Filter Results By:
Products
Applications
Manufacturers
-
product
PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
-
product
Precision Low-Loss Multiplexers
Maury’s line of diplexers (DP-series) and triplexers (TP-series) are designed for applications which require combining/ splitting signals at or around harmonic frequencies (nFo) and are connectorized for design-in and test and measurement applications.DP-series diplexers are designed using low-pass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.TP-series triplexers are designed using low-pass, bandpass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.Power handling is rated at 100W CW (average) and typical insertion loss is better than 0.5dB between the low-pass (Fo) and common ports.DP- and TP-series multiplexers are ideal accessories for passive, active and hybrid-active multi-harmonic load pull systems.
-
product
Shield Boxes
Concentric Technology Solutions, Inc.
CTS can provide a customized integrated RF Shield Box or RF Enclosure Test Solution for manual or automatic testing at an off-the-shelf solution price. Many companies make RF Shield boxes, RF Enclosures or DUT fixtures, but only CTS bridges the gap by providing a complete integrated RF Shield Box or RF Enclosure testing solution for providing the RF shielding needed for repeatability within your budget and schedule.
-
product
Railway and Traffic Engineering Solutions
In the past, LXinstruments has already implemented a number of application-specific system solutions which cater for these special requirements. These solutions are often used to replace systems which have been in production for many decades. Our systems are not only employed for testing signal box technology modules, but also for testing train control system which are installed in the track bed. Due to the strong magnetic fields which occur at the DUT in combination with high voltages, the test systems require specific technical safeguards.
-
product
Mass Interconnect
Mass interconnect is a way of connecting test instrumentation to a device under test (DUT). To put it simply, mass interconnect is a very large plug and socket which connects your device under test to your test instrumentation without the mess and hassle of having to connect each signal separately.
-
product
DC Power Module, 60V, 5A, 300W
N6775A
The Keysight N6775A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
-
product
Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
-
product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
-
product
4 x 8 Two-Wire Matrix Module for 34970A/34972A
34904A
The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
-
product
Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
-
product
SNS Series Noise Source 10 MHz to 26.5 GHz (ENR 15 dB)
N4002A
The SNS series N4002A noise source was designed to measure DUT noise figures reliably and accurately up to 30 dB from 10 MHz to 26.5 GHz.
-
product
Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
-
product
Load Simulator
The load system is intended for testing satellite power supply systems; due to the integration with a solar array simulator and a battery simulator, it can perform validation and commissioning of satellite power supplies. The system is equipped with regenerative electronic loads and customer-specific high-power switching matrices for routing the DUT channels to the relevant loads. The individual voltages and currents for each channel can be read back via a Keysight Technologies switch mainframe.The system is equipped with high electrical power; its loads are capable of feeding the energy back into the power grid.
-
product
Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
-
product
Active Probe, 2 GHz
N2796A
The N2796A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±12 V), the probe can be used in a wide variety of applications.
-
product
60 GHz Noise Figure Test Set
The Noisecom 60 GHz Noise Figure test set has 4 separate systems designed to perform Y-factor noise figure measurements using a high performance Spectrum Analyzer or a dedicated receiver. Each system contains a highly stable V-band noise source, isolator(s), optional waveguide to coaxial transitions and an optional pre-amplifier for use with a spectrum analyzer. The two standard calibration tables have ENR data points at 1 GHz intervals.* System ENR is measured before the DUT connector and at the final output stage allowing for pre-test calibration of the system.
-
product
CTL503
The CTL503 Curve Tracer is a low-cost transistor (BJT and FET) computer controller curve tracer. Unlike other simple curve tracing units the CTL503 is designed to measure devices to 100V and upto 3A. Four collector resistors (relay selected) allow the user to test the smallest of BJT’s and FET’s as well as extracting meaningful curves from larger TO3/TO247 packaged devices. Limits on both peak test voltage and peak test current can be easily set to prevent exceeding device parameters.Pulse testing (80us/300us) is used to minimise device heating and to ensure the CTL503 can be powered via USB. This may be disabled for smaller parts.Connected and powered via USB and running our own free software the CTL503 is easily configured using a built in wizard (for quick results), or the user can adjust every instrument parameter to suit. Works with EPIC 21.010 and above.Users can save data from runs, as well simply grab images directly from EPIC.Connections are made to the DUT (device-under-test) with the built-in colour coded test leads with crocodile clips.
-
product
Optical Spectrum Analyzer Module
OSAPXIe
OSAPXIe enables new measurement capabilities in PXI for truly effective mixed-signal testing. Conduct all your DUT characterization from one platform and spend less time switching cables and patchcords between instruments.
-
product
Network Analyzer Test Setup Assistant (NTSA)
S94605B
Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
-
product
6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
-
product
Nonlinear Pulse-Envelope Domain
S94518B
The S94518B Nonlinear Pulse-Envelope Domain measures the vector corrected amplitude and phase of the fundamental and harmonic pulse envelopes of your DUT.
-
product
DC Power Analyzer, Modular, 600 W, 4 Slots
N6705C
The N6705C DC Power Analyzer provides unrivaled productivity gains for sourcing and measuring DC voltage and current into the DUT by integrating up to 4 advanced power supplies with DMM, Scope, Arb, and Data Logger features. The N6705C eliminates the need to gather multiple pieces of equipment and create complex test setups including transducers (such as current probes and shunts) to measure current into your DUT. The DC Power Analyzer also eliminates the need to develop and debug programs to control a collection of instruments and take useful measurements because all functions and measurements are available at the front panel. For even greater control and analysis functions, the DC Power Analyzer can be used with the 14585A Control and Analysis Software. When automated bench setups are required, the N6705C is fully programmable over GPIB, USB, LAN and is LXI Compliant. 14585A Control and Analysis Software
-
product
P-Series Dual Channel Power Meter
N1912A
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
-
product
Spring Probes
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
-
product
DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
-
product
Vibration Testing
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
-
product
Graphical Waveform Editor and Instrument
PI-PAT
Much more than just a visualization tool, PI-PAT is a full-fledged graphical waveform editor that allows you to spend more time testing and less time programming. PI-PAT doesn't require any programming experience or complicated syntax. Just draw or type patterns directly into the pattern window. Move a clock edge by dragging it. Adjust integration times by entering a single number. Change the output to your DUT by clicking the Update button. You'll never have to wrangle DSP or FPGA code with PI-PAT.
-
product
4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A Or ±6 V, ±3 A, 20 W
N6784A
The Keysight N6784A is a source/measure unit (SMU) designed for general-purpose precision sourcing and measurement. General-purpose applications can span many different industries and many different devices under test (DUTs). The N6784A SMU is a versatile tool designed to tackle many of these general-purpose applications. Its glitch-free operation ensures safe usage with the DUT during output and measurement range changes, even with capacitances of up to 150 µF. Its 4-quadrant operation enables it to act as a bipolar power supply or a bipolar electronic load, for added versatility. When using the N6784A SMU, engineers can be confident that they have an all-around general-purpose tool for their test systems or lab bench.
-
product
High Performance Autoranging DC Power Module, 50V, 5A, 50W
N6751A
The Keysight N6751A is a 50 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
-
product
Vibration Shakers
Vibration Shakers and Modal ExcitersFull range of modal and inertial shakers with integrated and easy-to-use amplifiers. Our permanent magnet shakers are compact, lightweight, and powerful general-purpose shakers that can be used for modal and vibration testing. They have a high DUT capacity despite their small sizes.
