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Server Test
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Time Shift Test Java Applications w/in a WebLogic Managed Server
Time Machine Framework for WebLogic
The Time Machine Framework for WebLogic provides a great set of features enabling time shift testing scenarios for Java applications deployed to Oracle WebLogic. This Framework enables customers to use Time Machine functionality to time shift test Java applications within a WebLogic managed server without the need to create a separate instance of the application server for testing other time related activities. The Framework allows customers to configure and automatically create different virtual clocks on managed servers within the WebLogic domain as well as the granularity to establish virtual clock rules for specific applications deployed to the managed server.
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Service Assurance Remote Probe for IPTV, OTT, VoiP & Internet
µNET
The μNET is a palm size probe for testing and monitoring Triple-Play services (IPTV, VoIP, Internet) at the customer set top box or the last mile concentrator (ie.GPON mux). Multiple μNET probes can be used throughout the IPTV network on a temporary or permanent basis. Test results are sent to the external FTP server. All tests are performed in a cycle set up by the user.
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Video QoS Monitoring Web Management Software
TSM Web
The TSM Web is a web service program for managing Mividi Video Monitoring Systems or Multiviewer Systems. It provides an Internet gateway to Mividi Video Monitoring servers in order to remotely access test results and configure the test servers using the Internet.
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SSL/TLS Server Test
Test SSL/TLS implementation of any service on any port for compliance with PCI DSS requirements, HIPAA guidance and NIST guidelines. Free
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API Testing with LoadView
Simulate 1,000s of users hitting your API every second to generate 100,000+ calls to your server per load testing session.Define your API tests to simulate traffic at the pace you need by implementing a load curve that increases the number of simultaneous users as necessary to properly test your system.Gather performance metrics consisting of the response times of each session and validation that the API returns the expected results in each response.Visualize how the average response time is affected as you increase the number of simultaneous users.Examine individual test sessions to see error codes and utilize additional troubleshooting tools such as traceroutes, waterfall charts and a copy of the server response.
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Test Database Software Module
The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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3U CompactPCI Serial 2.5" SATA Storage Carrier
cPCI-A3H10
- 3U 4HP CPCI-S.0 peripheral- One 2.5" SATA 6Gb/s drive slot- Status LEDs on faceplate: drive activity, hot-swap status, user-configurable- Hot swap support- Operating temperature: -40°C to 85°C with qualified com
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4U AI GPU Edge Server
AXE-7400SR
ADLINK's AI Edge Server AXE-7400SR series can be equipped with various acceleration cards according to application needs. The flexible and diverse combinations can meet the various changes in smart manufacturing applications, including GPU cards, motion control cards, IO cards, and image capture cards. AXE-7400SR features a single 4th Gen Intel® Xeon® Scalable Processor, 8x DDR5 DIMMs at 4800MT/s (8 channels, 1DPC), and supports up to 5x full-height PCIe slots for GPU/FPGA accelerator cards. Additionally, it includes a BMC with AST2600, IPMI v2.0/Redfish compliant, a dust-proof design, and a short chassis, making it suitable for factory and automation environments.
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2U 19” Edge Server with Intel® Xeon® Scalable Silver/Gold Processors for 5G MEC Infrastructure Deployment
MECS-7211
The MECS-7211 Edge Server focuses on the edge of 5G networks to provide an open, white box platform for 5G Open RAN, private 5G networks, and a wide range of 5G MEC applications including smart cities, retail, manufacturing, autonomous vehicles, Argument Reality(AR), virtual reality(VR) and healthcare. The MECS-7211 is designed to meet stringent requirements by delivering a high level of deployment flexibility, reliability, scalability, and carrier-grade processing performance further augmented by hardware expansion. With a 450mm system depth in a small footprint 2U chassis, all I/O front access, wide operating temperature support (-5°C to +55°C), and PCIe expansion slots reserved for access to acceleration hardware such as GPU, FGPA and QAT adapters, ADLINK’s MECS-7211 is a high performance COTS platform that meets varying application and deployment requirements, and enables customers to focus on differentiating their end solutions.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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2U 2 GPUs AI GPU Server
AXE-7220SR
- Advanced Computing Power: Featured 4th Gen Intel® Xeon® Scalable Processor to provide edge AI power computing power- High flexibility of PCIe configurations: Up to 5x PCIe x8 or 2x PCIe x16- 5G ready: Support 5G SIM card- Short-depth chassis design: Compact size 45cm only- Applications: Manufacturing-AI AOI, Telecom-AI RAN,Healthcare-CT/MRI/X-Ray image re-con, analysis, Broadcasting-- Digital transcoding
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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6TL22 Off-Line Testing Platform
H71002200
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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VR/AR/MR Calibration Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
