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Imaging Platform
TRITOM
The patented TriTom imaging platform is based on Photoacoustic Fluorescence Tomography (PAFT) technology that provides unparalleled capabilities for whole body imaging and in vivo characterization of small animal models.
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Test Fixture
OCP NIC 3.0
These test fixtures are necessary for testing within the OCP NIC subgroup (found under the OCP Server Work Group). These fixtures will arrive meeting the OCP NIC 3.0 Specification with a characterization of the boards. These fixtures mate with the OCP form factor connector, and will allow an electrical break out of each signaling lane.
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Computery Control Torsion Tester
SG-L10
The machine is mainly used for torsion test of metal and nonmetal,also it is applicable to the torsion test of parts and members. Servo-motor and cycloid gear reducer are introduced to the loading system in this product, the system for measuring torque and distortion angle are composed of high accurate torsion sensor, photoelectric encoder and computer measuring force.It possesses automatically tracking test torque and distortion angle, maintaining maximum peak load and displaying loading speed.Test data automatically display and process, print the test report according with the national criterions, including test date, number, material quality and torsion strength etc. The machine characterizes advanced technology, high accuracy, good stability, reliable quality and easy to operate, and it is necessary test instrument for aeronautics & astronautics, construction material, traffic, wire & cable, science research departm ent and universities.
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Large Aperture Beam Profilers
Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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GC And GC-MS Application System
Py-GCMS
Pyrolysis gas chromatography mass spectrometry (Py-GCMS) can be used to characterize most materials including insoluble and complex materials at trace levels often without any sample pretreatment e.g. polymers, plastics, rubber, paints, dyes, resins, coatings, cellulose, wood, textiles, oils etc.
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Hyphenated Technology
Evolved Gas Analysis (EGA) solutions couple two or more analytical technologies to greatly increase the power of analyses and save precious time by acquiring more information from a single run, creating a powerful and easy-to-use platform for materials characterization. EGA Hyphenation is a powerful tool in the analysis and identification of complex mixtures, both known and unknown, including identifying harmful chemicals in soil, quantitating components in polymers, determining leachables that may contaminate a product's packaging, identifying phthalates in PVC samples and more.
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Oscilloscope 33 GHz, 4 Channels
UXR0334B
UXR0334B Infiniium UXR-Series is the 33 GHz, 4 channel, Infiniium UXR-Series real-time oscilloscope, that offers 10-bit high-definition ADC, 20 femtoseconds (typical) of intrinsic jitter for exceptional jitter characterization.
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Tactical Grade Inertial Measurement Unit (IMU)
ADIS16490 iSensor
The ADIS16490 iSensor® device is a complete inertial system that includes a triaxial gyroscope and a triaxial accelerometer. Each inertial sensor in the ADIS16490 combines industry-leading iMEMS® technology with signal conditioning that optimizes dynamic performance. The factory calibration characterizes each sensor for sensitivity, bias, alignment, and linear acceleration (gyroscope bias). As a result, each sensor has its own dynamic compensation formulas that provide accurate sensor measurements. The ADIS16490 provides a simple, cost-effective method for integrating accurate, multiaxis inertial sensing into industrial systems, especially when compared with the complexity and investment associated with discrete designs. All necessary motion testing and calibration are part of the production process at the factory, greatly reducing system integration time. Tight orthogonal alignment simplifies inertial frame alignment in navigation systems. The SPI and register structure provide a simple interface for data collection and configuration control.
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Snap-on RF Current Monitoring Probe
TBCP2-250
The TBCP2-250 is a snap-on RF current monitoring probe. The probe has a very flat response with a 3dB bandwidth of 250 MHz and is characterized over the frequency range from 30kHz to 300 MHz. Upon request, it can also be supplied with a test protocol covering the frequency range 1 kHz to 350 MHz. The aperture of the RF current monitoring probe is 32 mm. Its transfer impedance is > 12 dB Ohm in the range from 700 kHz to 300 MHz.
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Autocorrelators
From material processing to scientific and medical base research, ultrafast laser systems are used in many areas of their high peak intensity and extremely short pulse width. One relevant area of application is time resolved spectroscopy. The pulse width is a critical factor for the adjustment of these laser systems and the characterization of experiments.
