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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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ITA, ICon, With Protective Cover
410123101
The iCon ITAs small width and inboard handle allow for easy side-to-side stackability. The u-shaped cable clamp allows modules to be pre-wired before assembly and offers a maximum cable bundle diameter of 1.21". The slide-off cover allows easy access to wiring for maintenance and probing.
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Custom PCB Test Fixtures
Emergent Electro-Mechanical designs and manufactures customized test fixtures and burn-in racks. Each of our custom designs is unique to our customer's particular project requirements. Emergent fixtures feature innovative design components including a linear collapsing system, interchangeable and reusable plate design, and top and bottom probing.
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Grypper
Grypper
*Package-size PCB footprint: Since the PCB footprint of Grypper is identical to or smaller than the IC package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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Microwave Testing
120
The MODEL 120 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 120 Picoprobe®, achieves an insertion loss of less than 1.75 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Stack Probing Sensor
L722
The Model L722 Stack Probing Sensor coupled with the L612 Digital Recording Moisture Meter makes it easy to reach deep into stickered units of lumber and take accurate moisture readings without the danger of broken pins. Wagner''s electromagnetic wave technology makes it possible to take multiple readings throughout an entire stack in just minutes.
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Probe System
Acculogic FLS 980 Dxi
Flying Probe systems do not require test fixtures, have few restrictions on board access and can test boards with a virtually unlimited number of networks. They also allow developers to complete test programs in a short time.The FLS980 Dxi guarantees superior probing precision and repeatability, even as component sizes and denser packaging technologies pose challenges to other test engineers.
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DDR4 X4/x8 BGA Interposer For Logic Analyzer, Connects To 61-pin ZIF
W4643A
The W4643A DDR4 2-wing BGA interposer for DDR4 x4/x8 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A. The W4643A is the smallest BGA interposers for DDR4 x4/x8 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding 3.2 Gb/s. U4208A and U4209A probe/cables connect any W4640A Series DDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W4640A Series BGA interposer wings.
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Precision Picoprobe™ Micropositioner Probe Holder Kit
PHD-3001A
High Power Pulse Instruments GmbH
*Pulse force and pulse sense fixed pitch and flexible pitch RF probing solution for TLP/VF-TLP/HMM on-wafer measurements using Picoprobe™ Model 10*High peak current capability 80 A (100 ns)*DC – typ. 7 GHz bandwidth*Isolated probe-head ground shield for high pulse sense common mode signal rejection*Including fixed pitch replacement probe tip 50 Ω, right, 100 µm pad pitch*Including fixed pitch replacement probe tip 5 kΩ, left, 100 µm pad pitch*Including flexible pitch clamps plus 10-5k(0502)-125-W-1 and 10-50/30-125-W-1 replacement probe tips*True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment
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Video Sensing Device
VideoStik VSS1
VideoStik is the latest addition to the successful Ranger series of CCTV test equipment from NG systems. This low-cost, battery-operated video sensing device will detect the presence of standard 1v p to p video by simply probing the BNC terminated cable.
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WaveMaster Oscilloscope, 8 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 808Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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Manual Probearm for HBM and Flex-Pitch Applications
TPA-GFM
High Power Pulse Instruments GmbH
*Electrically isolated probearm for GND needle contact or general purpose DC, twin-wire HBM or flexible pitch VF-TLP/TLP/HMM/HBM force/sense probing based on the HPPI GF-A flexible pitch setup.*Suitable to mount the GF-A ground fixture needle for flexible pitch measurements. In addition a cable (e.g. for HBM) can be directly connected to the contact pin.*High stability
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4 Channels DC Power Data Acquisition Device
NuDC-4U
NuDC-4U is an innovative product that provides better solution for power probing. Common DC power statistics including voltage, ampere and even the watt can be read instantly via NuDC-4U. Moreover, up to 4 sets of individual powers can be monitored simultaneously and the LCD screen can also display the maximum and minimum value of the current power during the test.
