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Environmental Test Chamber
High and Low Temperature Test Chambers, ESS Environment Stress Screening, 2 Zone Thermal Shock Test Chamber, 3 Zone Thermal Shock Chambers, Walk-In Chambers, Burn-in Room and Aging Test Chambers, Altitude Chambers, Industrial Drying Oven, Salt Spray Test Chambers, Temperature Humidity Vibration Comprehensive Test Chamber, Test Machine Series, Custom Made Environmental Test Equipment, Double-Layer High and Low Temperature Chamber, Explosion Proof Temperature Chamber For Power Battery, etc.
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Modular DC Power Supply
62000B series
Chroma's new 62000B series of Modular DC Power Supplies offer many unique features for Burn-in and plating/electrolysis applications. The features include a N+1 redundancy, high power densities, hot-swappable maintenance, remote ON/OFF and programmable control via the CAN bus. The 62000B family offers 5 types of power module with ranging from 1V to 150V, current from 10A to 90A, and offers two mainframe type of six and three position. The six position mainframe can envelop in up to six power modules paralleled operation for 9KW power output. The 62000B can easily parallel up to fourteen mainframe to 120KW with current sharing and CAN bus control for bulk power applications. The Modular DC Power Supplies of 62000B are very cost effective with high power density and low current ripple. These instruments have be designed for burn-in applications such as the LCD panels, DC-DC converters, power inverters, notebook computers, battery chargers and many other types of electronic devices.
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DC Power Supplies
XFR Series
AMETEK Programmable Power, Inc.
XFR is the smart choice for research, product development and production test applications such as R&D, magnet control, product design, ATE, process control, electroplating and burn-in. The unique features of XFR make it the best choice for applications where high power and a wide adjustment of output voltage or current are required in a full 19-inch rack package. Choose from ten 2800-watt models.
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High Voltage Switching Test System
The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
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Accelerated Life Test Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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High Power Burn-In Test
Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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Burn-In Test Fixtures
Burn-in generally involves the extended operation of a product in a temperature-controlled environment. With possible humidity and supply voltage margining - the burn-in process can then be extended to include power stress (levels and on/off cycles) tests, high humidity environmental simulation as well as the classic "four corner test" of high voltage + high temperature, high voltage + low temperature, low voltage + high temperature and low voltage + low temperature.
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Burn-in System
Sonoma
High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
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Laser Diode Testing
The low power series of burn-in and life test systems are designed to test the reliability of low power laser diodes up to 1 Amp in current. The modular design means they can test up to 2,048 lasers, however due to the flexibility of the system, it can be adapted to suit both low volume R&D environments and high volume production environments.
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Stamped Spring Pin Sockets
Ironwood Electronics SBT sockets are small footprint sockets that are compatible with other product lines such as GHz elastomer sockets, Giga-Spring sockets, etc. The socket needs about 2.5mm extra space around the chip than the actual chip size utilizing only very small PCB real estate. A heat sink screw on the top provides the compression force as well as thermal relief and can be customized to dissipate more power. SBT socket uses SBT contact technology for high endurance and wide temperature applications. SBT Contact is a stamped contact with outside spring as well as inside leaf spring that provides a robust solution for Burn-in & Test applications. Solutions are available for 0.3mm to 1.27mm LGA, BGA, QFN, QFP, SOIC and other packages. Contact technology has 3 part system which includes top plunger, bottom plunger and a spring. The Beryllium Copper plungers are stamped and assembled to a stainless steel spring in an automated system to enable fast turnaround time, low cost and zero defects.
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Brute High Current Probe
P4301-1W
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe
CSP-40B-012
Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24
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Power, Patchcord, ITA, 36", Micro Power, 12 AWG White, Single Ended (22 Amps)
7-251912000-036
Power, Patchcord, ITA, 36", Micro Power, 12 AWG White, Single Ended (22 Amps).
