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Broadband Speed Test
Determines the amount of data transferred per second.
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Clock Generation Devices
Analog Devices offers ultralow jitter clock generation products for wireless infrastructure, instrumentation, broadband, automatic test equipment, and other applications demanding subpicosecond performance. Our clock products are ideal for generating the high speed, low noise clock signals required to clock high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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USB Power Sensor - 100 MHz to 20 GHz, Average, Peak (Pulse), Pulse Profile
GT-8555B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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USB Power Sensor - 100 MHz To 8 GHz, Average, Peak (Pulse), Pulse Profile
GT-8552B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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ICE 3000 Series
ICE3009
The ICE3009 subsystem is an agile filter for the VHF-L, VHF-H and UHF frequency bands. It allows operation of a number of transceivers in a cosite environment. The VHF/UHF Filter provides multiple poles of RF selectivity to reduce broadband noise in transmit mode of operation and to reduce interfering signals at the transceiver’s RF input in receive mode at Have Quick II/IIa and SATURN tuning speeds. This design incorporates a flexible control scheme that can be configured at the factory for various radio interfaces (ARC-210, ARC-231, ARINC 429, etc.). The design is highly integrated and includes all filters, amplifiers, power supply, transmit and receive switching (including a bypass mode), and Built-in-Test (BIT). A mounting tray is available as an option for easy incorporation on your platform. This system is qualified for military applications. Cost-effective modifications are available on the ICE3009. Please contact your sales representative at 513.870.9060 or Support@PoleZero.com for details.
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USB Power Sensors 10 MHz to 26.5 GHz
GT-8554B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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USB Power Sensor - 10 MHz to 18 GHz, True-RMS Average
GT-8553B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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USB Power Sensor - 100 MHz to 8 GHz, Average, Peak (Pulse)
GT-8551B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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6TL10 Table Top Test Base
H71001000
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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PXIe Optical Test Modules
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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VR/AR/MR Calibration Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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ESS Performance Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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SHC68-C68-RDIO2, 68-Pin VHDCI Male to 68-Pin VHDCI Male, 80 MHz, Shielded Digital Cable, 2m
156166-02
SHC68-C68-RDIO2 Shielded R Series High Speed Digital Male VHDCI Cable, 2m
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