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Active Voltage Probes
Engineers must commonly probe high-frequency signals with high signal fidelity. Typical passive probes with high input R and C provide good response at lower frequencies, but inappropriately load the circuit, and distort signals, at higher frequencies. Active voltage probes feature both high input R and low input C to reduce circuit loading across the entire probe/oscilloscope bandwidth. With low circuit loading, and a form factor that allows probing in confined areas, the active voltage probe becomes the everyday probe for all different types of signals and connection points.
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Microwave Testing
500B
The Model 500B Picoprobe sets new® standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 500B Picoprobe achieves an insertion loss of less than 4.0 db and a return loss of greater than 15 db over its frequency range (see accompanying data).
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Magnetic Probing Systems
MPS-C-300 and MPS-C-350
MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Micropositioner
Our broad range of micropositioners fill requirements for probing for different measurement applications as well as measurement environments. For example, a measurement system focused on cryogenic environments would not use the same product for room temperature probing. Likewise, a DC micropositioner is unfit for mmW measurement applications.
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Microscopes
Probing Solutions offers Microscopes made by Azoom, Excelitas, Meiji, Leica, Mitutoyo, and Motic. To order Microscopes, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
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Active Probe, 2 GHz
N2796A
The N2796A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±12 V), the probe can be used in a wide variety of applications.
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ITA, I1, With Protective Cover
410128101
The i1 ITA's small width and inboard handle increase the side to side stackability. The U-shaped cable clamp allows modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 1.07 in. The removable cover allows easy access to wiring for maintenance and probing. Protective Cover included.
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ITA, I2 Micro ICon, 120/12 Position Hybrid
410130104
The i2 Micro iCon ITA is capable of holding up to 120 QuadraPaddle contacts and up to 12 Micro Power or Micro Coax contacts. Its sleek, 0.8” footprint increases the horizontal stackability. The 30 degree U-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 0.77 in. The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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CAM/GATE Test Kits
The Camgate ™ series test fixtures provide ‘Z’ axis motion and, with the optional floating top plate, makes this series ideal for top side probing. The floating push plate is accurately registered with two tooling/guide pins. The top plate mounting frame is adjustable in .500″ (12.7mm) increments to accommodate top side probing in the lower position, or clearance for PCA’s with tall components in the middle or top position, without the need for riser blocks. Camgate fixtures are available with the most widely used interfaces in the test industry.
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DDR5 Protocol Debug And Analysis Solution
U4970A
The DDR5 solution bundle provides a systemized hardware, probing, and software solution for DDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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WaveMaster Oscilloscope, 4 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 804Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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TTL/I2C/SPI* Expansion Kit
OP-SB5GL
OP-SB5GL is the interface expansion kit that has a port to measure RS-232C(V.24) and a port to measure the TTL / CMOS signal level communications. The port for TTL / CMOS supports the measurement of TTL / CMOS level communications that power supply system is from 1.8V to 5V. It is suitable for monitoring the communications between the LSI and the interface IC on the printed circuit board by directly probing into the lines. It supports the protocol of not only UART and HDLC but also I2C and SPI* on monitoring and simulating.
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16 GHz Differential Probe with ProLink Interface
DH16-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Wide Band Gap Production System
Reedholm has configured an integrated system, not just a set of boxes, for testing high power devices at the wafer level. Sophisticated testing, prober control, and database management do not carry a programming burden. As a result, fast, automated wafer testing is done in an inexpensive, compact probing platform.
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Mercury Probes
Materials Development Corporation
MERCURY PROBES are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.
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Machine Tool Probes and Software
Probing is an established best practice for maximising the efficiency, quality, capability and accuracy of machine tools. Standard routines built into modern CNC controls simplify the integration of probing cycles into machining operations and offline tools. These routines, combined with a CAD interface, make the simulation of measurement functions easy.
