Chroma ATE Inc.
Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma". Significant markets served by Chroma include semiconductors, photonics, LED, photovoltaics, video & color, flat panel displays, power electronics, passive components, electrical safety, green batteries, electric vehicles, thermoelectrics, automated optical inspection and intelligent manufacturing systems for ICT and cleantech industries.
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Guishan, Taoyuan 333001
Taiwan, Province of China
Categories
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product
Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Digital Power Meter
Digital Power Meter is designed for single-phase measurements of AC power signals and related parameters common to most electronic products. Instead of traditional analog measurement circuits, the 66200 uses state-of-the-art DSP digitizing technology.
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Flicker Measuring Probe for LCM ATS
A712306
The Chroma A712306 Flicker Measuring Probe for LCM ATS is specifically designed for adjusting the flicker on LCM automatically following the FMA(Flicker Modulation Amplitude) standards defined by VESA (Video Electronics Standards Association) and JEITA (Japan Electronics Information Technology Industries Association) for flicker measurement.
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Programmable DC Power Supply
62000E Series
Chroma 62000E Series offers single channel models with power ratings of 1.7kW, 3.4 kW, and 5kW, and three channel models rated at 1.7kW, all housed in a compact 1U chassis featuring industry-leading power density.
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AC Power Source
AC power source 61500 series sets up the new standard for high performance AC power source. It equips with all powerful features such as power line disturbance (PLD) simulation, programmable output impedance, comprehensive measurement functions, wave-shape synthesis and regulation test software.
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PXI SMU/Power Supply Instrument
a programmable PXI-Express DPS (Device Power Supply) Card designed for high-accuracy and reliable output power for device test applications. Its compact size, easy level of integration, and high flexibility make the 52310e Series ideal for multi-channel power supplies.
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Digital Power Meter
66203/66204
Chroma 66203/66204 Power Meters are designed for multiple phase power measurement applications. The wiring mode function allows the user to take accurate power measurements for various wiring modes 1P2W/1P3W/3P3W/3P4W as well as providing accurate standard power measurements common for most electrical devices. A unique feature of the 66203/66204 is its stateof- the-art DSP digitizing technology instead of less accurate and slower traditional analog circuits. The internal 16 bits analog/digital converters with sampling rates of up to 250kHz provide both high speed and high accuracy measurements which is unprecedented within the industry for this class of power meters. The instruments include a four part display with 7-segment LED front panel readouts. Users can easily select desired parameters and readouts with a touch of a button. The 66203/66204 meters also include remote control using USB or GPIB interfaces via rear panel connections.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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PXIe Short SMU
52403P
Chroma's 52403P is a PXI Express Short Pulse SMU (Source/Measure Unit) designed for fast, precise and reliable sourcing and measurement of thermo-sensitive devices such as high-power laser diodes (LD). Integrating a high-speed pulser, a high precision SMU and a DAQ module into a single PXIe SMU, the 52403P can measure both the LIV and the low-level leakage current of a high-power LDs.
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Die Test Handler
3112
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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8K Super Hi-Vision Video Pattern Generator
Model 2238
Featured in modular design, the 2238 Video Pattern Generator is capable of providing 8K Super Hi-Vision (7680 x 4320 / 8192 x 4320) resolution for testing. Full 8K at 30/60 Hz resolution is supported by one single module (via a HDMI Display Port), and up to 4 modules can be installed and configured as required for all testing application to 8K. DisplayPort 1.3 signal module (Optional)
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Introduction to Graphical User Interface - Softpanel
61800 Series
The increased demand for Distributed Energy Resource (DR) products such as PV Inverter and Wind Energy systems, have increased the demand for regulation test standards to insure proper operation and safety of on-grid products. Manufacturers testing to prove compliance, need test equipment that can simulate and measure and test their products. Chroma’s 61800 family of Regenerative Grid Simulators provide a full 4 quadrant, regenerative, grid simulation for compliance, safety, and product verification testing
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P






















