Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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Bonding Tester
PTR1102
In wire bonding in semiconductor manufacturing, electrodes are joined using gold wires of several tens of microns. In order to measure the pull (tensile) strength and ball shear (shear) strength of this gold wire, this machine has load detection accuracy and fine positioning accuracy. In addition, for the measurement of high load areas such as die shear strength and solder joint strength, this machine supports measurement in high load areas while maintaining accuracy in low load areas by replacing the sensor part.
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Fast Response Gas Detector
Leaksurveyor
Teledyne Gas & Flame Detection
The GMI Leaksurveyor combines quality, ruggedness and advanced Technology in a user friendly, portable gas detector. The integral fast response and high sensitivity semiconductor sensor enables leakage surveys to be performed and distribution leaks to be quickly found.
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OEM DC Power System For Semiconductor
AMETEK Programmable Power, Inc.
*Single Package 6-Pack of 600W power supplies*Complete self-contained controller operates independently once pre-set*Capable of ramps and sequences*Capable of inter-channel dependent operation*DeviceNet Interface*Solid State polarity switching
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O Band Tunable Laser Source
CA9812
The CA9812 O Band tunable laser integrates a widely tunable laser with a semiconductor optical amplifier (SOA). The tunable laser is electronically tuned and can address any wavelength from 1265.00 nm to 1365.00nm. The integrated SOA facilitates flexible control of the output power and acts as a shutter when reverse biased, enabling dark tuning between channels. The device is packaged into a standard module box package, with an ternal optical isolator and a polarization maintaining fiber output.
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High Voltage Power Source
PM2000
The PM2000 is a high voltage power source capable of supplying up to 2000 V and sourcing 10mA to a load. The high potential at 2 kV fulfills coverage for mostly all semiconductor devices where leakage and breakdown measurements are involved. The module has been incorporated with interlock feature to ensure safety.
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Wafer Analysis Systems
Tropel®
Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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Ultra-Narrow Linewidth, CW TI: Sapphire Laser with Integrated Green Pump Laser
SolsTiS PI
An evolution based on our heritage in industrial semiconductor applications, SolsTiS PI combines our award-winning SolsTiS titanium sapphire laser with our Equinox green pump laser into a single, integrated platform offering unprecedented levels of stability, compactness and ease of use while retaining all the benefits of the continuous-wave, ultra-narrow linewidth and broadly tunable architecture that SolsTiS is known for.
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MOCVD Systems
For growing high-quality compound semiconductor films, few techniques match the precision of Metal-Organic Chemical Vapor Deposition (MOCVD). They give engineers tight control over film composition and thickness, making them essential for optoelectronics and advanced power transistors.
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Device Modeling Products
Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight's expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Pulsed IV Systems
AM3200-Series
AMCAD Engineering has created professional, industry-proven pulsing technology for both standalone IV-testing (Pulsed IV, PIV) as well as pulsed-bias load pull (Pulsed Load Pull, PLP) and high-voltage power semiconductor applications. Systems come equipped with a mainframe controller which includes integrated power supplies. Input and output pulser modules (probes, pulsers) are selected for specific applications and are available in bipolar ±25V/1A and high-voltage 250V/30A models.
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Amplifiers
We have designed and manufactured amplifiers using all major semiconductor materials, LDMOS, GaN, GaAs, and InP, to produce narrow, wideband, and pulse, receive and transmit amplifiers from 1 MHz to 220 GHz and power levels from mW to over 10 kW.
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LED
Scientific Computing International
A light-emitting diode (LED) is a semiconductor device that emits light when current flows through it.
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5MP MIPI Camera Module
E-CAM55_CUMI0521_MOD
e-CAM55_CUMI0521_MOD is a small form factor, 5 MP fixed focus camera module based on AR0521 CMOS image sensor from ON Semiconductor® has a dedicated, high-performance Image Signal Processor chip (ISP) on-board that performs all the Auto functions (Auto White Balance, Auto Exposure control) in addition to complete image signal processing pipeline that provides best-in-class images and video. This low light camera module can stream uncompressed VGA (640 x 480) at 75 fps, HD (1280 x 720) at 100 fps, 1280 x 960 at 75 fps, FHD (1920 x 1080) at 65 fps, 2560 x 1440 at 38fps, 2592 x 1944 at 28 fps.
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Semiconductor Package Inspection System
NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA).
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High Temperature Digital Mass Flow Controller
SEC-8000 F/D/E Series
The SEC-8000F/D/E series can operate in high temperature environments, from 15 ℃ to 120 ℃, for a variety of tasks including semiconductor and compound semiconductor processing.
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Spread Resistance For Slanting Polished Sample Of Semiconductor By Tow Kinematically-mounted Probe Contacting .
SRS-2010
*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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High Voltage 50 Ω Pulse Generator
TLP-12010A
High Power Pulse Instruments GmbH
The high-current TLP/HMM test system TLP-12010A offers advanced features intended for the characterization of semiconductor devices, discrete components, such as TVS, varistors, capacitors, gas tubes, circuits and systems in the high power time domain. It includes high current I-V characteristics inpulsed operation mode, turn-on/off transient characteristics of the device, breakdown effects, charge recovery effects e.g. reverse recovery, Safe-Operating-Area (SOA) and ESD measurements in general.
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Automated Mask Aligner with Integrated Mask Changer
Model 6000A-MC
The Model 6000A-MC is a precision system combining OAI’s Model 6000, Automated Production Mask Aligner, with an integrated mask changer. The mask changer can handle from 10 to 150 masks. Ideal for both semiconductor and bio-tech applications. It also is designed with a bar code reader to assure each mask is coordinated to the right process. Please contact OAI for further product information.
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Non-Dispersive Infrared Monitors
OPTI-Sense Series
Teledyne Advanced Pollution Instrumentation
The OPTI-Sense series of sensors is based on Non-Dispersive Infrared (NDIR) technology. They are designed to precisely measure the absorbance in the infrared spectrum of specialty gases typically found in semiconductor applications. They are very compact and designed with no moving parts, making the OPTI-Sense robust and ideal for continuous in-situ gas monitoring of semiconductor processes.
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Detectors and Associated Electronics
CdZnTe/CdTe
Baltic Scientific Instruments, Ltd
CdZnTe (CZT) is a room temperature semiconductor which allows to create X- and gamma-ray detectors with comparably high energy resolution and high count rate capability without cooling. Detectors performance allow to use CdZnTe detectors successfully in Nuclear Industry and Medicine, Safeguard and Homeland Security, many others industrial and laboratory applications.
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SparkFun Transceiver Breakout
NRF24L01+
This module uses the newest 2.4GHz transceiver from Nordic Semiconductor, the nRF24L01+. This transceiver IC operates in the 2.4GHz band and has many new features! Take all the coolness of the nRF2401A and add some extra pipelines, buffers, and an auto-retransmit feature - very nice!
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Compact Semiconductor Tester
QST4416-FC
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.
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LED
light-emitting diode (LED) is a two-lead semiconductor light source. It is a pn junction diode, which emits light when activated. When a suitable voltage is applied to the leads, electrons are able to recombine with electron holes within the device, releasing energy in the form of photons.
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Characterization Platform
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Reflectance Standards
STAN Series
Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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Probe Card Solutions
Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
