Production Test Systems
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Product
Audio and Acoustic Functional Test Solution
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With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
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The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131C
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The Keysight 85131C is an 81 cm (32 in) long1 semi-rigid cable with a 3.5 mm female2-to-PSC-3.5 mm female connector. Cable frequency range is DC to 26.5 GHz with a return loss of 17 dB or better. Insertion loss is 0.43 * sqrt(f) + 0.3, where f is frequency in gigahertz, for the test port connector and 2.5 dB at maximum frequency for the device connector. Phase stability of the semi-rigid / flexible cables is specified with a 90-degree bend using a 4 to 3-inch radius. Stability1 of the 85131C is less than 0.06 dB, and phase is 0.16 * f + 0.5, where f is frequency in gigahertz.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
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The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
SoC Test Systems
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SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
VXI Digital Test Instrument
T940 Series
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The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Product
AI Inference System Based On NVIDIA Nova Orin For AMR Applications
MIC-732-AO
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Fanless and ultra-compact design. Embedded with NVIDIA® Jetson AGX Orin™ up to 275 TOPS. Supports 1 x 10GbE, 1 x 2.5GbE, 3 x USB 3.2 Gen 2 (10 Gbit/s). Supports 2 x CANbus, 1 x mPCIe, 2 x Nano SIM slots. Support Total 8-ch GMSL3.0/2.0 with FAKRA connectors.
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Product
Edge AI Inference Systems
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Powered by NVIDIA Jetson family and RTX, AIR series provides scalable AI inference performance or efficient retraining on a large scale at the edge.
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Product
Test Handler
M6242
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Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
PCIe 2.0 Test Platform
PXP-100B
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The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Edge AI HPC System
AIR-500D
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Edge AI HPC system powered by Intel® Xeon® D-1700 Series processors with support for up to 4 PCIe slots. Intel® Xeon® D-1700 series processor 4x DDR4 SO-DIMM sockets support ECC/nonECC memory up to 128GB.
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Wireless Device Functional Test Reference Solution
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The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
Mini In-Circuit Test System
U9403A
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The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
Modular Functional Testing Platform
OTP2
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Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
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Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
Edge AI Inference System
AIR-075
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Edge AI Inference system powered by NVIDIA® Jetson Thor™ Powered by NVIDIA Jetson T5000™ and Jetson T4000™, delivering up to 2070 TFLOPS FP4 inference performance. 19~36V wide power and -10~40 °C wide temp. supported.
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Product
NTS Platform
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Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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In-Line RF Test Platform
AR925
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This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Hybrid Single Site Test Handler
3110
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Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
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Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
High Temperature Component Test Fixture
16194A
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Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
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The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
6TL29 Semi-Automated Test Platform
AQ377
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- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Mezzanine System
5158
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The 5158 Electrical Conversion Module (ECM) provides eight (8) RS-232 outputs and eight (8) RS-232 inputs. Built around Maxim 1488 & 1489 chips for true RS232 levels and voltage tolerance, all outputs come up in the 1, mark or idle state. Electrically this is a negative output voltage, the start bit is always a 0 or a positive voltage level.
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Product
USB2.0 Module With 2 CAN Bus Nodes ARINC825 Compliant For Testing & Simulation of Avionic ARINC825/CAN Bus Systems
APU825-2
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USB2.0 module with 2 CAN bus nodes ARINC825 compliant for testing and simulation of Avionic ARINC825/CAN bus systems.
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Photodiode Burn-in Reliability Test System
58606
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The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
