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Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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6TL10 Table Top Test Base
H71001000
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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ScanWorks Boundary-Scan Test
ScanWorks Boundary-Scan Test
The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.
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In-Circuit Test Programming Services
Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Programmable Wide Frequency AC Power
PWF series
The PWF series is a family of programmable AC power source with wide range of adjustable frequency, developed for aerospace or military’s 400Hz and 800Hz test applications, such as lab use, compliance test, and quality assurance. The PWF series consists of L series and M series, which have different output frequency range. L series provides 45~500Hz and 0~300V output, and M series provides 300~800Hz and 0-150V output. Users can select communication interfaces of RS-485, RS-232, and optional GPIB. The PWF series also have programming sequence functions of STEP and GRADUAL modes, three phase independent control, phase angle control, and disturbance function.
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High Level Language Debugger and Emulator Tool
Universal Debug Engine
Programmierbare Logik & Systeme GmbH
With Universal Debug Engine (UDE®) PLS offers on top solutions for software development of systems-on-silicon including debug support for the 16 Bit and 32 Bit microcontrollers C16x, C166™, ST10F276, ST10F280, XC166, XC2000, XE166, XMC4500, C166S V2, SDA6000, TriCore™ from Infineon and STMicroelectronics, Power Architecture® MPC55xx, MPC560x, MPC563x, MPC57xx from NXP™, PowerPC PPC440SPe from AMCC, Power Architecture® SPC560, SPC563, SP574 from STMicroelectronics, ARM7™, ARM9™, ARM11™, Cortex™-M0, Cortex™-M0+, Cortex™-M3, Cortex™-M4, Cortex™-M7, Cortex™-R4, Cortex™-A8, Cortex™-A9, XScale™, SuperH™ SH-2A derivatives in a new multicore debug environment as well as technical support. The extensive feature list includes functions like: high speed and flexible target access via JTAG, cJTAG with OCDS L1, EmbeddedICE, OnCE, COP, DAP, DAP2, SWD support, OCDS L2 trace, MCDS trace, CoreSight™ trace, ETM trace, ETB trace, Nexus trace, ASC, SSC, 3Pin and CAN, in-system FLASH memory programming of FLASH / OTP with UDE MemTool, support of various RTOS, OSEK® and test automation tools.
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Mobile Testing Power Supply(Microamp)
M8831
M8831 Power supply, a new generation of programmable linear power supply, are designed with high speed dynamic programming output(Voltage 0-30V, 1ms rising time), high current accuracy (0.001mA resolution) and low internal resistance, which can satisfy all the test requirements. The combination of bench-top and system features in these power supplies not only make it possible to option into other equipments, but also make it possible for users to edit program by panel keyboard, which will bring much convenience to users. Meanwhile, the voltage level switch works without relay, which will cause the fast switch between high voltage and low voltage. Moreover, M8831 powr supply provides the best solutions for cellphone research, micro-electronics lab,research institue and special users requiring power supply with low current buthigh accuracy .
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LCA TAP Plug-In
N4370P01A
Keysight Test Automation on PathWave (TAP) is a modern Microsoft .NET-based application for standalone use or in combination with higher level test executive software environments. Instrument plug-ins provide test steps that can be added to work-flow sequences without instrument level programming commands. The LCA plug-in steps further simplify automation by handling the interface to both the PNA instrument and the LCA optical hardware and software and providing the test steps for easy configuration.
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Flying Probe Programming & Test Development
Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.
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Flying Probe Test Programming & Testing Services
Zero Defects International LLC
ZDI utilizes a Seica flying probe tester in order to provide test program development and testing services to customers in Silicon Valley and throughout North America. This is a very cost-effective solution for printed circuit assembly manufacturers who do not have in-house equipment of their own but have customers who require test services.
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4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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High Performance Autoranging DC Power Module, 50V, 5A, 50W
N6751A
The Keysight N6751A is a 50 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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AI UI Visual Testing Platform
Applitools Eyes
Automated Visual Testing of Web, Mobile and Desktop applications. Automatically test all the visual aspects of the applications that they are developing on multiple browsers, multiple Mobile device OSs and form-factors, and multiple programming languages.
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Prodution Testers
Effitest E50
Effitest e50 is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
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Test Engineering
TestEdge engineers have an average of 17 years of engineering experience in test, packaging, and fixturing. This experience is across a wide spectrum of products, customers, and ATE platforms. We have experience in all of the following:Digital, analog, mixed-signal, RF Test programming servicesRemote test capability Semi-automatic test generation Automatic data collection and reduction High performance test fixturing Format independant vector translation High power testing with liquid cooling
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In-System Test Programming System
WriteNow
Based on proprietary WriteNow! Technology, the WriteNow! Series of In-System Programmers is a breakthrough in the programming industry. The programmers support a large number of devices from various manufacturers and have a compact size for easy ATE/fixture integration. They work standalone or connected to a host PC, and are provided with easy-to-use software utilities.
