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Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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In-Circuit Test Programming Services
Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Mobile Testing Power Supply(Microamp)
M8831
M8831 Power supply, a new generation of programmable linear power supply, are designed with high speed dynamic programming output(Voltage 0-30V, 1ms rising time), high current accuracy (0.001mA resolution) and low internal resistance, which can satisfy all the test requirements. The combination of bench-top and system features in these power supplies not only make it possible to option into other equipments, but also make it possible for users to edit program by panel keyboard, which will bring much convenience to users. Meanwhile, the voltage level switch works without relay, which will cause the fast switch between high voltage and low voltage. Moreover, M8831 powr supply provides the best solutions for cellphone research, micro-electronics lab,research institue and special users requiring power supply with low current buthigh accuracy .
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Adjustable Clamshell Bed of Nails Testers
AdjustaBON Family
Designed for quick test development. This fixture can be configured to probe almost any circuit board in just a few hours. Once the perfect test is developed, move this light weight fixture out to the production floor to evaluate your production line test strategy prior to buying permanently drilled test fixtures, or while waiting for your drilled fixtures to be delivered. The AdjustaBON competes with the Flying Prober. There are many advantages over the flying prober. Setup is simple and intuitive and can be much quicker than programming a flying prober. Small size provides versatile bench top operation right where you need it. Maintenance costs are insignificant in comparison. The total cost of this fixture is in many cases less than the yearly maintenance cost of a flying prober. It would be possible to buy one of these fixtures every year for the price paid just to maintain one flying prober and it is about 1/20th the purchase price
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AC/DC Linear Power Supply
Linear AC-DC power supplies are electronic devices used to convert electrical energy from alternating current (AC) to direct current (DC), providing a stable and regulated power supply for electronic devices. They are represented by the DA series.Linear power supplies of the DA series are characterised by their low output noise and high speed. They can be used as power amplifiers; a sinusoidal voltage of 8/10 Vpp can be superimposed on the test voltage up to a frequency of 50 kHz.Another application for this power supply family is the simulation of the curve of a photovoltaic panel by programming the voltage and current.
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Test Executive for Visual Development, Database Storage, and Run-Time Execution of Test Strategies
TestBase
TYX TestBase is a test executive that supports the visual development, database storage and run-time execution of test strategies (also known as test plans or test sequences).TestBase integrates third-party applications such as: test programming languages, document viewers, report generators, database engines, Configuration Management systems and diagnostic tools.Its modular and open architecture enables system integrators and end-users to customize and extend the product and to integrate additional third-party applications.
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Cable/Harness Tester
LX-650
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface;．·Up to 1000Vdc/700Vac Test Voltage．·256 Max. Test Points．·Auto Scan and Auto Pin Search．·The system provides advanced instant open-circuit, short-circuit, continuity test．·Intermittent Conductance Test．·Intermittent Open/Short Test．·Providing Double-End/Single-End Testing．·Large 320×240 LCD display．·Full Programming Sequence Test．·Versatile I/O Ports for application．·Statistics and Print Function
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PXIe Arbitrary Waveform Generator, 500 MSa/s, 16 bit, 200 MHz
M3201A
The M3201A PXIe arbitrary waveform generator is ideal for general purpose AWG automated test requirements. It offers high channel density with high-quality output with low phase noise. The optional real-time sequencing, intermodulation synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including envelope tracking (ET) and DPD (part of PA/FEM reference solution), MIMO, baseband electronics design, wireless device manufacturing, ATE, beamforming and other multi-channel coherent signal generation and multi-channel signal generation.
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Tri-Temp Test Handler
SIA-118 Series
Whether you are testing at room, cold or hot temperatures, our tri-temp test handlers are suited for a wide range of applications, from the basic to the most stringent and demanding test requirements. The SIA-118 series offers an open platform for packages from 3 x 3 mm up to 100 x 50 mm at a temperature range from -55 °C to +125 °C and optional full temperature range from -60 °C to +175 °C. Offering easy and flexible configuration, this tri-temperature handler supports both Kelvin and PTB contactors for SOIC, QSOP, SSOP, QFN, TO, MEMS and other custom packages. It is ideally suited for Engineering, Qualification Lot, and small-to-medium production run with easy migration to full production capability. This is a popular model for custom applications with very low NRE. Powered by a cutting-edge 80 ns/step all integrated controller and modular programming design for easy customization.
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Circuit Breaker Simulation Device
PSS01
PSS01 is the circuit breaker simulator，which can conduct circuit breaker simulation to test the whole secondary relay scheme together with relay test set. It is very good accessory for protection relay test kit to avoid complicated software programming to finalize the same test.
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Electric Vehicle Supply Equipment ATS (EVSE ATS)
It is a customized system based on Chroma 8000 ATS specializing inverification of EV Supply Equipment (EVSE) and complying with SAE-J1772 in programming the test items for operation.
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RF Upconverters
SignalCore offers traditional multi-stage and single-stage RF upconverters, and Direct IQ modulators that feature low phase noise, high dynamic range, wide bandwidth, and continuous tuning. SignalCore RF upconverters are compact and built for mechanical robustness and ruggedness. Applications include various test and measurement applications such as those in point-to-point radio, wireless communication, ATE, and software-defined radio. All products are provided with a Graphical User Interface (GUI), driver, and API for easy programming control.
