Wafer Level
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Product
WLCSP Probe Heads
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Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Product
System to Handle Wafer Levels
AMI AW Series
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Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
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The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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Product
High Voltage 50 Ω Pulse Generator
TLP-3010C
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High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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Product
Wafer Probers
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Devices to align probes to test the electrical properties of IC chips or TEGs (Test Element Groups) formed on wafers. The vast options available will meet various needs, from research to mass production.
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Product
Ultrasonic Wafer Scanner
AutoWafer
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Installed in more wafer applications than all other automatic ultrasonic testing tools combined, AutoWafer provides a complete, production-ready wafer scanner for wafers from 100mm to 200mm, including multiple sizes in a single batch.
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Product
Wafer Manufacturing
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Scientific Computing International
A procedure composed of many repeated sequential processes to produce complete electrical or photonic circuits on semiconductor wafers in semiconductor device fabrication process.
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Product
Level Switches
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Omega can meet your level measurement requirements by offering switches of various technologies including capacitance and conductivity, tuning fork, ultrasonic, optical, and rotating paddle switches.
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Product
Levels And Protractors
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Reads either actual level or a relative angle between two surfaces.
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Product
Level Sensors
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*High reliability due to the elimination of mechanical components*Different function principles: Guided wave radar, capacitive and hydrostatic*Devices for limit level detection or continuous level measurement*Clearly visible LED display*Suitable for all common industrial and process fluids
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Product
Level Switches
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Omega can meet your level measurement requirements by offering switches of various technologies including capacitance and conductivity, tuning fork, ultrasonic, optical, and rotating paddle switches.
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Product
Wafer Testing
Trio Vertical
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SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.
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Product
Level Switch
Z-Tron IV
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The Z-Tron IV level switch is one of our most popular on/off level switches offering an effective, low-cost material level detection in a wide variety of applications. It is widely used as an alternative to electromechanical level switches.
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Product
Contactless Wafer Geometry Gauge
MX 20x series
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The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
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Product
MPI PA Wafer Probers
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MPI Photonics Automation is the industry-leading provider of turnkey wafer test and measurement solutions. We offer a complete line of high-performance wafer probers designed to address the diverse and complex needs of the Photonics, Optoelectronic, Semiconductor, and Laser industries.
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Product
Wafer Bonder
AML
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Wafer bonding has found many applications in the field of MST, MEMS and micro engineering. These include the fabrication of pressure sensors, accelerometers, micro-pumps and other fluid handling devices. The process is also used for first-order packaging of silicon microstructures to isolate package-induced stresses. The OAI AML Wafer Bonder facilitates both the alignment and bonding to be performed in-situ, in a high vacuum chamber. For anodic bonding the wafers are loaded cold and heated in the process chamber. For high accuracy alignment the wafers are aligned and brought into contact only after the process temperature has been reached, thus avoiding differential thermal expansion effects which can compromise alignment. The AML Wafer Bonder is excellent for anodic bonding, silicon direct and thermal compression bonding applications. These features enable the bonder to be used with virtually any processing tool.
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Product
WAFER MVM-SEM
E3300 Family
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The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Product
Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Product
Level & Pressure Transmitters
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This series of low-pressure transducers is specifically designed for demanding industrial applications where the primary criteria are reliability and economy. These units provide repeatable, precision measurements under the most hostile condition.
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Product
Radar Level Sensor
VRS-20
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Versatile and simple to install, the VRS-20 has been developed by Valeport to work seamlessly with the TideMaster Tide Display/Logger and other third party data loggers using RS232, RS485 and SDI-12 communication. Non-contact technology removes the installation, corrosion & fouling issues of submerged sensors, while simplifying datum control. Accuracy and performance are unaffected by changes in water density and atmospheric conditions.
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Product
Flow, Level & Valves
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We have an extensive range of flow controllers and flow indicators for both liquid and gas applications. We specialize in flow measurement and control of media in flow lines less than 2". Our level control instrumentation is perfect for use with small to medium process and industrial tanks and storage vessels. Choose from level sensors, float switches, optical switches, and ultrasonic transmitters/controllers for single-point control, dual-point control, continuous-level control, and leak detection. Our valve selection offers solutions to meter and control fluids in laboratory, process, and industrial applications. Types of valves available include options from simple and inexpensive plastic ball valves to actuated solenoid and manifold valves. Other types of valves include check, diaphragm, elliptical, metering, needle, pinch, proportioning, and stopcocks. To fit your fluid path, connection types include barbed, compression, luer, sanitary clamp, NPT, and true-union.
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Product
Sound Level Meters
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A sound level meter is a measuring instrument used to assess noise or sound levels by measuring sound pressure. Often referred to as a sound pressure level (SPL) meter, decibel (dB) meter, noise meter or noise dosimeter, asound level meter uses a microphone to capture sound. The sound is then evaluated within the sound level meter and acoustic measurement values are shown on the display of the sound level meter.
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Product
Magnetostrictive Level Gauge
HR9200
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HighReach Measuring & Controlling System Co.,Ltd
The HR9200 magnetostrictive level gauge is a new generation of level gauge developed by the company using magnetostrictive principle combined with advanced digital and analog circuits. The product has high measurement accuracy, stable and reliable operation, and can be displayed on-site by liquid crystal meter It has compact structure, simple installation, strong resistance to power supply interference and environmental interference, and has great flexibility in use and strong environmental applicability.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Product
Ultrasonic Level Measurement
VeriGAP
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Ultrasonic technology is a great choice for high or low-level liquid level measurement requirements in a wide variety of liquids. These ultrasonic sensors require no calibration and are not affected by changes in electrical properties of the material being measured.
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Product
Wafer Prober Networking System
PN-300
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The Wafer Prober Networking System PN-300 utilizes a database to facilitate data access from other systems and provides an environment that enables the user to edit data and handle processing. The system achieves wide-ranging compatibility by adopting standard hardware and operating system. In addition, it is equipped with an N-PAF (Network-based Prober Advanced Function) to provide robust support for wafer prober operation and maintenance.
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Product
Exposure Level Tester
ELT-400
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*Wide frequency range (1 Hz - 400 kHz)*Standard-compliant measurement*Acceptance measurements compliant with CE standard IEC/EN 62233 and Generic Standard IEC 62311*Limit value traces conforming to ICNIRP 1998, 2010 and EMF Directive 2013/35/EU*Real time measurement with RMS and peak detectors*External FFT signal analysis for determining the frequency components via three channel analog output (one channel for each spatial axis) e.g. with the aid of a digital oscilloscope.
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Product
WAFER MVM-SEM® E3300 Series
E3310
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The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
