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Defect
other than specified, imperfection .
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Auto Macro Wafer Defect Inspection
EagleView
EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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High Speed Cable Production Tester
GRL-V-DI20
GRL-V-DI20 provides a fast and easy way for anyone to test cables for manufacturing defects and signal integrity specification requirements. GRL-V-DI20 provides comprehensive test coverage in seconds at a fraction of the cost of similarly-capable bench test equipment.
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Power Capacitor
POLB HD 7%
Lifasa - International Capacitors, SA
They are self-regenerating condensers with low loss polypropylene dielectric, filled with N2 inert gas mainly, or with resin, and with overpressure disconnection system, which offers a high level of safety against defects, when cutting the 3 phases in case of action.
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Ultrasonic Testing
Pundit 250 Array
The Pundit 250 Array brings a quantum leap in the ultrasonic pulse echo testing. A number of unique innovations make the Ultrasonic multi-channel instrument the best and fastest solution for thickness measurements, detecting defects and localizing objects which cannot be easily detected by any other technology. This includes the assessment of thick concrete elements such as tunnel linings as well as pipes and tendon ducts beyond the rebar layer.
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Data Warehouse and ETL Testing Services
Our principal goal is to catch defects (e.g., database design, source data, ETL process, data quality) early, to help reduce your costs and lower your risks.
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High-precision Surface Inspection for Wind Turbine Blades
waveCHECK™
8tree's waveCHECK is a handheld-portable 3D-inspection tool for inspecting wind turbine blades in manufacturing and operation. Its efficient detection of surface defects and instant visual feedback revolutionize surface inspection.It can detect wrinkles, steps, gaps, rain erosion and any other surface damage.
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3D Sensors (Main Screen)
surfaceCONTROL
surfaceCONTROL sensors are used for 3D measurements and surface inspections. The sensors use the fringe projection principle to detect diffuse reflecting surface and to generate a 3D point cloud. This point cloud is subsequently evaluated in order to recognize geometry, extremely small defects and discontinuities on the surface. Sensors with different measurement areas are available. This enables the inspection of the finest of structures on components as well as shape deviations on large-area attachments. Powerful software packages are available for evaluation and parameter setting.
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Flat Panel Display Test Solutions
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Semiconductor Inspection (SEMI)
A process for detecting any particles or defects in a wafer.
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Automated System for Visual Quality Control of Markings
Angara 2.0
The automated labeling quality control system is designed to identify and reject pharmaceutical labels that have defects in permanent printing (applied in a printing house) and variable printing (applied by an industrial printer as part of a labeling machine).
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Defect Inspection
With over 20 years of experience in defect inspection, microelectronics manufacturers around the world partner with us to improve yield by performing high-speed, automated inspection and then transforming the defect data into actionable process control with powerful analytical software.
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Portable PD Monitoring of Medium and High Voltage Power Equipment with UHF, AE, and HFCT
PDiagnosticM
Power Monitoring and Diagnostic Technology Ltd.
The PDiagnosticM is a portable system that utilizes UHF, AE, and HFCT sensor modules to monitor PD signals from Medium and High Voltage power equipment.The system is ideal for monitoring critical power assets to find and monitor intermittent PD signals and to analyze the developing PD trends. The PD type is determined by automatic pattern recognition and internal defects can be found at an early stage.The system provides advanced protection with alarm functions and our Deep Learning data analysis capabilities utilizing our proprietary Intelligent Cloud Diagnostic Technology.
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Solder Paste Inspection Machine
3D SPI
The 6500 series is the measurement equipment provided by Jiezhi Technology for the small pads of solder paste printed on the PCB board. It will cause defects such as sharpness, offset, more tin, and less tin printing during solder paste printing. Causes defects in the later stage of production, this equipment can find problems in advance
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Defect Inspection System
F30
The F30 System boasts a five-objective turret that enables the resolution-throughput flexibility required by today’s multi-process inspection applications. Equipped with an advanced productivity suite (waferless recipe creation, simultaneous FOUP, recipe server and tool matching), the F30 System redefines inspection cost of ownership expectations.
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Inspection System for Die Casting
X-eye 7000BS
Appropriate for medium•large size component inspection and detecting surface structure and defects(inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's reduced significantly and enables long-term use with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Front and Back Side Topography Defect Detection
LIGHTsEE
High throughputNanometer range vertical sensitivitySimultaneous double side inspectionNanotopography and Topography measurementDetection of Slip lines, particles, Hairline cracks, SOI voids, Comets, EPI defects…Compliant with thin or thick wafers, taiko wafers, highly warped wafers
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Metal InspectionSystems
Metal surfaces must undergo a reliable inspection, because defects impair the functions of steel tubes or medical engineering products. Relying to the often appearing strong structures of such surfaces, special robust vision techniques are needed to make, for example, geometric measurements. Our systems are prepared to provide a fully automated, 100 % inspection rate in a rough industrial environment.
