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Incircuit
See Also: In-circuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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RealProbe RF Probes
Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
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ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2-228X (Large IF) / 230532
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Spring Probes & Hyperboloid Contacts
In-Circuit / Functional Probes, Socketless X Probes®, High Current Probes, Double Ended Probes, ATE Interface Probes, integraMate®
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Atlas ESR PLUS - Equivalent Series Resistance Meter
ESR70
The Atlas ESR provides instant measurement of a capacitor's ESR and it's capacitance value. Using the supplied gold plated probes (removable), the Atlas ESR can measure ESR down to a resolution of 0.01 ohms, up to 40 ohms. It can even measure ESR for capacitors that are in-circuit. Measurements are made at the industry standard frequency of 100kHz. Probes are now removable, allowing 2mm compatible probes to be fitted. Audible alerts are produced for various ESR levels allowing you to perform many tests in succession without having to look at the display.
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TestStation Automated Inline Handler | In-Circuit Test Solution
Teradyne’s High-Speed Inline Automated Board Handler with TestStation Multi-Site Test Insert is designed for productivity, fast change-over, and low operating cost. Our in-circuit test solution fits seamlessly into automated production lines to provide “hands-off-lights-out” operation.
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PXI FlexRay Digitizer
PXD7113
Digitize high resolution waveforms with the fully isolated PXD series Digitizers. Minimize interference and measure "in-circuit". Measurement errors are reduced by a high input impedance.
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Actuation Methods for In-Circuit Test Fixtures
Commonly referred to as In-Circuit Test (ICT), loaded board test can be defined as the task of measuring values of components that have been installed on a printed circuit board (PCB). A second basic category of loaded board test measures simple open and shorts on the board to verify manufacturability standards. Circuit Check supports all forms of in-circuit test strategies with its Performance Grade and Value Line test fixtures.
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Flying Probe Tester
Condor MTS 505
Primarily the Flying Probe Tester was developed to enable In-Circuit testing (ICT) of prototype PCBs. For testing a new design an existing fixture has to be changed or a new fixture has to be procured. The fixtureless design of the MTS 505 Condor is one of its most attractive properties, where the unnecessary and costly time delays incurred for fixture build or changes can be avoided. It is the ideal platform for testing prototypes.
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ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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ICT/FCT-Fixtures (Large IF)
GenRad CK-2-228X
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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In-Circuit Testing
If you are looking for in-circuit test applications, equipment or advice, our experienced engineers can help you. Whatever your fixturing requirements or special software features, our long history of work in this field means that we have probably seen and done it before.
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Acculogic Scorpion
ICT 7000
Accologic's Scorpion family of In-Circuit testers are feature rich and flexible, created with a consideration for cost effective testing.Systems are designed to allow for evolving test requirements by including the facility for future modular expansion with a broad array of innovative, patented expansion options.
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Tooling And Fixturing
Control develops and supplies fixtures and test accessories :*For a vast field of applications - ICT (In-Circuit Test), functional test, Flash programming, EoL (End-of-Line) test systems, etc.*For all handling systems currently used in the market: online or offline, mechanical, pneumatic or vacuum operation*From simple mechanical fixtures, with a few hundred probes and low production volumes, to highly complex accessories with thousands of probes, double-sided probes, double acting, etc.
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Turn-Key Functional / Mechanical Fixture
In addition to In-circuit testing, functional testing is widely used in the industry to verify electronic cards. This is why ReMaTek has always paid a special attention to the specific requirements of functional testing. Our dedicated engineering staff is prepared to handle all of your mechanical, electrical and software requirements. We are aiming particularly the small turn-key test systems where all the elements; the mechanical fixture, the test equipment and the test software, are put together in a complete system.
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Active Differential Probe, 100 kHz to 12 GHz
U1818B
The Keysight U1818B 100 kHz to 12 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818B allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
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In-Circuit Tester
Sigma MTS300
The system is designed for high throughput; with up to 1,000 analog measurements per second it is one of the fastest test systems available on the market. Sigma test systems provide analog and digital In-Circuit Test capabilities, Vectorless Testing, Functional Test, Boundary Scan and On-Board Programming.
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68HC(S)12 In-Circuit Debugger
ICD12Z
P&E's ICD12Z for Windows is a powerful tool for debugging code. It uses the HC(S)12 processor's background debug mode (BDM), via one of P&E's hardware interfaces, to give the user access to all on-chip resources.
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Microprocessor Development System
DS-85
* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
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Topside Probing In-Circuit Test Fixtures
Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.Today’s fifth generation Pneumatic drive supports as many as 8,000 test probes with centerline spacing to 25mil, and contacting test pads as small as 0.014″.
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I3070 In-Circuit Test System Software
Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.
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PXI Based Multifunction Measurement and ICT Instrument
PXI-501
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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4-Port In-System Programmer For Zilog
MPQ-Z8
Supports Zilog Z8 Encore, Encore XP, Zneo and Crimzon device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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In-Circuit Test Systems
Keysight offers leading board test solutions for electronics manufacturers to tackle a wide range of PCBA test access and coverage issues for today's complex printed circuit assemblies.
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PCB Test System
Circuit Wizard - CW409
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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In-Circuit Debugger for RS08 Family of Microcontrollers
ICDRS08
P&E's ICDRS08 is a powerful tool for debugging code. It uses the processor's background debug mode Module(BDM), via any of P&E's RS08 compatible interfaces (see product add-ons for more information), to give the user access to all on-chip resources.
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In-System Programming (ISP)
Modern assemblies today usually require on-board or in-system programming. The in-system programming (ISP) on the in-circuit test adapter represents the ideal solution for optimizing processes in ongoing electronics production.
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In-System Programmer for AVR
MPQ-AVR
Supports Atmel AT90, ATtiny, ATmega, ATxmega device families Supports JTAG, SPI and PDI programming interfaces Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
