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IC Test
See Also: IC, Digital IC Testers, IC Clips, IC Probes, IC Test Systems
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IC Test Services
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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High Current IC Test
C.C.P. Contact Probes Co., LTD.
Our patented probe design allows very high currents of up to 5 Amps
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Automatic System Function Tester
3240
Chroma 3240 is an innovative handler for high-volume multi-site IC testing at the system level.
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IC Test Clips
Low-profile fine-pitch chips, desnely populated boards, or vertical boards, Pomona test clips connect you with confidence.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Manual Switch Boxes
RTI's manual switch box is a portable and versatile test solution for quick IC electrical verification tests. RTI's 96-pin manual switch boxes integrate with a variety of test configurations that are customized to your test and device needs. It requires no software and connects directly to an external power supply for bias test, and performs quick comparison tests using an A/B relay box.
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Analog IC test system
A paradigm shift has been occurred in Japan’s major brand WL25 series tester. Ultimate simple system is available by effective analog pin architecture.This cost performance system is covered analog IC extensively, which are high accuracy, speed and multi-site test function.
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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High-Density Precision SMU (100 PA, 30 V)
PZ2130A
The Keysight PZ2130A is a high-channel density precision source / measure unit (SMU) with 5 channels per module that saves space at a low cost per channel for a wide range of applications requiring numerous precision power supplies. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2130A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2130A suitable for noise sensitive applications such as quantum computing as well.
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InCarrier Loader/Unloader
NY32-LU
NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.
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IC Tester
ICE1
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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IC Testing System
Is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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IC Pick & Place Handlers
Chroma's IC test and handler solutions assure that IC packaging meets the original design specifications and verify the performance of the IC before it is assembled into the electronic product.
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Strainer-Recorder
To ensure reliable operation of the measuring complex in the harsh conditions of ice tests, it is based on the industrial measuring platform NI CompactRIO, which provides mechanical strength and operation at negative temperatures.The system provides for operation both under the guidance of an operator with displaying the voltages removed from the ship's hull in the form of graphs on a computer screen connected to the strain gauge station via an Ethernet line, and in stand-alone mode, when the recording of a given duration is initiated by the station on pre-configured events: amplitude exceeding by one of channels, an external discrete signal or periodically at specified intervals.
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High-Density Precision SMU (10 PA, 30 V)
PZ2131A
The Keysight PZ2131A is a high-channel density precision source / measure unit (SMU) having 5 channels per module and saving space for a wide range of applications requiring numerous precision power supplies. The narrow-pulse function and fast Digitizer Mode allow the PZ2131A to expand the conventional static DC measurements to emerging dynamic measurements. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2131A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2131A suitable for noise-sensitive applications such as quantum computing as well.
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Tri-Temp Octal Sites Handler
3160-C
Chroma 3160-C is a productive pick & place system for high volume multi-site IC testing.
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50 MHz 32-CH High-Speed Digital I/O Card
PCIe-7350
ADLINK's PCIe-7350 is the advanced version of hot-selling PCI/PCIe-7300A featuring high-speed digital I/O with 32-channel bi-direction parallel I/O lines. The data rate can achieve up to 200 MB/s through the x1 PCI ExpressR interface. The clock rate can support up to 50 MHz internal clock or 100 MHz external clock, which is ideal for the applications of high-speed and large-scale digital data acquisition or exchange, such as digital image capture, video playback and IC testing.
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Automatic System Function Tester
3260
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing at the system level.
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Microtester Test Systems
With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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Linear IC Tester
570A
The Model 570A Analog IC Tester's built-in test library includes all common Analog ICs including op-amps, comparators, voltage regulators, voltage references, analog switches & multiplexes, opto-isolators & couplers, and audio ICs.
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Design-for-Test And Semiconductor Data Analytics
Mentor’s comprehensive solution for IC test, including best-in-class design-for-test tools and test data analytics that help ensure the highest test coverage, accelerate yield ramp and improve the quality and reliability of manufactured parts.
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Pick And Place Test Handlers
Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.
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Full Range Active Thermal Control Handler
3110-FT
Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.
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Miniature IC Handler
3270
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing, especially for CIS Testing, at the system level.
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IC Test Probes
C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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High-Speed Precision SMU (100 FA, 60 V, 1 MSa/s)
PZ2120A
The Keysight PZ2120A is a cost-effective, high-speed precision source / measure unit (SMU) featuring best-in-class narrow pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices and integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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100 MHz 32-CH High-Speed Digital I/O Card
PCIe-7360
ADLINK's PCIe-7360 is a high-speed digital I/O board with 32-CH bi-directional parallel I/O lines. Data rate up to 400 MB/s is available through the x4 PCI Express® interface. Clock rate can support up to 100 MHz internal clock or 200 MHz external clock, ideally suiting applications of high-speed and large-scale digital data acquisition or exchange, such as digital image capture, video playback and IC testing.
