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DDR
Double Data Rate memory achieved by reading both the rising and falling edge of clock.
See Also: Memory, Memory Test, NAND, DRAM, Memory Device, DDR4
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8 GHz Differential Probe with ProLink Interface
DH08-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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PCIe-SpaceWire
PCIe-SpaceWire implements SpaceWire in a convenient PCIe format. Four fully independent and highly programmable LVDS IO ports are provided by the PCIe-SpaceWire design. The SpaceWire protocol is advanced with link testing, error handling, command and data protocols built in. The SpaceWire electrical interface is point-to-point with token based flow control. Now with DDR memory for 32 Mbytes per port [256 MB total]
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3.5" Embedded SBC With AMD LX800, Dual LANs, 4 COM, 4 USB 2.0 And VGA/LVDS/TTL
SBC84622
The SBC84622 supports an onboard low power AMD LX800 500 MHz processor with the AMD Geode CS5536 chipset. The flexible display function is supported by integrated graphics controller which allows users to configure both CRT and LVDS LCD or CRT and TTL LCD as simultaneous mode. Onboard one DDR SODIMM supports up to 1GB of system memory. Having such compact design with fanless operation, the SBC84622 can be applied in widely embedded and automation applications such as industrial automation, automation control, telecommunication, and process control.
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13 GHz Differential Probe with ProLink Interface
DH13-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Training Board
JT 2156
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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DH Series High-Temperature Solder-In Tip, 16 GHz BW, 3.5 Vpp Range
DH-HITEMP
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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16 GHz Differential Probe with ProLink Interface
DH16-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Component Testers
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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DDR
These sockets are designed for standard DDR & GDDR type devices, including the newer configurations.
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DH Series QuickLink Adapter, 8 GHz BW
DH-QL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Talon RTX Small Form Factor Offload System
Talon RTS 2580
- The Talon® QuickPac® drive can be removed from a Talon RTX - SFF recorder and inserted in this offload system- Allows the Talon recorder to remain deployed in the field- Data stored on the QuickPac drive can be accessed and offloaded for analysis- Designed for Talon models RTX 2586, 2589, 2590, 2596, and 2684- Can offload data to removable SATA drives, DVD, Ethernet and USB ports- 4U 17-inch PC server chassis, 21 inches deep- Windows® workstation- Intel® processor- 8 GB DDR SDRAMSystemFlow® Software
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Power Supply ICs For R-Car
R2A11301FT is a single-chip system power supply for CPU core and DDR (DDR2 and DDR3).
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20 GHz Differential Probe with ProLink Interface
DH20-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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IDM+
Multi-functional fault recorder including: -- Disturbance fault record (DFR)- Dynamic disturbance recording (DDR) - Phasor measurement unit (PMU C37-118)- Power Quality (PQ Class A)- Travelling wave fault location (TWS to +/-60m) - Impedance fault location- Protocols (61850, Modbus, DNP3) - Sequence of event recording (SOE)- GPS, IRIG and NTP time sync- iQ+ masterstation software.
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S.O. DIMM Converter
DDR 200-pin
The RAMCHECK DDR 200-Pin Converter is a perfect low-cost solution for testing modern laptop DDR memory. The converter plugs directly into the 184-pin RAMCHECK DDR main adapter, providing you with fast, convenient testing capabilities
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DDR Validation License Suite
SW00DDRV
The DDR Validation License Suite is part of the subscription based Oscilloscope Compliance Test Software Suites. This suite covers Tx Validation licenses for DDR with coverage across the DDR technology starting from DDR3. Together with the subscription model, this enables the support and coverage continuity as the DDR technology progresses through generations.
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QDRII/DDRII/ QDRII+/DDRII+ SRAM
DDR II / II+ (Double Data Rate) SRAMs and QDR^(TM) II / II+ (Quad Data Rate) SRAMs are the ideal memory devices for next generation networking and communications systems. These ultra-fast devices can support high bandwidth systems that require memories capable of very high operating frequencies combined with low latencies and full cycle utilization.
