Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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Product
Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Product
Easy E23 / E84
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Objective Solutions' Easy E23/E84 product line is designed to simplify the integration of SEMI E84 and E23 into Process Equipment and Factory Vehicle systems. The models provide a standard E23/E84 infrared interface to AGV/OHV and process equipment, utilizing Hokuyo transceivers. The Easy E23/E84 units have been developed to work as-is with Hokuyo IR transceivers and as an option, with opti-isolation as required by direct-connect applications. They enable simple integration to process equipment or AGV application programs.
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Product
Semi-Automatic Isoperibol Calorimeter
AC600
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Developed to measure the calorific content of solid and liquid fuels, the LECO AC600 semi-automatic isoperibol calorimeter sets the standard for future calorimetry instruments. Its semi-automated operation, combined with the use of thermodynamic TruSpeed®, obtains a rapid analysis of calorific content and increased instrument throughput without sacrificing accuracy or instrument precision. A new, ergonomically-designed, lightweight combustion vessel assures ease of operation while greatly reducing operator strain.
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Product
Normalised Site Attenuation
NSA
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Normalised Site Attenuation (NSA) is measured in accordance with CISPR 16-1-4 and ANSI C63.4 in semi and fully anechoic environment.
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Product
Battery Pack ATS
8700
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Chroma transfers its successful experience in 8000 ATS which is quite well-known in the power electronics industry to the battery application field by developing the Test Items specifically for the battery industry. It can perform automatic tests on the Battery Management System (BMS), semi products and finished products tests on the production line as well as provide long term maintenance and service to the battery module. 8000 (8700) ATS has flexible hardware architecture that can select a variety of hardware devices, such as DC Power Supply, Electronic Load, LCR Meter and 6 1/2 digits Meter, etc. to comply with different automatic testing requirements for various applications. In addition new hardware and test items can be expanded to meet the demands for inspecting the highly customized battery products with diversified tests. The capabilities supported are:
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Product
PXI Semi-Dynamic Digital I/O Module, 48-Channel
40-419-002
Digital I/O
The 40-419-002 is a 48-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Product
Semi-Preparative SFC System Configurations
SFC-4000 Series
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The semi-prep SFC has capacity for larger scale purification, but can still be used for analytical scale method development. The system is optimized for 10mm and 20mm ID columns. The open-bed fraction collector can be triggered on time, threshold or slope based on signals from up to 4 different detectors signals including UV, PDA, fluorescence, CD and/or MS. The macro cyclone separators provide simple gas-liquid separation for excellent fraction recoveries typically greater than 95%. Fractions can be collected using an open bed fraction collector or an 8-way valve.
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Product
Semi-Automatic Probe Sheet Resistance/Resistivity Measurement
CRESBOX
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• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
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Product
Serial to Parallel Controller
E84 SPC
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300mm equipment manufacturers utilize this off-the-shelf E84 communications controller to provide SEMI E84 compliant communications for their products. With its built-in Load and Unload algorithms it is the perfect E84 communications solution for process tools, stockers, load ports, FOUP buffers, smart storage shelves and simulation load ports. The E84 SPC easily integrates with equipment controllers through a standard serial communications connection.
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Product
COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
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CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Product
PXI Semi-Dynamic Digital I/O Module, 64-Channel
40-419-001
Digital I/O
The 40-419-001 is a 64-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Product
MOSFETs, MESFETs, and Schottky Diodes
Semiconductor Module
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The Semiconductor Module allows for detailed analysis of semiconductor device operation at the fundamental physics level. The module is based on the drift-diffusion equations, using isothermal or nonisothermal transport models. It is useful for simulating a range of practical devices including bipolar, metal semiconductor field-effect transistors (MESFETs), metal-oxide-semiconductor field-effect transistors (MOSFETs), Schottky diodes, thyristors, and P-N junctions.
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Product
Semi-automatic 150mm Probe Station
CM460
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CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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Product
Machine Vision Camera - 1.3 MP, 60 FPS, e2v EV76C560, Color
Flea3 USB3
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The Flea®3 line of USB3 Vision, GigE Vision and FireWire cameras offers a variety of CMOS and CCD image sensors in a compact package. The Flea3 leverages a variety of Sony, ON Semi, and e2v sensors ranging from 0.3 MP to 5.0 MP and from 8 FPS to 120 FPS. For FLIR GigE and USB3 cameras with the latest sensors and most advanced feature sets, please refer to our Blackfly S and Oryx camera families.
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Product
PXI Semi-Dynamic Digital I/O Module, 32-Channel
40-419-003
Digital I/O
The 40-419-003 is a 32-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Product
Ultrasonic Clamp-On Flow Sensor
SEMIFLOW CO.65
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SEMIFLOW CO.65 non-contact clamp-on flow sensors are ideal to measure abrasive, adherent, corrosive, and ultra-pure liquids on rigid plastic tubes and pipes used in the semiconductor industry. Equipped with an integrated electronic unit, they function as a complete flow meter in the size of a small transducer without an external board or transmitter.
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Product
Semi-Automatic Tablet Tester
P-Series
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The versatile P-series laboratory testers offer you the latest technology, a space-saving design, and maximum flexibility. Adapt the basic units (P3-P5) to your requirements at any time.The P5 version tests all five measured variables automatically. The VibrALIGN and Roto system make it easy to position tablets precisely.The intuitive touch display enables quick and easy operation. The measurements results are shown directly on the clearly arranged display, and can be printed out or exported as PDF reports.The LAB.line design also offers many practical advantages: the generous radii, rounded corners and smooth surfaces allow easy and hygienic cleaning. The sturdy hood provides protection against environmental influences during measurements.
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Product
Semi-Automatic LCD Probe Station/Laser Repair System
LCD 2424
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The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.
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Product
EasyMatrixCode
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Automatic detection of the code in the imageDecodes ECC200, ECC000, ECC050, ECC080, ECC100 and ECC140 codesComputes quality indicators as per ANSI/AIM, ISO/IEC 15415, ISO/IEC TR 29158 and SEMI T10-0701 standardsVery fast operationImpressive robustness to noise, blur and distortionSupport of GS1 Data Matrix codesEfficient reading of codes in grid layoutMultiple codes reading
