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High Voltage Cable/Harness Test System
CKT1175-50
The CKT1175-50 is a high-voltage wiring analysis system that features a switching matrix that can be distributed around the workshop or in and around the assembly to be tested. This system is expandable in 100 or 150 test point increments to 96,000 test points, and is available with a variety of adapter cable interface connectors, with the standard being the CKT MAC interface system
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Development Test for Electric Motors with Power Electronics
Test bench for electric machines and inverters in hybrid applications*Control of mechanical parameters*Verification of electrical properties*Checking the LL characteristics*Short circuit measurement*Recording the performance process*Noise measurement*Temperature measurement
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Test Stands DC
forms e.g. B. together with an MTS750 source system, a DC meter testing device with a maximum of 40 measuring stations
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Walk in Chamber for Altitude Simulated Test
Guangdong Bell Experiment Equipment Co.,Ltd
Walk in Chamber for Altitude Simulated Test Relative Standard test requirementsTest Object: battery pack and systemTest Conditions: Altitude 4000m or the equate air pressure condition, atroom temperature.The test objects stay in the test condition as Item 2 for 5 hours.Subject the test object to 1C(no more than 400A) constant current discharge until reaching the cutoff condition.After testing, observe for 2h under the room temperature.
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Multimode LAN Test Kit
KI-TK052
Multimode LAN test kit for low to modest test volume & some SM capability.
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Test Program Sets & Custom System Level Software
WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Emergency Battery Power Supply Test Fixture
TA-61
This test fixture provides an interface to test and chargethe Radiant type RPS1-B Emergency Lighting power supply. The panel includes the switching required asdescribed in the CMM along with an analog currentmeter for monitoring the charging current. This panelprovides simple testing for the corporate flight departmentor DOM.
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Wafer Test Solutions
Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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PCI Express Mini Card For MIL-STD-1553 Test And Simulation
AME1553-1
MIL-STD-1553 Test and Simulation PCI Express Mini Card with 1 Dual Redundant channel plus 2 discrete Input, 2 discrete Output channels.
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EMI Test System
TS9975
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Test Socket
Our test sockets are made for high performance and are of top quality, to guarantee a smooth, effortless process. We believe in providing our partners and customers with effective and intelligent solutions that they can apply with ease. Choose the solutions of TTS Group cater to the needs of detailed and complex systems.
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Hook Test Clip
PCM
The PCM Parrot hook Test Clip model is a small size hook test clip with a length of 70 mm, including the metal tip and the button.Due to this smaller size it is aimed to be used for many applications as oscilloscope ground, spectrum analyzers, data lodgers multimeter test leads and probes.
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Test Fixture, Shielding Effectiveness
EM-2108 | 1.5 GHz – 10 GHz
The EM-2108 is a standard test fixture for evaluation of the electromagnetic shielding effectiveness (SE) of planar materials.
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UAT Test Management
User Acceptance Testing is the final stage of the Software Development Life Cycle, which is conducted by the users. User Acceptance Testing is extremely important to determine whether the project is working fine as per the end user's point of view. The UAT test management process has to be done in an organized manner to reap maximum benefits from the process.
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Burn-In Test Fixtures
Burn-in generally involves the extended operation of a product in a temperature-controlled environment. With possible humidity and supply voltage margining - the burn-in process can then be extended to include power stress (levels and on/off cycles) tests, high humidity environmental simulation as well as the classic "four corner test" of high voltage + high temperature, high voltage + low temperature, low voltage + high temperature and low voltage + low temperature.
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Standalone with Drop-In Test Systems
800 Series ATE
The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.
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Octal Test Site Handler
3180
The Chroma 3180 is a productive pick & place system for high-volume multi-site IC testing.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Manual Model for Integrated use in VLT Test Lanes
VLT 0939
Manual Headlight Beam Tester with Same measuring Techniques as our Fully Automated models. This Manual operated model for use in VLT Test Lanes, with cable boom connection to the Test lane Computer. Including rechargeable battery pack and charge.
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VME Test Extender 6U/220mm J1/J2
111EXT6122-012X
The VME extender boards are designed to bring a circuit card completely out of a card cage so that it can be tested or debugged on both sides of the test board. Each signal, power, and ground line can be individually isolated with the DIP switches.
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AFDX ® / ARINC 664 Test And Simulation PCI Module
PCI-C664
*Supports IEEE 802.3 10/100/1000 Mbit / s full duplex Ethernet connections*Uses SFPs to support both electrical and optical interfaces*Half-size PCI / PCI-X modules*Simulates multiple AFDX® / ARINC 664 end systems*Standard Ethernet processes simultaneous with ARINC 664*Up to 128 output VLs and 512 input VLs*Upper layer protocol handling (ARINC 653, UDP, IP) managed onboard*DMA for high data rate applications*Windows XP / 7, Linux, and LabVIEW Real Time Drivers & APIs (others on request)*Easy to use tool for configuring AFDX® / ARINC 664 end systems (XML based)
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Oil Test Cell Heater
• Dry type heater for oil test cell • Temperature setting of 20º -110ºC auto cut-off • Quick heating (RF Induction) from inside & outside
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Custom Environmental Test Chambers
Does your environmental testing conditions have special requirements, or are you unsure of the right product for you? Tenney and Lunaire Environmental offer custom environmental test chambers - including custom climate chambers and custom vacuum chambers. The experienced Tenney and Lunaire team can provide customizations to their climatic chamber models based on client needs. Contact the sales team today to discuss you specific testing requirements.
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AC Hysteresis Graph Test System
DX-2012SA
Under continuous frequency of 1 kHz to 500 kHz, automatic measurement of magnetic hysteresis loop of the soft magnetic materials such as silicon steel, precision alloy, non-crystal and ferrite, accurate measurement on the dynamic magnetic characteristic parameters such as amplitude permeability µa, loss angle d, loss iron Pc, remanence Br and coercivity Hc.
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Altitude Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
The altitude test chambers of Sanwood Technology is designed to allow users to perform temperature, humidity, and altitude condition tests in a combined test chamber, and create multiple conditions to meet multiple test requirements at the same time.
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In-Circuit Test Programming Services
Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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HV Test Set
Beijing GFUVE Electronics Co.,Ltd.
Used for testing transformer, circuit breaker & switch etc by engineer, for example TTR tester can test transformer turns ratio.
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Handover Test Systems
Family of handover test systems designed for handset-to-network handover testing. Internal step attenuators allow the RF signal between the network access points and the handsets to be dynamically faded up/down. The Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted commands.