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Vibration Test Technology
These vibration exciters (also called shakers) use permanent magnets and are available as portable and stationary systems for simulating ambient vibration conditions. Robust design ensures a long service life, and typical applications include structure analysis and testing smaller subassemblies. These shakers are characterized by high lateral and axial stiffness and come in lightweight construction as specified by industrial users.
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Dimensional Metrology
Stand-Alone Metrology Family
Nova’s stand-alone metrology platforms are utilized to characterize critical dimensions such as width, shape and profile with high precision and accuracy and are used in multiple areas of the fab such as photolithography, etch, CMP and deposition in the most advanced technology nodes, across all semiconductor leading customers.
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Comb Generators
Keysight comb generators provide excellent phase and amplitude flatness making them ideal for use in phase calibration applications. A customer selectable USB-controlled frequency divider which allows for broad range of input signal frequencies from 10 MHz to 67 GHz and small minimum tone spacing of 10 MHz, makes Keysight comb generators suitable for characterizing non-linear devices.
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Spectrum Analyzers
From entry level swept spectrum analyzers to advanced real-time analysis RIGOL provides unprecedented value. Whether you are doing simple signal visualization, integrating wireless technologies into your IoT design, characterizing component performance, preparing for emissions compliance testing or working with complex modulated signals RIGOL has a Spectrum Analyzer to fit your need and budget.
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Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Test Handler
M4872
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Probe Card
VC43™/VC43EAF™
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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100 Watt Dynamic Measurement DC Source, 20V, 5A
66332A
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections. The Keysight 66332A Dynamic Measurement dc Source provides dynamic measurement and analysis of voltage and current waveforms. It is ideal for testing digital wireless communications products/components because it not only provides the power for testing, but also performs the peak current measurements required to characterize the pulsed current demands of these products.
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Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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PXIe Measurement Accelerator
M9451A
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
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Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
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Time Domain Reflectometers
HL1100 Series
HYPERLABS HL1100 Series TDR instruments provide high-performance test and measurement capabilities for use in the field or in the lab. These instruments are used for applications such as fault detection in cables and interconnects, impedance characterization, time of flight analysis, water level measurement, and more.
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Arbitrary Waveform Generators
M8100 Series
The M8100 Series arbitrary waveform generators (AWGs) offer a level of versatility that enables you to set up complex real-world signals — whether you need precise signals to characterize the performance of a design or need to stress a device to its limits. From low-observable radar to high-density communications, testing is more realistic with our precision arbitrary waveform generators.
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Device Characterization
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
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Light Simulator
From the review of the scientific development history, reliable and stable artificial light sources have played a very important role in the past century. For example, the artificial solar simulator is an important part of simulating sunlight to ensure accurate performance of PV characterization. With the growth of light sensor applications, more and more requirement of light simulators (or artificial light sources) explored. One of the core technologies of Enlitech is the artificial light sources. We can manipulate different lamp types (short arc lamps, LEDs, filament lamps et. al.) to generate different spectrum-form in different light intensity levels, beam sizes, and wavelength ranges. We have launched different artificial light source products for different applications fields. For instance, SS-X series solar simulators and ILS-30 ambient light simulator are for the PV field, HAAS is highly accurate star light simulator for the space field, and ALS-300 is a general-purpose light source in science research field. These products can not only meet the needs of your application, but also speed up the process of your research or mass-production.
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Ensure Accurate Screening, Diagnosis and Monitoring
CT QA Solutions
Over 40 years of experience helping our customers with CT compliance and patient safety. From CT Perfusion verification, to Dual Energy Characterization, to daily, monthly and annual CT QC, Gammex is your trusted CT QA and compliance partner.
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Manual Test Solution
Titan
Grund Technical Solutions, Inc.
Titan is an easy to use, low cost Human Body Model (HBM) or Machine Model (MM) manual test solution. It can be used for design, engineering, and characterization of your devices. Ranging from 50 V to 16,000 V the Titan will have the largest voltage range of any HBM tester.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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PXI Digital Pattern Instrument
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
