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VXI Digital Multiplier
4152A
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Programmable Digital Attenuator
LDA-602EH
The LDA-602EH has a large attenuation range of 120 dB with an exceptional 0.1 dB step size, allowing for both precision and accuracy during fading tests or device characterizations. This attenuator also features a fast 15 us switching speed, an operating temperature from -30oC to 50oC, a maximum RF input of +28 dBm, and is priced at $875. The LDA602-EH operates with a low insertion loss of 9 dB to 6 GHz, an input IP3 of +55 dBm and a typical VSWR of 1.3:1. Easily programmed for ATE applications, the LDA digital attenuators are a cost effective solution whether you are in engineering, the production test lab, or in the field. Units are ROHS compliant and can be used with any PC or laptop computer with USB 2.0 port (or powered USB hub) and Windows operating system. Lab Brick Signal Generators are provided with easy to use Lab Brick GUI software, 32 and 64 bit API DLL files, LabVIEW and Linux compatible drivers.
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Solar Cell I-V Characterization System
VS6825
Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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Railway and Traffic Engineering Solutions
In the past, LXinstruments has already implemented a number of application-specific system solutions which cater for these special requirements. These solutions are often used to replace systems which have been in production for many decades. Our systems are not only employed for testing signal box technology modules, but also for testing train control system which are installed in the track bed. Due to the strong magnetic fields which occur at the DUT in combination with high voltages, the test systems require specific technical safeguards.
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LCZ LCR Meter
SS1062
This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor, cable, wire, etc..
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Wide Range High Voltage Programmable DC Power Supply
N3600 Series
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
N3600 series is developed based on NGI's years of experience in testing for battery fluctuation simulation test, battery charger, high voltage diode, electrolytic capacitor, electromechanical control, ATE test system, etc. It is a high-voltage wide-range programmable DC power supply. According to different test environments in the fields of lab test, system integration test, and mass production line, NGI has made a number of optimization designs based on the international advanced technology. N3600 series is a market leader in similar products in terms of reliability, maintainability and safety.
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Industrial USB 3.0 Tester
M5615B
International Microsystems Inc.
The M5615 tester is a 16 Socket Bench top Production and Engineering Tester that supports USB 3.0 Super Speed and USB 2.0 High Speed devices. The tester comes with a built-in PC running a full Linux operating system that tests and copies any USB storage device including USB Hard Drives at super speeds.
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System for Analyzing Door Handles
In the production process of a vehicle door handle, the electrical functions of the component are to be tested. The mechanical testing of the operation of the door handle is performed by a PLC-controlled test system. In addition to the mechanical test, the electrical parameters: “serial data stream” and “impedance of the antenna” are to be analysed.
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Modular Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, programmable power module system providing DC, AC and electronic load assets all under control of a single controller. ReFlex Power™ (RFP™) provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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DC Power Supplies
XG 850
AMETEK Programmable Power, Inc.
The Sorensen XG Series is an 850 Watt, 1U half-rack DC power supply. The XG Series is the new standard for powerful, programmable DC power systems. Designed for test, production, laboratory, OEM and quality assurance applications, the XG Series provides a wealth of features to ensure accuracy and greater efficiency. It puts clean, reliable power at your disposal and delivers stable, variable output voltage and current for a broad range of development, test and system requirements.
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Inline Test Handler W/Bypass
6TL36
The 6TL36 test handler is the first ATE handler on the market that easily integrates the radio frequency tests into mass production lines.The modular approach of the 6TL36 offers the possibility of adding handlers together for a work in parallel that reduces the cycle time and saves costs as well as space when compared to traditional parallel solutions. Therefore, the system can be ordered with only one conveyor, with two conveyors (bypass or dual-line), and with three conveyors (Retour conveyor).
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Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Digital Classical Shock Controller
DVC-4/8 Shock
The CSC- I will perform all of the 'classical' shock tests as defined in MIL-STD-810 and is equally useful for environmental qual testing or production test screening. Automatic calculation of pre- and post-pulse compensation assures the maximum performance from your test system.
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Handler/Prober Interfaces
IFXX
FETtest offers a variety of Interface options, which expand test capability and provide connection to other production line resources. These interfaces range in complexity from simple handler/prober interfaces to interfaces with user programmable external component connections, to capacitance measurement systems. Models are available to work with the full range of FETtest systems and Remote Stations.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Signal Splitters
Becker Nachrichtentechnik GmbH
Becker Nachrichtentechnik GmbH offers a comprehensive portfolio of active multicouplers and bi-directional signal splitters for duplicating RF signals from common sources. The multi-couplers are designed in 50 ohm technology and are available as a 19 ", 1 U devices as well as slot-in modules for our 'Modular RF Systems' platform. With help of the slot-in modules, larger scale distribution structures can be realized in a space-saving and cost-effective manner. Some devices are available in variants for AC or DC power supply and provide service-friendly remote monitoring capabilities. For use in the production of infotainment components special multi-couplers with integrated HF and DC test functions are available. The multi couplers are used in applications like radio monitoring and direction finding, in product development, validation, manufacturing, quality assurance and in the field of research.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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PXIe-S5090 2-Port 9 GHz Analyzer
PXIe-S5090
The PXIe-S5090 delivers metrology-grade VNA performance and speed to National Instruments’ PXI system. This high-performance vector network analyzer allows testing of two-port devices from the bench to the production floor in a compact, modular form factor. With 138 dB dynamic range and +13 dBm maximum power, this VNA is engineered for short time to first measurement and also for high performance automation with fast test times.
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Battery Pack ATS
8700
Chroma transfers its successful experience in 8000 ATS which is quite well-known in the power electronics industry to the battery application field by developing the Test Items specifically for the battery industry. It can perform automatic tests on the Battery Management System (BMS), semi products and finished products tests on the production line as well as provide long term maintenance and service to the battery module. 8000 (8700) ATS has flexible hardware architecture that can select a variety of hardware devices, such as DC Power Supply, Electronic Load, LCR Meter and 6 1/2 digits Meter, etc. to comply with different automatic testing requirements for various applications. In addition new hardware and test items can be expanded to meet the demands for inspecting the highly customized battery products with diversified tests. The capabilities supported are:
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CMOS/CCD Production Test System
System 1828
The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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BGA Sockets
Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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Saluki S8723X Series USB CW Power Sensor (9kHz - 40GHz)
S8723X series is a diode detector USB power sensor based on a USB 2.0 full-speed/high-speed adaptive interface. It has a wide frequency range and large power dynamic range. It can be connected to a computer or other electronic measuring instruments, easy to set up a power test system, particularly useful for field and other low-cost production line testing and power testing.
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LED, Micro LED And VCSEL Measurement Systems
With a track record spanning decades, Gamma Scientific is a leading provider of custom, high-precision light measurement solutions for LED, micro LED, and luminaires in both the laboratory and production environment. The combination of our extensive competencies and commercial expertise has led to the development of a range of modular test solutions that can be readily integrated within the various phases of light source development and manufacturing. Each of these test modules includes measurement instrumentation, a system controller, all peripheral components, and top-level software interfaces.
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PXIe-2747, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module
780587-47
PXIe, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module—The PXIe‑2747 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2747 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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Memory Test Systems
ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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AMIDA ATI 600 Tester
AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