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Interface IP
Synopsys provides the industry’s broadest portfolio of complete, silicon-proven IP solutions, with leading power, performance, area, and security, for the most widely used interfaces such as PCI Express®, CXL, USB, Ethernet, DDR, HBM, Die-to-Die, CCIX, MIPI, HDMI, and Bluetooth.
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30 GHz Differential Probe with 2.92mm Interface
DH30-2.92MM
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Memory Module Testers
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
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Electrical Testing Services
Integra provides extensive experience with complex test development: Digital & Mixed Signal Devices: Microprocessor, Microcontrollers DSP, ASIC. Linear: DAC, ADC, Operational Amplifier, Comparator, Multiplexer, Interface, Discrete. Memory: SDRAM, DDR, SRAM, SSRAM, Flash, EEPROM, EPROM. Logic: 74xxx, 16/32-bit, ECL. RF, 8GHz typical and experience to 50GHz: PA, LNA, Filter, Mixer. Expertise in developing test plans (semi mfgr production & device characterization)
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Multifunction Data Collection and Analysis System
2002
The Model 2002 DME System is a state of the art, multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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3.5" Embedded SBC With AMD LX800, Dual LANs, 4 COM, 4 USB 2.0 And VGA/TTL (-40°C To +85°C)
SBC84620
The SBC84620 supports AMD LX800 500MHz processor and full feature I/Os. It is an ideal entry level PC-based embedded platform and be able to be fanless operation for industrial applications. The new integrated graphic controller, 4 COM, 4 USB 2.0 ports and 1GB DDR memory features empower the system value without extra development cost. In the meanwhile, for the expansion interface, the SBC84620 provides PCI with Mini PCI socket and ISA bus through PC/104 interfaces. Also, SBC84620 gives the best TCO (Total-Cost-of-Ownership) for system design due to DDR memory supported.
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AXIe Logic Analysis & Protocol Test
Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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Training Board
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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Resistivity Meters
DDR3
Integrated Geo Instruments & Services Private Limited
The DDR 3 Resistivity Meter is a specialized version of IGIS Resistivity meters designed for use in Resistivity surveys up to about 200m depth. It utilizes rechargeable batteries as power source to energize the ground thus eliminating the necessity of using the relatively expensive dry cells.
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Logic Analyzer
GoLogicXL-72
Logic analyzers and oscilloscopes offering fast sample rates and large memory depths are required to debug and test modern electronics. The GoLogicXL captures a very large window of bus activity using sample depths up to 1 billion samples. 4 GHz sampling rates expose the finest details in your signals. 1 GHz Transitional sampling provides the optimum method to capture fast data bursts separated by seconds, minutes, or even hours of bus inactivity. The GoLogicXL State analysis can also synchronize with single-data-rate 300 MHz SDR clocks, and double-date-rate 250 MHz DDR clocks (500 MHz effective).
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Logic Analyzer
GoLogicXL-36
Logic analyzers and oscilloscopes offering fast sample rates and large memory depths are required to debug and test modern electronics. The GoLogicXL captures a very large window of bus activity using sample depths up to 1 billion samples. 4 GHz sampling rates expose the finest details in your signals. 1 GHz Transitional sampling provides the optimum method to capture fast data bursts separated by seconds, minutes, or even hours of bus inactivity. The GoLogicXL State analysis can also synchronize with single-data-rate 300 MHz SDR clocks, and double-date-rate 250 MHz DDR clocks (500 MHz effective).
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4-Channel DAC FMC Module
SMT-FMC211 – LPC
Sundance Multiprocessor Technology Ltd.
The main component of the SMT-FMC211 is the Texas Instruments 4 channel DAC – TI’s Quad 1.25GHz DAC3484. This device offers excellent SFDR performance better than 70dBc, with an output sample rate of over 312MSPS. It interfaces to an Artix-7 XC7A15T-2C FPGA using a 16 bit differential DDR bus.
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8 GHz Differential Probe with ProBus2 Interface
DH08-PB2
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
