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High Precision Angular Positioning, Calibration and Geometry Inspection
LabStandard DUO
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.2 axis design for rotary tilting applications with self-locking worm gearing and a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
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Day Camera Testing
CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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Turbine Flowmeters
Titan’s small turbine flowmeter range use a radial flow principle based on the Pelton wheel technique. This well proven method is the ideal way of measuring low rates of flow of low viscosity liquids. For these mini flowmeters, a jet of fluid is directed at a turbine that is mounted on robust low friction sapphire bearings. The geometry of the turbine and the fluid chamber ensures that the rotational speed of the rotor is proportional to the flow rate through the device. The use of this radial arrangement allows more energy to be imparted into the turbine, so the bearing drag is far less important. Furthermore, because more energy is available the bearings themselves can be a lot stronger so increasing the life of the flowmeter. For larger flows, some of the liquid can bypass the turbine chamber, which then behaves as a “shunt” to the metered fluid. Accuracy is still maintained and the output remains linear.
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High Current Probes
*Low internal resistance to minimize arching*PogoPlus bias ball design*High current optimized base material and plating*Higher temperature spring design*Specialized high current tip geometry
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Non-Destructive Testing (NDT)
Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.
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Contactless Wafer Geometry Gauge
MX 20x series
The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
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Interferometer
VFI-200
The FGC range is the complete solution for measuring the dimensions of standard and specialty fiber in both production and R&D environments. FGC-GS – fiber glass geometry for fibers up to 1000 µm diameter.
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Accuscan XE200i
Rotary Precision Instruments UK Ltd
Fully understanding components geometry prior to assembly is critical when faced with the ever growing environmental pressures and increasing fuel prices. The significantly more reliable measurement data collected by AccuScan™ enables rotor stacking software to accurately manipulate component parts, resulting in precisely aligned rotor assemblies. AccuScan™ has been independently verified and proven to offer our customers significant operational improvements over their traditional measurement methods.
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Helmholtz Coils
Helmholtz-Coils are especially designed to generate precisely defined magnetic fields from DC to the upper end of the audio frequency range and beyond. The generated fields are in a strongly linear relation to the coil current. The field- strength can be calculated exactly by analytical (or numerical) methods, based on the coils' geometry, the number of turns and the coil current.
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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SANA Mini Portable Interferometer
CA3005
CA3005 SANA mini is a portable, non contact fiber endface interferometer for single fiber connector. This interferometer has a high performance while the size of the instrument is incredible small. SANA mini need only a USB link to work without any external power supplies. It can test the geometry parameters of single fiber connectors such as radius of curvature, apex offset and fiber height. The data and report are generated in excel format and it is very helpful for management and analysis. SANA mini is a suitable interferometer for field usage.
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Software to Simulate Large Area Semiconductor Devices
Laoss
Laoss is a powerful software to simulate large area semiconductor devices (OLED, thin-film PV), taking into account the voltage drop in the electrodes due to important resistive effects when the size of the device increases.Simulation of large area semiconductor devices (OLED, thin-film PV)Coupling law input: analytical or tabulated (experimental or simulated) IV curveDevice optimization (electrode material, device geometry etc...)High speed computation
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Integrating Sphere Solutions
An integrating sphere is a light collector which takes advantage of physical geometry to homogenize any radiation being emitted inside by relying on a high-reflectance coating material. Depending on the wavelength range the end user using a sphere with, different coatings have different advantages based on the application.
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3D Sensors (Main Screen)
surfaceCONTROL
surfaceCONTROL sensors are used for 3D measurements and surface inspections. The sensors use the fringe projection principle to detect diffuse reflecting surface and to generate a 3D point cloud. This point cloud is subsequently evaluated in order to recognize geometry, extremely small defects and discontinuities on the surface. Sensors with different measurement areas are available. This enables the inspection of the finest of structures on components as well as shape deviations on large-area attachments. Powerful software packages are available for evaluation and parameter setting.
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High Precision Angular Positioning, Calibration and Geometry INspection
LabStandard AIR
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.The LabStandardAIR has been designed as a “Contact Free” system and eliminates features, which may detract from achieving the optimum rotational performance. The rotating elements are supported on super high precision, air lubricated, hydrostaticbearings and are not subject to disturbances associated with gear drives.
