Filter Results By:
Products
Applications
Manufacturers
-
product
Sputter Coater & Freeze Fracture Solutions
To obtain high-quality images of samples with scanning (SEM) or transmission electron microscopy (TEM), your samples need to be conductive to avoid charging. If a sample does not have a high enough conductivity, then you can quickly cover it with a conductive layer using the method of sputter coating. Also, a carbon or e-beam evaporator coating can be used. Such coatings protect the sample, allow enhancing of the EM image contrast, or can act as a TEM-grid support film for small scale samples.
-
product
Scanning Electron Microscopy (SEM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
-
product
Microscopy
Aurora is an award-winning Airy Beam Light Sheet imaging system designed for researchers working in fields such as neuroscience, developmental biology, cancer biology, regenerative medicine and other bioscience disciplines, including Plant Sciences and Marine Biology. Compact, affordable and customisable, Aurora is available as a single and multiphoton light sheet fluorescence microscope for rapid, large 3D volumetric imaging, high resolution, multicolour, time-lapse imaging and live cell imaging. Aurora uses ground-breaking Airy Beam Light Sheet imaging techniques to achieve outstanding results in the field. It is currently in use by many leading organisations delivering results previously not possible.
-
product
Transmission Lines
SemiGens 50-ohm Transmission Lines offer the RF/microwave designer complete flexibility and repeatability for the most challenging applications.
-
product
Transmission Dynamometers
SuperFlow’s Axiline and Hicklin transmission test stands cover the complete range of light-duty, medium-duty, heavy-duty and cross drive transmissions on the market today. With solutions for everything from passenger cars to the M1 tank and features like mechatronic shift controls, no-hassle precision aligment tooling and the available PowerNet Data Acquisition and Control system for fully automated tests and reports, SuperFlow transmission dynos are the only choice of the top transmission remanufacturers world wide. Check out or custom testing solutions page for examples of custom transmission test stands we’ve built for heavy duty cross drive dynos and full AC regenrative test stands.
-
product
Transmission Dynamometers
Our equipment tests automatic and automated-manual transmissions. On and off-highway transmission test stands, transmission and hydraulic component test stands and valve body test stands.
-
product
Microscopy and Automation Solutions
Opto already offers automated multifluorescence microscopes for cell analysis, inverted autofocus microscopes for motion analysis of growth processes, and high- throughput fluorescence microscopes for DNA and RNA sequencing.
-
product
Scanning Electron Microscope
JSM-IT510
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
-
product
Analytical Software for Microscopy
SPIP
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
-
product
Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
-
product
Electron Microscope Analyzer
QUANTAX EDS for TEM
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
-
product
Transmission Hazemeter
Novo-Haze TX
The Novo-Haze TX Transmission Hazemeter offers fast and accurate measurement of the optical quality of plastic films and other transparent materials. This instrument measures total transmission and haze according to ASTM D1003 (CIE C), the most important standard used in most QA applications.
-
product
Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
-
product
Microscopy Software/Hardware
ZEISS Atlas 5
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
-
product
Electron Microscope Sample Preparation
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
-
product
Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
-
product
Neurosurgery Microscopy Solutions
Leica Microsystems offers a range of surgical microscope solutions to support neurosurgeons in the most complex microsurgery applications. Our cutting-edge neurosurgery microscopes provide optimal and reliable visualization, including built-in fluorescence filters and innovative GLOW 800 augmented reality fluorescence.
-
product
Cryo-Correlative Microscopy Stage
CMS196
Linkham Scientific Instruments
Electron microscopy (EM) provides structural information at very high resolution. However, it can give only restricted insight into biological and chemical processes due to limitations in staining and sample preparation processes. Fluorescence microscopy on the other hand is a very sensitive method to detect biological, chemical and genetic processes and events inside living cells. Cryo-CLEM brings it all together: it is a new and emerging technique to combine the individual advantages from both Fluorescence and EM by imaging the same sample location with both techniques and superimposing the complementing information.
-
product
Optical Signal Transmission
Analog
Used for oscillographing analog signals under EFT/EDS/RF interference.
-
product
Wireless Transmission
Wireless transmission is a form of unguided media. Wireless communication involves no physical link established between two or more devices, communicating wirelessly. Wireless signals are spread over in the air and are received and interpreted by appropriate antennas.
-
product
Microscopy
Our microscopy systems business is focused on providing best-in-class performance within a modular architecture. We design and manufacture Andor products to integrate with our own and third-party software, and all leading microscopes, we also support high quality products from other manufacturers.
-
product
Electron Probe Microanalyzer
JXA-8530FPlus
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
-
product
Electron Microscope Analyzer
QUANTAX FlatQUAD
QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
-
product
Transmission Line Probes
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.
-
product
Microscopy Software Suite/IC Diagnostics
Crystal Vision
Crystal Vision Microscopy suites are transforming the world of IC Diagnostics and failure analysis. Intuitive software allows user friendliness and enables the breadth of analytical disciplines available. Realtime imaging from both Topside and Backside, allows for maximum productivity.
-
product
Telecom Transmission Tests
Networked Communication Solutions, LLC
Is designed to test across the full bands of T1-Lite® or E1-Lite® or test individual timeslots.
-
product
Nanoscale Microscopy Standards
The nanoscale AFM-CD standard (CD, critical dimension) contains structures to calibrate line widths and periods of AFM (atomic force microscopy) devices.
-
product
Enterprise/ Carrier Transmission Tester
UniPRO MGIG1 Series
Designed for comprehensive turn-up testing, monitoring and troubleshooting of fixed line, mobile, microwave and wireless carrier Ethernet links. UniPRO MGig1 is suitable for use on any backhaul link at speeds of up to 1 Gb/s.
-
product
Single Molecule Microscopy
Nano-scale precision motion and stability are cornerstones of research grade microscopes for single molecule imaging. Mad City Labs has developed modular microscopes that ease integration of optical components and assist users with developing and adapting instrumentation for their own application requirements. Contact our single molecule microscopy application development team to discuss the right products for your application.
-
product
Auger Electron Spectroscopy (AES)
Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