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200KHz / 10000Freq.Point LCR Meter
MCH-2816A
It has high test frequency of 300kHz and 0.01Hz stepping arbitrary programming, and it has 10mV-2V signal level, all making it meet the precision test requirements of production line quality control, in-coming inspection and lab. Its HANDLER, RS232c interfaces are used for the component automatic sorting system, which provides the conditions for computer telecommunication and test recording. Flexible frequency-response analysis:Due to non-ideal inductor, capacitor and resistor, in order to precisely evaluate the characteristics of one component in one frequency band, MCH2816 could use its signal generation ability with 10mHz resolution to correctly analyze frequency response of the component parameters in any frequency band. In particular, it can do the precise measuring of the resonant impedance of the low-frequency ceramic resonant devices which has wide impedance range.
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JTAG based Test & Flash Programming Services
We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Triple Output Power Supply
U8030 Series
The Keysight U8030 Series variable DC power supply has a total output of 375 W—making this solution an ideal power source in the design and manufacturing of electronic devices. The U8030 Series power supplies feature an output sequencing capability for semiautomated tests. These power supplies enable you to generate output sequences with minimal programming skills. This solution features excellent load regulation and clean output noise for continued stability.
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350 MHz RF Frequency Counter, 10 digits/s
53210A
Single-channel, RF frequency counter One 350 MHz input channel, plus optional second channel (6 GHz or 15 GHz)10 digits/second resolution Built-in math analysis and color, graphical display (trend and histogram)LXI-C/LAN, USB, GPIB Optional: Lithium Ion Battery BenchVue software enabled: Do more with your PC and instrument together, no programming required. Easily control your counters, quickly build automated tests and log data for faster analysis and save precious time.
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Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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Test & Programming Software
ScanExpress
The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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The Language of Technical Computing
MATLAB
MATLAB is a high-level language and interactive environment for numerical computation, visualization, and programming. Using MATLAB, you can analyze data, develop algorithms, and create models and applications. The language, tools, and built-in math functions enable you to explore multiple approaches and reach a solution faster than with spreadsheets or traditional programming languages, such as C/C++ or Java. You can use MATLAB for a range of applications, including signal processing and communications, image and video processing, control systems, test and measurement, computational finance, and computational biology. More than a million engineers and scientists in industry and academia use MATLAB, the language of technical computing.
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8-Sites Flash Programmer w/Relay Barrier, True Parallel Channels
YAV90FR2
The YAV90FR2 or YAM90FR2 is a flash programmer housed in a compact 6TL YAV Module form factor, designed forseamless integration into automated test environments. It incorporates the advanced FlashRunner 2.0 technology fromSMH, enabling efficient programming of microcontrollers, flash memory, and other logic or memory devices. Themodule features flexible connectivity options, with all digital I/O (DIO), programmable voltage lines, and correspondingground lines switchable via integrated relays.
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Signal And Image Processing Research
TPAC solutions are ideal for research in signal processing applied to ultrasound. You need to be able to access to any parameter, implement a particular algorithm, and access to any data during the acquisition or postprocessing phase. TPAC provides you all of these. It can be applied to studies in signal processing, image processing, beamforming, machine learning, etc… Thanks to TPAC’s open platforms, you will be able to freely set the ultrasonic sequences, record the raw data from your experiment, and test your own algorithms or even method. In order to adapt to a wide variety of habits, TPAC proposes multiple APIs (Application Programming Interface) compatible with Matlab, C++, Python, C#, Labview and working under Windows or Linux operating systems. Through a socket, it is even possible to use any OS of your choice.
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Digital Test Instruments
High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
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Test Programming
TestAssistant II
From a front-end graphical user interface to a back-end relational database, TestAssistant II organizes and maintains everything necessary for testing. Tester interfaces, wires, connectors, adapter cables, and other complex sub-assemblies are graphically represented.
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Functional Test Fixtures
RNS can build almost any test equipment and automated test machinery. We have delivered soltions for HiPot, LED Test, Leak Test and RF shielded applications for years. We can provide Complete Test Systems, including Test Fixtures, Rack System and even Programming. Our team is committed and has a proven track record of delivering exceptional products independent of scope, so simple- and high-complexity projects are handled with equal care.
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x1149 Boundary Scan Analyzer
N1125A
The x1149 is a tool for engineers to perform structural test such as opens and shorts tests on their PCBAs. It also performs In-System Programming for devices such as FPGAs and CPLDs.
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JTAG Software
Looking for flash programming or JTAG test utilities, we have them. Our software ranges from basic command line utilities to applications that extend the emulator's use in the field or the lab.
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Tri-Temp Test Handler
SIA-118 Series
Whether you are testing at room, cold or hot temperatures, our tri-temp test handlers are suited for a wide range of applications, from the basic to the most stringent and demanding test requirements. The SIA-118 series offers an open platform for packages from 3 x 3 mm up to 100 x 50 mm at a temperature range from -55 °C to +125 °C and optional full temperature range from -60 °C to +175 °C. Offering easy and flexible configuration, this tri-temperature handler supports both Kelvin and PTB contactors for SOIC, QSOP, SSOP, QFN, TO, MEMS and other custom packages. It is ideally suited for Engineering, Qualification Lot, and small-to-medium production run with easy migration to full production capability. This is a popular model for custom applications with very low NRE. Powered by a cutting-edge 80 ns/step all integrated controller and modular programming design for easy customization.
