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Remote Test Unit (RTU) Expert
RTU Series
VeEX’s Remote Test Units (RTU) are self-contained, scalable test and monitoring probes for communications networks. When used as part of the VeSion cloud-based monitoring system, these rackmount probes are optimized to work with a centralized server system. In addition, the probes can be operated in standalone mode via web browser.
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Interface Pin
Smiths Interconnect offers interface probes for all major test equipment manufacturers. We also provide a variety of interface pins for use in test fixtures.
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Benchtop with Drop-In Test System
600 Series Compact ATE Platform
The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Dynatrol® Digital Viscosity Converters
Series 3000
Dynatrol® Series 3000 Digital Viscosity Converters were designed for use with all Dynatrol® Viscosity Systems. Using microcontroller technology, the digital converter accepts information from a Dynatrol® Viscosity Probe and calculates the viscosity of the liquid under test. The Series 3000 converter mathematically computes and displays the viscosity in standard units.
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Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
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LED Test
Universal LightProbe Penta sensors are Optomistic Products' most popular LED test sensor, relied upon for their versatility in accommodating most LED test applications for color and intensity. The Penta Sensor provides analog voltage outputs, and features built-in color binning, eliminating the need to convert LED wavelength to visual color in the ATE software, and saving valuable processing time. For use with any of the Universal LightProbe Fiber-Optic Probes.
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Logic Analyzer Probe
FS2510AB
The FS2510AB is a logic analyzer probe used to test DDR4 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154A/B/64A logic analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR4 DIMMs.
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Standard Probe Station Chucks & Accessories
In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Hall Effect Thickness Gage
Magna-Mike 8600
The Magna-Mike® 8600 is a portable thickness gage that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Operation of the Magna-Mike is very simple. Measurements are made when its magnetic probe is held or scanned on one side of the test material and a small target ball (or disk or wire) is placed on the opposite side or dropped inside a container.
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Cleaner for Test Probe
EQOmat
We have developed EQOmat, a cleaner exclusively for test probes that removes dust such as flux and solder debris adhering to the tip of the test probe. The structure and thinness built with the user's convenience in mind are important items that have sufficient functionality and are indispensable for long-term use of the probe. * EQOmat is an abbreviation for Ecological Qualified Octopus Mat.
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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1kV, 120 MHz High Voltage Differential Probe Without Tip Accessories and with Auto Zero Disconnect
HVD3106A-NOACC
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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30 Amps, 100 MHz BW Current Probe - AC/DC , 50 Amp Peak Pulse
CP031
Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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500Mz Spectrum Analyzer
SM-5005
Is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Logic Analyzer Probes
FS2354 & FS2355
The FS2354 and FS2355 are logic analyzer probes used to test DDR3 SO-DIMM memory modules. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 SO-DIMM systems.
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Adapter/Stainless Steel
WADP-29M29F
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Rakes and Probes
AEI offers industry leading aerothermal rake and probe design and manufacuring. Aerodyn's unique combination of extensive in-house capabilities and close-knit structure allows challenging and time pressured rake and probe jobs to be handled. AEI welcomes anything from simple make-to-print jobs to elaborate design/fabricate/proof test projects.
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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Crack Testing
STATOGRAPH® Product Family
Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.
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Ultrasonic Immersion Probes
SONOSCAN I
The SONOSCAN immersion transducers for Non-destructive Testing (NDT) are mainly used to test metals and plastics for the smallest material defects. For example, binding defects, welding defects or cracks and pores in metal parts can be detected. The powerful, robust ultrasonic probes can be connected to all common ultrasonic testing devices. Due to variable designs and sizes, the immersion probes guarantee optimal use. In addition to ultrasonic standard pobes, we also offer customized transducers according to your individual specifications.
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Flying Prober Test
QTOUCH1202C
Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-7
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Voltage/Continuity Tester
VOT-50
Standard Electric Works Co., Ltd
● Voltage test: 12V to 690V AC/DC (7 LEDs) with indication by buzzer.● Voltage range: 12V, 24V, 50V, 127V, 230V, 400V, 690V.● Polarity test: LED +/-● Audible continuity test● Self-test button to ensure proper function of the device prior to testing.● Waterproof design, protection class: IP54● Phase / Neutral identification● Integrated storage clips for test probe.● Rubberized injection molding.
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Monitor and Test Video Quality
Torque Electronic Couch Potato (ECP)
The ECP is designed to monitor and test video quality of experience. This affordable, compact, palm-sized monitoring probe monitors true customer viewing experience by providing measurements from the end users’ point of view, after the STB. Scanning through available channels or navigating through interactive content menus via an external IR blaster, the ECP provides a single dashboard highlighting service quality across all channels.
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Adapter/Stainless Steel
WADP-NMNM-01
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-9
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Pitot / Static Tester for Laboratories and Workshops
ADSE 741
The ADSE 741 is a complete high performance three channel Ps, Pt and AoA stand-alone test bench specially designed to be used in the workshop or in the laboratory to test and calibrate all air data equipment such as altimeters, vertical speed indicators, air speed indicators, pneumatic AoA (Angle of Attack) indicators, MACH-meter, air data computers, specific probes and sensors.The high precision embedded sensors enable the ADSE 741 to be used as a pressure standard.The user interface is programmed underWindows and Labview, with a data base managed in a spreadsheet for easy evaluation, management, statistics and presentation.
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Precision Flying Probe Platforms For Automated Test Applications
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
