC 28 pin, 8-bit wide standard, which allows easy memory board layouts which accommodate a variety of industry standard ROM, PROM,EPROM, EEPROM and RAMs.
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Product
MRAMs - Magnetoresistive Random Access Memory
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Teledyne e2v’s MRAMs type EV2A16A is an extended-reliability version of the MR2A16A from Everspin. It is the ideal memory solution for applications that must permanently store and retrieve critical data quickly. It perfectly suits the requirements of critical embedded applications such as avionic, aerospace and defence environments.
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Product
Memory And Storage
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Intel provides technically advanced products that support every level of computing—from data center workloads to enthusiast usage. Intel® Optane™ memory creates an accelerated bridge between memory and storage. Intel® Solid State Drives (Intel® SSDs) provide storage flexibility, stability, and efficiency.
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Product
Flash SATA Disk/mSATA Mini SATA 3 SLC, MLC
FSA 301 Series
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*SATA III (6.0Gb/s) interface*Capacity: SLC 1 GB to 32 GB, MLC 4 GB to 64 GB*iSMART disk health monitoring*Intelligent error recovery system*Write protection security*Anti-vibration mechanical design*Excellent data transfer speed*Zero mechanical interference*JEDEC standard MO300B dimension
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Product
Performance Profiler / Memory Leak Detector
GlowCode
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GlowCode is a complete real-time performance and memory profiler for Windows and .NET programmers who develop applications with C++, C#, or any .NET Framework-compliant language. GlowCode helps programmers optimize application performance, with tools to detect memory leaks and resource flaws, isolate performance bottlenecks, profile and tune code, trace real-time program execution, ensure code coverage, isolate boxing errors, identify excessive memory usage, and find hyperactive and loitering objects.
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Product
Memory Test System
T5511
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Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
4k/HD Frame Memory Board
GG-170
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The successor to the popular GG-167-HD/4K, this is an uncompressed HD/4K video input and output compliant frame memory board.
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Product
High-Speed Memory Test Solution
UltraFLEX-M
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The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Product
RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
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The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
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Product
Flash Solar Power Meter
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OAI’s Flash Solar Power Meter is a versatile measurement tool used for measuring the irradiance (in Suns) from Flash Solar Simulators. Flash Solar Simulators are commonly used in the production of solar panels. Integrated into the solar cell production line, this meter calibrates the flash solar simulator allowing for constant and repeatable irradiance output. By sampling at speeds up to 4000 Hz, the flash pulse temporal profile can be recorded in the meter’s memory and downloaded to a USB 2.0 port on a PC for further analysis.
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Product
Closed Cup Flash Point Testers
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Labodam closed-cup flash point testers are compact, stand-alone solutions which determine the low temperature operability in diesel fuel, biodiesel, blends and gas oils. They are designed as per Test Methods for Flash Point of Petroleum Products (Pensky-Martens Closed Cup Methods).
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Product
Avionics/Vehicles Bus, Serial I/O, Shared Memory, and More
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Curtiss-Wright Defense Solutions
Curtiss-Wright offers a wide range of solutions for high-speed, low latency communications and shared memory products. These products are offered in a variety of form-factors including PMC, XMC, PCIe and PC/104 cards designed to support popular communications standards including 1553, ARINC 429, CANbus and Serial FPDP.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
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Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Product
Automatic Tag Closed Flash Point Tester
LD-LACF-A10
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Automatic Tag Closed Flash Point TesterLD-LACF-A10is a highly automated machine with -50°C lowest flash point and simple operations. Used to determine flash point of liquids with viscosity below 5.5 cSt (mm2/s) at 40°C (104°F) or below 9.5 cSt (mm2/s) at 25°C (77°F) and flash point below 93°C (200°F) . Test method is complied with ASTM D56 international standard.
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Product
High Speed Device & Flash Programmer
JT 2147 QuadPOD
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The JT 2147 QuadPOD high speed device programmer and flash programmer comprises JT 2148 transceiver and four independent, programmable JT 2149 TAP PODs and provides signal conditioning for the DataBlaster series of boundary-scan controllers. Used for gang, parallel, fast testing / Programming of devices.TAP pods can be housed integrally within the transceiver or they can be detached and reconnected via the (optional) one meter extension cable. The JT 2148 transceiver is available in standard (/10) or industrial (/13) variants. The /13 variant includes a SCSI cable splitter to allow system integrators to use flat ribbon cables into the transceiver itself which often simplifies fixture building.A fixture-embedded variant of the JT 2147 is available as part reference JT 2147/FXT. This unit integrates the function of the transceiver and four pod onto a single assembly. This variant can also support 64 DIOS channels and SCIL functions (see more images below for a picture of the JT 2147/FXT).
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Product
Utility Card: Flash Programming Applications
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This new feature enables the Keysight Medalist i3070 ICT to perform higher speed flash programming at the ICT station in the printed circuit board assembly manufacturing line. You can combine programming and testing into a single phase, to save time and money. This in-system programming (ISP) flash solution is tester-based and does not rely on fixtures, thus enabling greater flexibility and ease of debugging.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
8k Frame memory Board
GG-169
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GG-169 is a frame memory board that supports high-speed data transfer and can input and output uncompressed 8K video.With 12G-SDI × 4 lines (up to 8 lines with the use of an optional expansion board) equipped as standard, it achieves real-time output of 8K / 59.94p.
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Product
1 Channel 100 MHz Flash ADC
NIMbox DNAE
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NIMbox DNAE - 1 channel 100 MHz flash ADC with 3 programmable TTL I/O ports, 2 channel DAC 100 MHz, 4 LE discriminators and 5 NIM or TTL I/O
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Product
Shared Memory Network PXI Express Instrument
PXIe-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - 3U PXI Express Module - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Product
Memory Testing
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C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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Product
Memory
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Renesas offers MIL-STD-883-compliant CMOS random access memory (RAM) and CMOS programmable read-only memory (PROM) devices that are that are qualified to QML Class Q military standards.
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Product
DDR4 Pro Memory Test Adapter
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This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Product
Flash SATA Disk /SATAIII SLC, MLC
FSA Series
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Axiomteks FSA (Flash SATA Disk) series is a high performance 2.5 flash disk and fully compatible with SATAIII standard which make it an ideal replacement for conventional SATA HDD without any driver or system modification. This 2.5 SATAIII flash disk is provided with huge capacities up to 512GB to meet diverse needs of data storage. With the features of high capacity storage, data integrity, anti-vibration and low powerconsumption, the FSA series is surely a solid solution for expanding an industrial computers memory.
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Product
Cleveland Open Cup Flash Point Tester
SYD'
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Chongqing Lushun Scientific & Technological Development Co., Ltd.
The instrument is designed and made as per the National Standard of People's Republic of China GB/T3536-2008 "Test Methods for Flash Point and Fire Point of Petroleum Products (Cleveland Open Cup Method)". It is suitable to determine flash point and fire point of petroleum products and asphalt, excepting fuel oils and petroleum products having open cup flash point lower than 79 C.
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Product
Memory Tester
RAMCHECK LX DDR3
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Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
