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RF Probes
Coaxial Probes are said to offer repeatable performance up to 3 GHz in custom or standard configurations.
See Also: Test Probes
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SMART III RF Probe
Finna Sensors’ Smart III RF Moisture Probe is appropriate in those situations where NIR use on conveying systems/web applications or RF flat plate sensor use on board type products are not sufficient. Examples include tanks, bins, barrels, drums, Super Sacks™, silos, etc. These applications require a probe type moisture meter where the probe is inserted into, and is surrounded by product. Since the probe generates a 3 inch diameter radio frequency field around the length of the probe, a significant volume of product is measured. As the product is slowly removed from the silo, and refilled from the top, it passes by the RF Probe, thereby providing a constant real time moisture measurement. Typical applications would include starches, distillers and brewers grains, granulated chemicals or food ingredients, whole grains such as corn kernels, rice, soybeans, tree nut stockpiles, etc.
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Precision Picoprobe™ Micropositioner Probe Holder Kit
PHD-3001A
High Power Pulse Instruments GmbH
*Pulse force and pulse sense fixed pitch and flexible pitch RF probing solution for TLP/VF-TLP/HMM on-wafer measurements using Picoprobe™ Model 10*High peak current capability 80 A (100 ns)*DC – typ. 7 GHz bandwidth*Isolated probe-head ground shield for high pulse sense common mode signal rejection*Including fixed pitch replacement probe tip 50 Ω, right, 100 µm pad pitch*Including fixed pitch replacement probe tip 5 kΩ, left, 100 µm pad pitch*Including flexible pitch clamps plus 10-5k(0502)-125-W-1 and 10-50/30-125-W-1 replacement probe tips*True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment
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PCB Connectors
Smiths Interconnect offers a broad range PCB connectors for harsh environments. A wide choice of configurations and terminations of signal, power, high speed, RF contacts and spring probes solutions.
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Compact Monitoring Probe
ISDB-T/Tb
Network operators:automate the tests of new transmittertemporary monitoring/investigation toolrebroadcasting receiver: RF to ASI or IPBroadcasters: off-air monitoring probe to validate the on-air contentTV/STB producers: automated tests against a professional receiverLabs: easy & simple access to live DTV sources via RF
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Probe Cards
Ceramic Blades
SV TCL offers a variety of ceramic blades and blade probe cards. We have patented ceramic microstrip blade probes available in low leakage and low capacitance for optimal signal transference, while SV TCL's blade cards are ideal for parametric and RF testing.
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RF Power Generators
MKS RF Power Generators provide reliable solid state power for thin films processing equipment. They are vital components of semiconductor fabrication systems, which produce the integrated circuits (ICs) or chips required by modern computers and electronic equipment. MKS RF Generators, combined with our Impedance Matching Network and our V/I Probe form a complete RF Delivery System.
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Microwave Probes
S-Probe
S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
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RF Voltmeter
9240
The 9240 series is the latest addition to Boonton’s popular 9200 series of RF voltmeters. It combines accuracy, smart probes, and operator features that have never before been available in its price range. It is simple to use on the bench, and comprehensive enough to integrate into an ATE system.
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Near Field Probes 30 MHz up to 3 GHz
RF2 set
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Deep Access RF Probes
GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Complete Probe Station
BD Series
Best for DC and RF probing, the platen lift is designed for smooth raise and contact of your probes simultaneously to your device. It is ideal for probing multiple spots on your device, or through multiple devices.
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Testing Services
Howland & Lawrence Chamber Services
RF shield testing: IEEE-299, MIL-STD-285, NSA 65-6CTIA CATL certification testing: Probe symmetry and amplitude ripple measurements following Test Plan for Wireless Device Over-the-Air PerformanceAnechoic material test, inspection, remediation: VSWR, inverse spherical nearfield testing of installed material and NRL arch screening tests of individual absorber pieces We can also provide in-process testing of welded steel shielded enclosures with a test technique based on ASME BPVC vacuum box testing—confirm quality of RF welds before the shield envelope is complete. We developed this method for testing the Navy’s Advanced System Integration Lab (ASIL) chamber at Patuxent River, shaving weeks off the construction/testing schedule.
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Bulk Current Monitoring Probe
MP-50
The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
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RF High Frequency Probes
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
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Nano Technology Products
We are instrumental in offering quality range of nano technology products that find application in defense research and development organization. Our range encompasses probe station, microscope, extension cable, adopter and RF probing, and vibration isolation products. We have the ability and resources to design products in line with the exact specifications provided by the clients.
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RF Capacitance Level Switches
ABB's RF Capacitance level switches feature one-step external calibration, immunity to material build-up, and a wide selection of probes for even the most challenging applications from low dielectric bulk solids to sticky slurries.
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
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RealProbe RF Probes
Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
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TEM Cells
Transverse Electro Magnetic (TEM) cell or Crawford cell (named after its inventor) is used to generate accurate electromagnetic waves over a wide frequency range: DC (0 Hz) to GHz., EM waves generated in the cell propagate in transverse mode and have the same characteristics as a plane wave. It can be used to calibrate E-field broadband probes for testing radiated E-field immunity as well as for measuring radiated emission from a product with a spectrum analyzer/EMI receiver.TEM cell generates a consistent electromagnetic field for testing small RF devices such as wireless pagers, receivers, portable phones, etc.
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Enhanced Probe Station
EB Series
Comprehensive prober for DC and RF. The EB series contains features to step-up your usability to acquire the accurate data you need from your devices. It has a built in probe card slot.
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High-Frequency Probe, 300 kHz to 3 GHz
85024A
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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EMCTD Broadband RF Safety Systems
The EMCTD analog Smart Fieldmeter® is easy to read and to operate. The EMCTD broadband electromagnetic probe covers the 0.2 to 3000 MHz spectrum where most common industrial, communications, medical and government RF emitters are found. The ANGPE-3000 system enables checking of home, office, and workplace RF levels. The system is designed to conveniently measure RF levels around WiFi access points, RFID systems and rooftop antennas; to find transmitter cabinet radiation, locate transmission line leaks, to identify non-radiating antenna elements, and much more. With the supplied NIST-traceable calibration, this system supports laboratory testing of RF devices in compliance with present EMC and RF safety standards.
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Snap-on RF Current Monitoring Probe
TBCP2-250
The TBCP2-250 is a snap-on RF current monitoring probe. The probe has a very flat response with a 3dB bandwidth of 250 MHz and is characterized over the frequency range from 30kHz to 300 MHz. Upon request, it can also be supplied with a test protocol covering the frequency range 1 kHz to 350 MHz. The aperture of the RF current monitoring probe is 32 mm. Its transfer impedance is > 12 dB Ohm in the range from 700 kHz to 300 MHz.
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EMC Probes
The Beehive Electronics 100 series EMC probes allow the accurate measurement of magnetic and electric fields. They are useful for EMC troubleshooting, field strength measurement, and troubleshooting of RF circuits.
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Mini Probe Station
C-2
The smallest probe station which still preserves the key functions and precision that are fundamental to all probing. This size is still capable of DC and RF measurements, making it the most versatile in its size.
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RF Coaxial Probes & Probe Positioner
Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
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RF Test Probes
With over 50 Tip-Styles, you can be certain we can help you find the right solution for your testing demands. And if we don’t offer a probe solution already in production, we will work together with you to develop a custom solution.
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Probe Head
cViper
cViper™ is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.
