Chroma ATE Inc.
Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma". Significant markets served by Chroma include semiconductors, photonics, LED, photovoltaics, video & color, flat panel displays, power electronics, passive components, electrical safety, green batteries, electric vehicles, thermoelectrics, automated optical inspection and intelligent manufacturing systems for ICT and cleantech industries.
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Guishan, Taoyuan 333001
Taiwan, Province of China
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product
Adapter/Charger ATS
8020
Chroma 8020 has standard test items specially customized and optimized for the features of Adapter and Charger that provides excellent test performance to meet the requirements of mass production. Meanwhile, the software equipped is very friendly and easy to operate that is suitable for production line use.
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product
Regenerative Grid Simulator
61800 series
Market demand for Distributed Resource (DR) products such as PV inverters and wind energy systems is steadily growing as the world strives for clean renewable energy sources. This demand has created a need for rigorous regulation testing to standards such IEEE 1547 / IEC 61000-3-15 / IEC 62116 ensuring proper and safe operation of on-grid products. It has become critical to manufacturers to conduct these tests to prove compliance and to relieve product liability concerns. Chroma’s new 61800 family of Grid Simulators has been designed to fulfill these test requirements by providing a full 4 quadrant, fully regenerative, grid simulator with advanced features for compliance, safety and product verification testing.
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product
PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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product
Full Range Active Thermal Control Handler
3110-FT
Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.
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product
Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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product
High Performance Programmable AC Power Source
61500 Series
Chroma 61500 Series have built in 16-bit measurement circuits and firmware utilities to measure the true RMS voltage, current, true power, apparent power, reactive power, power factor, current crest factor, and inrush current.
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product
Wound Component EST Analyzer
19036
Chroma 19036 is the industry's first wound component electrical safety test (EST) analyzer that combines the functions of impulse test, hipot, insulation resistance and DC resistance measurements. It has 5kVac/ 6kVdc high voltage output, 5kV insulation resistance, 6kV layer short impulse voltage and 4-wire DC resistance measurement that can comply with the wound components test demands by providing maximum 10 channels output for multichannel scanning tests to save time and labor costs.
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product
Flat Panel Display Test Solutions
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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product
Wound Component EST Scanner
19035
The quality verification tests for wound components consist mainly of AC/DC Hipot tests and insulation resistance (IR) tests. The Chroma 19035 wound component EST scanner series perform safety tests for motor, transformer, and heater related wound products.
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product
High Speed PXIe Digital IO Card - 32 Channels, Extendable up to 256 Channels in One Chassis
Model 33010
Chroma 33010 is a high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO Card consists of a Sequencer Pattern Generator (SQPG) and 32 Channels of fill ATE-like features. The 33010 IO card is expandable up to 356 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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product
Single Site Test Handler
3210
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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product
Component Test Scanner
Model 13001
Support component test scanningSupport 8 slots for plug-in (removable), up to 320 channels for one unitOption A130007 40 channels scan module, input up to 500VDC for IR test without switchingMax. 8 salve units for multiple scanner (master/slave interface)Support Chroma LCR meterSupport Chroma 3302/3252/11025 turn ration functionSupport 11200 CLC/IR meter for IR testStandard RS-232, GPIB and USB interface13001 can be installed in Chroma Component ATE model 8800Support ICT applications
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product
Battery Test & Automation Solutions
Chroma specifically developed battery cell test solution which is an integrated solution for battery cell formation & grading processes. From battery cell formation procedure to grouping process, Chroma 17900 series are customized with professional planning service which includes manufacturing flow path planning, test station/ equipment planning, test data management and so on to create high performance manufacturing capability.
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product
Digital Power Meter
Digital Power Meter is designed for single-phase measurements of AC power signals and related parameters common to most electronic products. Instead of traditional analog measurement circuits, the 66200 uses state-of-the-art DSP digitizing technology.
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product
FPD Tester
2918
The 2918 FPD tester provides 8k Super Hi-Vision (7680x4320/ 8192x4320) for testing Full 8k@60/120 Hz resolution (32/64 lane V-by-one) is supported by one tester.