LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments

LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments

Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism

Specifications

Product TypeTest Instrument
No other specifications are available.
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