Olympus Corp.
Manufacture and sales of precision machineries and instruments.
- 484-896-5000
- 2951 Ishikawa-machi
Hachioji-shi, Tokyo 192-8507
Japan
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Product
Laser Scanning Microscope
OLS4100
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The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Product
Videoscope
IPLEX G Lite
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The IPLEX G Lite industrial videoscope packs powerful imaging capabilities into a small, rugged body. Lightweight and able to go almost anywhere, users working in challenging applications have a remote visual inspection tool with the image quality and ease of use to get the job done.
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Product
Precious Metals Handheld XRF Analyzer
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The DELTA Precious Metals XRF Analyzer provides fast, accurate alloy chemistry and karat classification with one nondestructive, non intrusive test. Whether importing precious metals, selling or producing jewelry, or processing scrap metal, Innov-X XRF is the ideal choice.
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Product
Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Product
Inspection System
CIX100
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The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufactures who maintain the highest quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.
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Product
Consumer/ Rohs Benchtop XRF Analyzers
Xpert
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The Xpert for Consumer/RoHS, a convenient, compact & lightweight XRF analyzer for regulatory compliance programs, provides accurate Pass/Fail results within seconds. It is completely independent of an external PC and can be powered by battery for ease of transport to wherever testing is needed.
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Product
3D Measuring Laser Microscope
LEXT OLS5000
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The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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Product
Cleanliness Inspection System / Microscope
CIX90
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The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Product
Color and Monochrome Camera
DP74
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The DP74 color camera for fluorescence not only advances the speed and ease with which you can obtain detailed, accurate images but also introduces for the first time the concept of Intelligent Imaging. With Intelligent Imaging, the camera analyzes the live image and automatically applies its technology to reduce processing time and produce quality images of even dim and challenging samples. Furthermore the camera can follow your stage movements to create in real-time a panoramic image with mapped zoom-outs, a great time saver for documenting your sample. The DP74’s wide field of view and unsurpassed live speed provide an on-screen experience closely matching the traditional ocular view, thanks to its expertly calibrated colors. Maximize your investment return on a shared laboratory instrument with the camera’s top resolution of 20.7 megapixels and the capability to work with brightfield and fluorescent samples alike. These features are compatible with any microscope, whether manual or motorized, making the DP74 a perfect solution for a smarter and faster imaging workflow.
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Product
Ultrasonic Thickness Gage
27MG
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The Olympus 27MG is an affordable ultrasonic thickness gage designed to make accurate, measurements from one side on internally corroded or eroded metal pipes, tanks, and other equipment. It weighs only 12 oz. (340 g) and is ergonomically designed for easy, one-hand operation. Thickness range 0.50 mm to 635 mm (0.020 in. to 25.0 in.) depending on material, transducer, surface conditions, temperature.
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Product
Micro Spectrophotometer
USPM-RU III
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The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light. The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.
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Product
Portable Flaw Detector
EPOCH 6LT
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Portable and easy to use, the EPOCH 6LT flaw detector is an ergonomic, rugged instrument that delivers user comfort and more uptime. Weighs just 1.95 pounds (890 g) with a grip-oriented weight distribution for one-handed operation with minimal wrist fatigue. Rotary knob and simple button design make it easy to use, even when wearing gloves. Engineered to IP65/67 and drop tested. Clear, bright screen for readable A-scans in any light. The EPOCH 6LT flaw detector’s workflow is simple and straightforward. Despite the instrument’s small size, it has the features and functions to meet the requirements of nearly any conventional ultrasonic inspection application.
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Product
Industrial Microscope for Materials Science & Industrial Applications
BX53M
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Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.
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Product
Benchtop XRD System
BTX
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The BTX Benchtop XRD System is a fast, low cost, small footprint, benchtop XRD for full phase ID of major, minor and trace components and quick XRF scan of elements Ca – U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysis rivaling the performance of large costly lab units.
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Product
Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
