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Power Adapters
ADP-PS-433
The ADP-PS-433 power adapter provides power and reset buttons as well as an easily accessible power connection to the WINSYSTEMS SBC35-427 single board computer. This power connector offers a highly reliable and secure connection to the external power supply allowing easy access to physically remove power from the front I/O panel.
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Analog Optical Power Meter - PXI
Power 1500 Series
The Power 1500 Series analog power meter brings cost-effective test and measurement. The Power 1500 provides logarithmic analog output as well as a digital optical power meter for applications that require real-time feedback.
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Power, Patchcord, Receiver, 72", High Power, 2 AWG, Double-Ended
7-221902688-072
Power, Patchcord, Receiver, 72", High Power, 2 AWG, Double-Ended.
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Intelligent Power Monitor
iPM
NAI’s iPM is an Intelligent Power Monitor that provides a precise, instrument grade, digital analysis of input power lines. This advanced, DSP-based unit monitors single-phase, 3-phase 4-wire wye, or 3-phase Delta power lines at various input voltage levels and frequencies.The iPM is equipped with an EIA RS485-compatible serial communications interface that permits additional control functions and readout of diagnostic data, and features a Background Built-in-Test (BIT) that constantly monitors the health of unit hardware and software. This power monitor is designed and qualified to the most stringent performance and environmental requirements, and is ideally suited for rugged defense and industrial applications.
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Analog Optical Power Meter - MATRIQ
1500 Series
The Power 1500 Series analog power meter brings cost-effective test and measurement. The Power 1500 provides logarithmic analog output as well as a digital optical power meter for applications that require real-time feedback.
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Power Monitor, AC-Powered
PMA/PQA
NAI's PMA and PQA Power Monitors are used to monitor voltage, frequency, and phase characteristics of single- or three-phase power lines. This allows normal operation of system loads when the power line characteristics are within predetermined limits. These power monitors are ideally suited for rugged defense and industrial applications.
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Power, Patchcord, Receiver, 36", Micro Power, 14 AWG White, Single Ended ( 22 Amps)
7-252914000-036
Power, Patchcord, Receiver, 36", Micro Power, 14 AWG White, Single Ended ( 22 Amps).
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Power Monitor, AC-Powered, Field Adjustable
YMA/YQA
NAI's YMA and YQA Power Monitors are used to monitor voltage, frequency, and phase characteristics of single- or three-phase power lines. This allows normal operation of system loads when the power-line characteristics are within predetermined limits.High and low voltage and frequency limits, and "pick-up" and "drop-out" time delay are field-adjustable using potentiometers. These power monitors are ideally suited for rugged defense and industrial applications.
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Godzilla High Current Probe, 100 Amp
HC375
Current Rating (Amps): 100Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 360Full Travel (mm): 9.14Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,110Overall Length (mm): 78.99
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Standard 6.20 (175.20) - 8.00 (226.80) High Frequency Probe
CSP-40A-015
Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 275 (6.99) including travel of probes
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Power, Patchcord, Receiver, 72", Micro Power, 14 AWG White, Single Ended ( 22 Amps)
7-252914000-072
Power, Patchcord, Receiver, 72", Micro Power, 14 AWG White, Single Ended ( 22 Amps).
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Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe
K-50L-QG
Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 0.80Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48
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Industrial AC Power Supply PS2 Form Factor, 460W
APS-946XA-EPS12 (80Plus)
- Power (typical): 460W- AC Voltage Input Range: Universal- Certifications: UL/cUL/TUV/CCC- Dimensions: Standard PS2 form factor, 140 x 150 x 86 (mm)
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Power, Patchcord, ITA, 72", Mini Power, 50µ, 16 AWG White, Single Ended (19 Amps)
7-235916000-072
Power, Patchcord, ITA, 72", Mini Power, 50µ, 16 AWG White, Single Ended (19 Amps).
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PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
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Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50B-QG-75
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00
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Brute High Current Probe
P4301-2F
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