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Manufacturing Test Only System
MTO
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Software Test Framework for LabVIEW
VI Tester
VI Tester is a software test framework for LabVIEW that allows software developers to test their LabVIEW code (VIs). Software testing is a critical component of agile development and test driven development processes and is also critical for validating software functionality. VI Tester is based on the industry standard xUnit software test architecture that is used in many other programming languages. This architecture is very flexible and powerful, but also very easy for beginners to learn.
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Test Programming
Terotest offers a full test programming service for all of our Automatic Test Equipment. In many cases test programs can be generated from CAD data on the product or component under test, or from autolearn facilities within the test system. Such techniques maximise accuracy and test program fault coverage, and allow quick and easy test program generation.
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LCA TAP Plug-In
N4370P01A
Keysight Test Automation on PathWave (TAP) is a modern Microsoft .NET-based application for standalone use or in combination with higher level test executive software environments. Instrument plug-ins provide test steps that can be added to work-flow sequences without instrument level programming commands. The LCA plug-in steps further simplify automation by handling the interface to both the PNA instrument and the LCA optical hardware and software and providing the test steps for easy configuration.
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True Average Connected Power Sensors
CPS2000
CPS2000 True Average Connected Power Sensors provide USB, LAN and PoE capabilities to enable easy RF power measurement of modulated and CW signals from 50 MHZ to 8 GHz. Compatible with Windows and Linux systems, CPS2000 sensors include all the necessary drivers for programming through SCPI, IVI and LabVIEW. Connectivity and compatibility, combined with 60 dB dynamic range and 100 measurements per second, CPS2000 sensors are the ideal solution for lab, field, production test, ATE remote monitoring and embedded environments.
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100 High Speed Programmer
Commander Accelerator
The Commander High Speed Programmer (HSP) is low overhead system designed to test Flash Memories, PLA's and Micro-controllers. The parallel multi-module architecture provides the flexibility to program and test multiple devices. It's full-featured capabilities support chip erasing and programming, sector erasing and programming, sector protect and unprotect, and data verification functions.
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Flying Probe Test Systems
Flying probe testers work by In-circuit testing the board via a number of moving test probes. They have the advantage over traditional In-circuit testers of not requiring a dedicated "bed of nails" test fixture thus reducing the price for each different board being tested. However, modern Flying Prober testers offer so much more than just In-circuit testing. They enable the user to combine In-circuit, AOI, Functional, Device Programming and Boundary Scan testing, in one test system.
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Text-Based Way to Connect & Disconnect Relays on ABex Modules
ABex Switching
The ABex Switching features a text-based way to connect and disconnect relays on ABex modules. Alias names for channels could be defined in a DUT specific topology file and then be used for text-based switching. These alias names are also shown in the Konrad System Manager allowing easy debugging of test sequences. The ABex Switching functionality could be either used out of NI Teststand with the provided test steps or via API from other programming languages.- Text-based switch routes- XML based topology for Alias mapping- Switch routes with support for Alias names- Seamless integration into Konrad System Manager
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Bustec VISA Library And Tools
ProDAQ 8200
The Virtual Instrument Software Architecture (VISA) is a standard for configuring, programming, and debugging data acquisition and test systems using hardware interfaces like Ethernet, USB, PCI Express, GPIB, IEEE1394 or even RS232. The VISA library provides a standardized application programming interface between the hardware and application programming environments like LabVIEW, LabWindows, Visual Basic etc.
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Test Systems
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Lab Power Supplies
SYSKON Series
The analog interface is equipped with two programmable trigger inputs and three signal outputs, which can be linked to various device functions for indication, or for controlling external devices and an auxiliary power output. Beyond this, monitor outputs and control inputs for voltage and current setpoints are available as well. Sensing leads allow for auto-sensing operation at the power consumer. Strict menu-driven operation supports highly diverse programming functions. The device is transformed into a freely programmable test signal generator by means of an expanded sequence memory and extra functions.
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Customization & Automation
For production and test bench applications, the operation of the measurement needs to be either semi or fully automated. On top of its turnkey solutions, Oros offers a large number of tools to open the programming access. This can be addressed based on all levels of programming expertise achieved by OROS users themselves, local partners or OROS teams.
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DataBlaster PCI / PCIE JTAG Boundary-Scan Controller
JT 37x7/PCI
High speed and performance JTAG Boundary-scan PCI PC plug-in controller for PCI bus slot or PCIe PC plug-in controller for PCI Express bus slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
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In Circuit Test Service
In Circuit Test Program Development. Provide you with programming and fixture build as well as schematic review. Will order the fixture from one of our preferred vendors or any Fixture Vendor you prefer.
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Boundary-Scan Test and In-System
PCIe-1149.1
The Corelis PCIe-1149.1 is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the PCIe-1149.1 offers up to 80 MHz clock rates on 4 or 8 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.
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Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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Gravity Feed - Benchtop
3000B
Exatron's Model 3000B Series of automatic component handlers integrates customer-specific ambient temperature programming and/or test sites and up to eight automatic device inputs and outputs.
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Test Engineering
TestEdge engineers have an average of 17 years of engineering experience in test, packaging, and fixturing. This experience is across a wide spectrum of products, customers, and ATE platforms. We have experience in all of the following:Digital, analog, mixed-signal, RF Test programming servicesRemote test capability Semi-automatic test generation Automatic data collection and reduction High performance test fixturing Format independant vector translation High power testing with liquid cooling
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Aeroflex AIDE
This programming environment for analog and digital in-circuit test and function test allows a high depth in the realization of inspection tasks. We have many years of extensive experience in dealing with AIDE.