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Rotman Lens Designer
Rotman Lens Designer (RLD) is a software tool for the design, synthesis, and analysis of Rotman Lenses and their variants. It is based on Geometrical Optics combined with the classical Rotman Lens design equations. It is intended for rapid development and analysis of Rotman Lenses given several physical and electrical input parameters. RLD generates the proper lens contours, transmission line geometry, absorptive port (dummy port) geometry, provides an approximate analysis of performance, and generates geometry files for import into Remcom's XFdtd® for further analysis and fabrication.
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WATOM
Wafer edge and notch profile measurementThe use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Automation has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.WATOM supports quality assurance throughout the wafer manufacturing process, starting at the very beginning and continuing on through to wafer reclaim.The WATOM Edge and Notch Wafer Geometry Analyser sets the worldwide benchmark for the quality assurance of geometrical measurements in semiconductor wafer manufacturing, combining the highest quality standards with top-class service. These high-precision, laser-based edge profile measurement tools are specially designed for optimum integration in manufacturing lines within the semiconductor industry.
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Wafer Sorter and Inspection
SolarWIS Platform
Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Checking the Geometry and the Placement of the Weld
Based on the real geometric three-dimensional profile of the weld (groove) on the outside of a large diameter pipe, determine the offset of the center of the weld (groove) from the weld line. Provide continuous output of results through the RS-232 interface to the welding process control system. Provide a graphical picture of the current profile, the values of the specified and calculated geometric parameters to the operator.
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Correlation Analysis
EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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LCD monitor
EZ3-4.5 (Triple LCD in 2U)
Murraypro was first to introduce the Triple 16:9 in 2U format. Designed for applications where 16:9 and 4:3 aspect pictures must be monitored with correct geometry, it will also be useful where picture quality is important too. EZ3-4.5 is ideal for compact and space limited applications, fitting within a 2U rack envelope and yet it is only 70mm deep.
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3D Motion and Deformation Sensor
ARAMIS
ARAMIS is a non-contact and material-independent measuring system based on digital image correlation (DIC). It offers a stable solution for full-field and point-based analyses of test objects of just a few millimeters up to structural components of several meters in size. The system performs high-precision measurements with a 3D image resolution in the submicrometer range, regardless of the specimen’s geometry and temperature. There is no need for a time-consuming and expensive preparation. For statically or dynamically loaded specimens and components, ARAMIS provides accurate
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Circular Helmholtz Coils
Helmholtz-Coils are especially designed to generate precisely defined magnetic fields from DC to the upper end of the audio frequency range and beyond. The generated fields are in a strongly linear relation to the coil current. The field- strength can be calculated exactly by analytical (or numerical) methods, based on the coils' geometry, the number of turns and the coil current.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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3D Scanner
Artec Space Spider
A new and enhanced precision instrument for CAD users and engineers, Artec Space Spider is a high-resolution 3D scanner based on blue light technology. It is perfect for capturing small objects or intricate details of large industrial objects in high resolution, with steadfast accuracy and brilliant color. The scanner’s ability to render complex geometry, sharp edges and thin ribs sets our technology apart. It is an ideal industrial 3D scanner for high resolution capturing of objects such as molding parts, PCBs, keys, coins or even a human ear, followed by the export of the final 3D model to CAD software.
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Multiphysics Simulator
The COMSOL Multiphysics simulation environment facilitatesall steps in the modeling process defining your geometry, specifying your physics, meshing, solving and then post-processing your results. Model set up is quick, thanks to a number of predefined modeling interfaces for applications ranging from fluid flow and heat transfer to structural mechanics and electromagnetic analyses.
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Vibration Analysis
The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
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3D/2.5D Time-Domain Electromagnetic Field Solver Software
EM-CORE ®
3D/2.5D Time-Domain Electromagnetic Field Solver Software for Planar-Circuit and Antenna Simulation. 3D & 2D Radiation Patterns Modeling, Spiral Inductors Modeling, 3D EM Modeling of Filters, Intuitive Geometry Build, and more!
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Plastic Optical Fiber Preform Analyzer
2600
The unique vertical design of the 2600 Preform Analyzer gives manufacturers of GIPOF the ability to perform completely automated analysis. Its' automated axial (longitudinal) and radial preform positioning facilitates rapid and precise analysis of the entire preform structure. From the acquired index profile, the 2600 is able to calculate geometry metrics such as preform core diameter, outside diameter and core/clad concentricity.
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SANA 2 Interferometer
CA3004
SANA 2 fiber endface interferometer is a type of cost-efficient non-contact test instrument with excellent performance. It is able to measure the fiber endface geometry parameters such as radius of curvature, apex offset, fbre height and polishing angle of APC connector.
