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PCI Programmable Resistor Card 2-Channel 2.5 Ohm To 4.09k Ohm
50-294-023
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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ADB Bearing Sensor Tester
The ADB Sensor Tester (ADBT) has been designed to test 4B adjustable depth bearing (ADB) style temperature sensors in the field. During planned maintenance or periodic testing, the ADBT can be used as a diagnostic tool to verify the alarm and shutdown sequences of the control unit are functioning as expected. The unit operates in two testing modes, direct (heated) and indirect (simulated).
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Intusoft Test Designer
Test Designer is today's only complete design simulation and verification system for analog, mixed-signal and mixed-systems design, which also features full fault and test synthesis capability. For the first time ever, engineers can efficiently design, simulate and test complex analog and mixed-signal circuitry in the design cycle
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Charge Coupled Device (CCD) Image Sensors for Space and Ground-Based Astronomy
(CCDs) for Space science, Ground-based Astronomy, and Earth observation applications with an impressive record of successful deliveries to a wide range of customers over 40 years.All Teledyne e2v devices can be supplied partially or fully customised to fit the application and achieve the best possible system performance. CCD image sensor design, manufacture, test and characterisation are carried out in-house enabling control from start to finish. Multi-polysilicon, multi-metal and back-illumination options are available for high resolution, high sensitivity and very low noise.
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DiodeTester
FECPLS510
Frothingham Electronics Corporation
The PLS510 automatic tester is designed primarily to doSURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses andTHERMAL RESPONSE either in DVF (mV) or degrees per Watt. All three test types may be performed in a single test program.
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Burn-In System
The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.
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Automatic Compression Testing Machine
CTEN Series
Jinan Testing Equipment IE Corporation
This series compression testing machine is mainly designed for compression test of building material items, such as concrete cube, concrete blocks, cement specimen, and bricks etc, also used for compression performance test of rubber pad and top forge test of metal. With new design idea and advanced technology, this series have more advantages in appearance, operation & applications. It is the ideal test equipment for quality control at industry & mineral enterprises, education in high schools, and technology researches at scientific institutes
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Reach Power-over-Ethernet (PoE) Testers
After assembly, electronic equipment manufacturers need to test functionally of their products. They want to provide the most test coverage, in the shortest time, for the least cost. When test engineers develop product test plans, they select the most appropriate off-the-shelf general purpose test equipment available. Reach designs and manufactures custom test equipment which is a better fit than general purpose equipment. It not only reduces test time but also reduces costs.
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Portable AC Chassis Dynamometer
TD-24-AC-T
The TD-24-AC-T is a self-contained, portable, motorized, Chassis Dynamometer specifically designed for testing Over-the-Highway (OTH) trucks. Rated to test at altitudes up to 10,000 ft (3,048 m), the TD-24-AC-T is road-legal and offers side loading with ramps. The Portable AC Chassis Dynamometer takes less than 60 minutes to set up and begin testing.
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Custom Test Design
Materials Evaluation and Engineering
Some problems require solutions beyond the standard test methods and procedures routinely performed at MEE. Replicating the suspected cause of failure on an exemplar part can provide valuable information about the likelihood of that failure case. Likewise, intentionally causing component failures in a variety of ways can provide insight into possible failure scenarios. Wondering how (or if) a design or part can be tested? Give us a call – the engineers and technicians at MEE enjoy the hands-on experience of designing customized testing plans for your unique challenges.
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54 Piece Automotive Test Connector Kit
146
This comprehensive test kit features a variety of terminal adapter sets which enable connection to most automotive vehicle connectors, both foreign and domestic. Terminal adapters connect via the included 48 inch stacking banana plug test leads. Connection to most DMM’s and scopes is no problem. Kit is designed to provide wide testing coverage and quicken the test process.
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Mach Airspeed Test Fixture
TA-6055A
The TA-6055A is a Mach Airspeed Test Fixture built to support the testing and repair of the 2082 and 2083 series of Servoed Mach Airspeed Indicators (SMASI) used in some Boeing aircraft. These mach airspeeds are synchro driven and require a coarse and fine input for altitude and a third input for airspeed. This test fixture was designed around the test procedure and is interfaced with our TA-1001 panel which provides for two of the synchro sources and two Angle Position Indicators (API).
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Hand-held Cable Tester
STM-8
The STM-8 is an economical and versatile hand-held tester designed for the testing of UTP and screened cable for opens, shorts, reversals, miswires, split pairs and cable length.
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Tester & Programmer
TP-TACT
TP-TACT is designed to test the efficiency and program the operating range of electronic turbocharger controllers.
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Spectrometer
LSCM
This device performs high-speed measurement and sorting of LED electrical and optical characteristics while synched with control signals from the LED production line inspection and sorting system. The LSCM then provides that pass/fail information to the system. The LSCM is equipped with the function to test both electrical and optical characteristics by applied voltage and current to the LED. This test device was designed to integrate test functions required by the inspection and sorting system into one compact body.
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USB-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device
779959-04
80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6255 offers analog I/O, digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Accessories for Ratio meter
The CVT Range Extender is an accessory for the ELTEL TRM-100,TRM-150,TRM-200 and ATRM-200 Transformer Ratio Meters and designed to test high ratios of CVTs used on High Voltage Systems. Provides a 1:40 range extension.
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1 KN Eccentric Roller Grips
These eccentric roller grips are specifically designed for tensile testing flexible materials, such as rubber and soft and semi-hard plastics. Named after the non-symmetric roller design, these grips employ a simple and quick clamping mechanism. They also have a self-tightening action, which maintains clamping of the specimen during testing regardless of any thickness reduction. In addition, the upper and lower grip faces are parallel grooved to help hold these soft materials.
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Large Format - Step & Repeat Tester
GATS-8300
The GATS-8300 Tester is one in a series of Test Systems designed for testing multiple-image panel using a Step & Repeat process. Rather than fixture the entire panel for electrical test, you simply fixture for one (or more) images. The GATS-8300 will Step the fixture across the entire panel and Repeat the electrical test at each step.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Harmonic Filter Resistors
Post Glover designs, builds and tests their harmonic filter resistors in accordance with applicable IEC and IEEE standards to guarantee their performance. With no two installations ever being the same, our experienced engineers develop the proper solution for your particular application and environment. Our low inductance designs are built using all stainless steel elements in corrosion resistant enclosures chosen for your unique specification. Request a quote for your custom harmonic filter resistor.
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Wristat Tester
WT25
The WT25 WRISTAT Tester is designed to test the integrity of our WRISTAT in a fast, efficient and simple manner. All of the elements of the WRISTAT - continuity of the strap, integrity of the protective resistor, and satisfactory strap to skin contact are easily confirmed by pressing the top cover of the WT25. The operator (wearer) is tested for a resistance to ground of greater than 750K ohms and less than 10M (switchable to 100M ohms).
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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PXI Multiplexer, Very High Power DC, 4-Channel, 40A, 14V
40-664A-001
The multiplexer is suitable for switching heavy loads or for slave switching large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of DC voltage at high current.
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Scienlab Combined Battery Test Solution
SL1133A
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Conductor Damage Test Set
CD-2M
Is designed to carry out tests specified for Switches used for Domestic and similar applications as included under IS:3854:1997. It is used to ensure that Screwtype terminals of switches are such that they clamp the conductor without causing undue damage to the conductor strands. It is a compact and robust andequipment housed in a bench top enclosure. The CD-2M is motorized to allow easy operation. The Instrument is designed to meet the requirements of IS:3854:1997 and other related specifications.





























