Wafer Level
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Product
Sound Level Meters
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Dalian Taijia Technology Co.,Ltd
Is used for acoustic measurements. It is commonly a hand-held instrument with a microphone.
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Product
Sound Level Meters
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Castle Group Ltd are a long standing leading manfacturer of noise measuring equipment, particularly Sound Level Meters for industrial noise monitoring. Our equipment is ideal for performing noise at work assessments to The Control of Noise at Work Regulations 2005.
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Product
Level Translators
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ADI’s level translators offer the most flexible level translation solutions in the industry. The ADG3241 series translators allow direct 3.3 V to 1.8 V translation by means of the innovative SEL pin function while allowing bidirectional data transfer. The ADG3231 series allows wide range 1.65 V to 3.6 V translation and the ADG3308 series allows the industry's widest 1.2 V to 5.5 V up or down translation while permitting bidirectional data transfer.
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Product
Wafer Probe Test System
STI3000
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Product
IK Level Tester
IK07-10
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IK ratings are defined as IKXX, where “XX” is a number from 00 to 10 indicating the degrees of protection provided by enclosures (including luminaires) against external mechanical impacts. The different IK ratings relate to the ability of an enclosure to resist impact energy levels measured in joules (J). IEC 62262 specifies how the enclosure must be mounted for testing, the atmospheric conditions required, the quantity and distribution of the test impacts and the impact hammer to be used for each level of IK rating. The IK test applicate on lighting luminaires test according to IEC60598 (GB7000) and IEC60068-2-75 (GB2423.55).
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Product
Wafer Chucks
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American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
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Product
Wafer Inspection System
AutoWafer Pro™
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AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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Product
Sound Level Meter
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Maschinenbau Haldenwang GmbH & Co. KG.
Ideal sound level measuring device for almost every acoustical environment.
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Product
Ultrasonic Level Transmitter
2260
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The type 2260 is a rugged, high performance ultrasonic secondary lightning protection level measurement transmitter, having transducer and processing electronics and a display/programming unit incorporated into a single housing.
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Product
Ultrasonic Level Measurement
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Ultrasonic technology is a perfect choice for level applications that require low cost, non-contact measurement of liquids and slurries for level, distance, volume and open channel flow. These products have excellent accuracy and will handle measurements up to 30’.
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Product
Submersion Level Detector
SL-180C
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For waste water and sewage water facilities: Pumping stations, Flow conduits in treatment plants and so on.
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Product
Wafer Chip Inspection System
7940
System
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Product
Radar Level Transmitter
DR6500
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The Drexelbrook DR6500 is a two-wire open air radar level transmitter for measuring level in applications with powder and dusty atmosphere.
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Product
In-situ Wafer Temperature Monitoring
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CI Semi's family of noncontact temperature monitors (the NTM line), offers high end pyrometry products for the measurement of wafer temperatures during process. CI Semi’s flag ship of the line, the NTM Delta, incorporates real-time, same point emissivity measurement and compensation making it the ideal solution for in situ monitoring for processes such as RTP, CVD and PVD. The NTM family is sold to leading tool manufacturers.
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Product
Signal Level Meter
HT828B
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Hangzhou Softel Optic Co., Ltd.
The signal level meter, SE828C is able to measure EQ, C/N, V/A and trunk volt in the CATV analog system, the number keys is designed to direct input frequency so that work would be easier. It can measure 2 channels at the same time.
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Product
Wafer Thickness Measurement System
MPT1000
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Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Product
Liquid Level Switches
L70 Series
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Miniature in size, allowing for use across a wide range of industrial applications. Highly compatible with numerous liquids.
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Product
MultiSite Test sockets and Wafer Level
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multi-site sockets include anything from strip test sockets to test sockets for wafer test to multi-position, singulated devices. The advantages of these sockets can be enormous as test time can be decreased by a factor of ten over conventional one up testing. In most cases, the throughput is only limited by tester capabilities and/or handling capacity.
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Product
Sound Level Meters
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Complies with IEC 61672-1 class 2 standard, Measures Leq, MaxL, MinL, SPL, 64,000 Records Data Logger, PC interface
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Product
Sound Level Meter
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Is used for acoustic (sound that travels through air) measurements. It is commonly a hand-held instrument with a microphone. The diaphragm of the microphone responds to changes in air pressure caused by sound waves.
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Product
Wafer and Cells PL System
HS-PL
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Photoluminescence (PL) Imaging is a unique non-invasive inspection tool as it can be used in-line at many different steps of the cell manufacturing process. This facilitates the direct comparison of data obtained at one process step to data obtained at another. Additionally, PL imaging can be compared to electroluminescence (EL) imaging on finished cells using comparable equipment.
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Product
Wafer Defect observing instrument
HS-WDI
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Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
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Product
Level Translators
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Renesas offers a 6-channel bidirectional, auto-direction sensing, level translator that simplifies the interface between two logic ICs operating at different supply voltages.
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Product
Wafer Inspection System
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JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
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Product
ClearLine Level Switch
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The ClearLine in-Line fluid detector is a point level switch that mounts directly into the process piping between two flat-faced flanges. This product is best suited for pump protection and low-level indication below vessels.
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Product
Probe Needles for Wafer Sort and Test Applications
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Advanced Probing Systems, Inc.
APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.
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Product
Wafer Tester
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Tokyo Electronics Trading Co., Ltd.
A vital step in the Semiconductor Value Stream, focusing on electrical screening and consumption of Known Good Die (KGD).
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
LED Tester For Chip And Wafer
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Electrical Testing: Forward：VF,DVF,VFDReverse：VZ,IROptical Testing: can test LOP in cd/mcd/W/mW/lm... from different optical componentsWavelength λp,λd,λc,hw,purity,(x,y),CCT,CRIFour-wire measurement and contact resistance in case of deviation.Auto polarity identification and preheat function.Compatible mechanical interface.Optional ESD static test system or polycrystalline test system
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Product
Sound Level Meters
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Acoustic Data These definitions are intended simply as an aid to understanding and for this reason, some are not strictly scientifically accurate. For correct formal definitions, consult IEC standards 60651, 60804, 60942, 61252 and IEC 61672: 2003 part 1.