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Translating process images into significant tool-defect reduction
Trans-Imager
Real-time, tool-specific defectivity data. Now there is a way to monitor defectivity on individual processing tools – automatically – in real-time. Microtronic’s new Trans-Imager software module is able to take high-resolution images directly from your processing equipment and immediately detect and displaymacro wafer defects – transferring all of that information into our powerful and long-proven ProcessGuard software which provides a wealth of defect management and analysis. This new capability is called ProcessGuard Xtensis (PGX) because it extends the power of ProcessGuard software to fab tools that previously had no way to detect defects. This provides an important new stream of defect data.
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Mini Visual Laser Source
TM536 Series
TM536 Series Mini Visual Laser Source totally complies with the human engineering. It's small in size, easy to operate, portable and integrated with a launching indicator. A Visual Laser Source is usually used to inspect the damaged or broken point of a optical fiber, cable, patchcord and etc.If the inspected fiber does have a defect, user could find the visual laser at the broken or damaged point. TM536 Series Mini Visual Laser Source is suitable for both single mode and multimode fibers. The performance of the visual laser source will act a little different on different fiber coat and color.
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Ultrasonic Immersion Probes
SONOSCAN I
The SONOSCAN immersion transducers for Non-destructive Testing (NDT) are mainly used to test metals and plastics for the smallest material defects. For example, binding defects, welding defects or cracks and pores in metal parts can be detected. The powerful, robust ultrasonic probes can be connected to all common ultrasonic testing devices. Due to variable designs and sizes, the immersion probes guarantee optimal use. In addition to ultrasonic standard pobes, we also offer customized transducers according to your individual specifications.
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Agile Application Performance & Security Resilience Test Tool
Developer
Keysight Network Applications and Security
Ixia Developer is an agile application performance and security resilience test tool that helps developers find bugs early in the development cycle. Ixia Developer features an integrated debugger that helps locate the primary source of defects. An easy-to-use, fast, and responsive web-based user interface significantly reduces the time it takes to move from test configuration to actual packets on the network. And by leveraging a robust ATI engine, Ixia Developer always includes the most up-to-date apps and security strikes.
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High-Accuracy Automated Optical Inspection Systems
Fully-automated and high-accuracy 3D inspection and measurement systems. High-power, long working distance optics and high-resolution digital camera are perfect for high-magnification applications. These are full-color systems capable of high-accuracy measurements, automated defect detection and color verification.
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Permanent Monitoring
Real-time Ultrasound and Vibration data indicate changes in healthy function earlier in the P-F Curve than other condition monitoring technologies. Advanced warning allows every maintenance job to be planned while reducing levels of critical spares held in inventory. Reliability teams benefit from a proactive culture that affords them time to eliminate defects rather than simply applying band-aids.
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Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Inspection System
X-eye 7000B
Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Partial Discharge Testing Equipment
PD-Analyser
This is an ‘All in One’ solution for testing and analysing partial discharges in the insulation of high-voltage transformers, cables, GIS and electric machines. The DIMRUS ‘PD Analyser’ help diagnose their insulation state and find any type of defects very effectively.It can be used for temporary or constant monitoring of partial discharge in medium and high voltage systems and cables of any rated voltage.The PD Analyser is the most useful device for condition estimation of high-voltage insulation. This multipurpose device is designed for -Partial discharge measuring in high-voltage insulation at a high noise level.Fast detecting of the defects in different high-voltage equipment and identifying how dangerous they are.
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Manufacturing Defects Analyzer
eloZ1-400
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1-400 is the compact version of the eloZ1. It is particularly suitable if there is only limited space to fit test appliances. The eloZ1-400 can also be used as a mobile test system.
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Pre-reflow AOI
Zenith LiTE
Minimizes Shadow Problems with 4way projectionEasy Programming with parametric approachReal time defect diagnosis and root cause removalrortified 2D features using 9 channel RGB lights100% 3D measurement inspection.
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Manufacturing Defects Analyzer (MDA)
TR518 SII DRAWER
*The DRAWER Type is the new Manufacturing Defect *Analyzer (MDA) platform.
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Dual Voltage Detector / Maintenance Tester
MicroPhase I
Hachmann Innovative Elektronik
MicroPhase I is an easily operated phase comparator, dual voltage detector and maintenance tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-testers warn against defect interfaces. The integrated "Universal Phase Comparator" compares two different interface signals, even if they are of different interface type or voltage. A unique error control avoids switching errors caused by erratic or unfeasible phase comparison.
