SET GmbH
SET GmbH is your specialist and partner for development in the field of semiconductor test systems, HiL and functional test systems for the aerospace industry, as well as in electronics development and electronics manufacturing. We have been constantly growing since its founding in 2001 and have been part of Emerson’s Test & Measurement Business NI since 2023. In addition to our know-how, the technical skills of our employees and an authentic value system, we have been convinced since the beginning that we are making customers support and making them successful. Our renowned customers and the large number of successfully completed projects from the aviation and semiconductor industries confirm our conviction and we are always pleased to be part of these projects and successes.
- +49 (0) 7522 91687-600
- +49 (0) 7522 91687-899
- info@smart-e-tech.de
- Spinnerei 3
Wange, Allgäu 88239
Germany
Categories
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product
Dual Port Simulator Fiber Channel PXIe Module
PXIe-FC4 Simulyzer
The modules are available as a single-function board - for analysis or for simulation / data generation - but also as a full-function board for simultaneous analysis and simulation. By simply upgrading the firmware / software, a single function board can become a full function board without having to purchase new hardware.
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HTOL Test Systems
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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ARINC 429 Test And Simulation VME Module
VME-429
*8, 16, 32 or 64 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*VXI Plug & Play driver including soft front panel*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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product
AFDX ® / ARINC 664 Test And Simulation XMC Module
XMC-664
*Supports IEEE 802.3 10/100/1000 Mbit / s full duplex Ethernet connections*Uses SFPs to support both electrical and optical interfaces*Half-size PCI / PCI-X modules*Simulates multiple AFDX® / ARINC 664 end systems*Standard Ethernet processes simultaneous to AFDX® / ARINC 664*Up to 128 output VLs and 512 input VLs*Upper layer protocol handling (ARINC 653, UDP, IP) managed onboard*DMA for high data rate applications*Windows XP / 7, Linux, and LabVIEW Real Time Drivers & APIs (others on request)*Easy to use tool for configuring AFDX® / ARINC 664 end systems (XML based)
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AFDX ® / ARINC 664 Test And Simulation PXI Module
PXI-C664
*Supports IEEE 802.3 10/100/1000 Mbit / s full duplex Ethernet connections*Uses SFPs to support both electrical and optical interfaces*Half-size PCI / PCI-X modules*Simulates multiple AFDX® / ARINC 664 end systems*Stard Ethernet processes simultaneous to AFDX® / ARINC 664*Up to 128 output VLs and 512 input VLs*Upper layer protocol handling (ARINC 653, UDP, IP) managed onboard*DMA for high data rate applicationsWindows XP / 7, Linux, and LabVIEW Real Time Drivers & APIs (others on request)*Easy to use tool for configuring AFDX® / ARINC 664 end systems (XML based)
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H(3)TRB & HTGB Test Systems
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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32Ch Isolated Output Card
SET-1320
This card offers 32 optically separated open collector outputs that can switch up to 100mA at 60V. SET-1320 combines tight IO with high isolation voltages and an extensive output voltage range.
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AFDX ® / ARINC 664 Test And Simulation PMC Module
PMC-664
*Supports IEEE 802.3 10/100/1000 Mbit / s full duplex Ethernet connections*Uses SFPs to support both electrical and optical interfaces*Half-size PCI / PCI-X modules*Simulates multiple AFDX® / ARINC 664 end systems*Standard Ethernet processes simultaneous to AFDX® / ARINC 664*Up to 128 output VLs and 512 input VLs*Upper layer protocol handling (ARINC 653, UDP, IP) managed onboard*DMA for high data rate applications*Windows XP / 7, Linux, and LabVIEW Real Time Drivers & APIs (others on request)Easy to use tool for configuring A*FDX® / ARINC 664 end systems (XML based)
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product
SLSC RTIs
Rear Transition Interfaces (RTIs) are mounted at the rear side of the SLSC chassis as part of the backplane. The RTIs contact the signal and power connector of the SLSC card and provide a powerful and flexible solution to connect a wide range of industrial measurement equipment. The connectors and pinouts are designed to match the National Instruments (NI) standard. For this there is a wide choice of cables to connect the SLSC and the NI measurement units.
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Signal Conditioning With SLSC
Switch Load and Signal Conditioning standardizes the "last mile" between the measuring device and the device under test (DUT) in hardware and software. SLSC is a modular extension for data acquisition products such as PXI and CompactRIO.
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product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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product
32Ch Isolated Input Card
SET-1310
This card provides 32 optically isolated digital inputs. SET-1310 combines high-density IO with high isolation voltages and a wide input voltage range. It allows to break ground loops and protect your system from high-voltage spikes, but also to connect high voltage signals to standard logic level acquisition devices. The channel-to-channel isolation allows to connect signals from different DUTs to a single acquisition system without compromises.
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product
MIL-STD-1553 A / B Test And Simulation PC / 104+ Module
PC104p-1553
*Dual redundant*1, 2, 4 or 8 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*Multi-level trigger for data acquisition and filtering*10 programmable, discrete I / O*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, LabView Real-Time and other systems*Supports ARINC429 and ARINC 664 operations
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32CH 4-20mA Current Sink Card
SET-1250
Each channel provides an isolating relay and a short-circuit MOSFET with which opening and short-circuit errors can be simulated. The short-circuit MOSFET has overcurrent protection with integrated current limitation.
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MIL-STD-1553 A / B Test And Simulation VME Module
VME-1553
*Dual redundant*1, 2, 4 or 8 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*Multi-level trigger for data acquisition and filtering*10 programmable, discrete I / O*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*VISA based VXI Plug & Play driver*Optional twinax front end






















