SET GmbH
SET GmbH is your specialist and partner for development in the field of semiconductor test systems, HiL and functional test systems for the aerospace industry, as well as in electronics development and electronics manufacturing. We have been constantly growing since its founding in 2001 and have been part of Emerson’s Test & Measurement Business NI since 2023. In addition to our know-how, the technical skills of our employees and an authentic value system, we have been convinced since the beginning that we are making customers support and making them successful. Our renowned customers and the large number of successfully completed projects from the aviation and semiconductor industries confirm our conviction and we are always pleased to be part of these projects and successes.
- +49 (0) 7522 91687-600
- +49 (0) 7522 91687-899
- info@smart-e-tech.de
- Spinnerei 3
Wange, Allgäu 88239
Germany
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product
AFDX ® / ARINC 664 Test And Simulation PCI Module
PC104p-429
*4 or 8 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*128 MB RAM*Label selective triggering for recording / filtering*Real-time recording and later analysis of multiple channels*Sorting according to SDI field*VXI Plug & Play driver including soft front panel*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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product
MIL-STD-1553 A / B Test And Simulation 3U PXI Module
PXI-C1553
*Dual redundant*1, 2 or 4 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*PXI trigger on 1553 bus events*10 programmable, discrete I / O (up to 30V)*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, LabView Real-Time and other systems
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product
Signal Conditioning With SLSC
Switch Load and Signal Conditioning standardizes the "last mile" between the measuring device and the device under test (DUT) in hardware and software. SLSC is a modular extension for data acquisition products such as PXI and CompactRIO.
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product
PSI5 Sensor Interface Card
SET-1640
PSI5 is an open standard based on existing sensor interfaces for peripheral airbag sensors and has already proven itself in millions of airbag systems.
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product
System on Demand (SoD): HiL Test System
System on Demand (SoD) is a unique, agile and standardized principle to design HiL test systems. SoD shifts the focus away from technical-only solutions to a proven automated design process – targeting our customer‘s real issues: time, budget and flexibility.
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product
Simulation And Analysis Software
fcXplorer Analyzer
Avionic Interface Fiber Channel Simulation and Analysis Test Software, fcXplorer, is an easy-to-use graphical user interface for Fiber Channel Simulyzer modules. fcXplorer is designed for troubleshooting, optimization, planning and configuration of fiber channel data. The low and high level protocol analysis offers acquisition, filtering, time stamping and interpretation of Fiber Channel data traffic and generates statistics.
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product
ARINC 429 Test And Simulation PMC Module
PMC-429
*4, 8, 16 or 32 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Sorting according to SDI field*VXI Plug & Play driver including soft front panel*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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product
MIL-STD-1553 A / B Test And Simulation USB Module
USB-1553
*Dual redundant*1 or 2 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*More programmable triggers and acquisition*10 programmable I / O*Onboard IRIG-B timecode encoder / decoder*Supports stand-alone operation via USB connection, without external power supply*On-board battery for runtime without power supply
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product
ARINC 429
The avionic interface ARINC 429 products offer solutions for flight instrumentation (FTI), for data acquisition, for protocol analysis and for robustly embedded applications.
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product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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product
Resolver Demodulator
RDK 9316
RDK 9316 is a compact, reliable and highly versatile Resolver-to-digital conversion module.
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product
MIL-STD-1553 A / B Test And Simulation VME Module
VME-1553
*Dual redundant*1, 2, 4 or 8 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*Multi-level trigger for data acquisition and filtering*10 programmable, discrete I / O*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*VISA based VXI Plug & Play driver*Optional twinax front end
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product
Real Time Fault Module
SET-2315
The main function of the module is to multiplex signals on the fault buses.With 16 channels, the SET-2315 provides real time fault connection capabilities in a small form factor.The fault bus leads to the base cards connector to connect any fault device.
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product
ARINC 429 Receiver
9429 RX
In addition to its wide supply voltage range from 18 V – 36 V the 9429RX module is characterized by its electrical isolation between the cRIO rack and the ARINC interface.
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product
HTOL Test Systems
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.