Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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Product
Visual Editor for the Automatic Test Markup Language (ATML)
ATML Pad
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Reston Software offers ATML Pad, a visual editor for the Automatic Test Markup Language (ATML).The ATML formats are versatile but complex. Direct editing in XML is next to impossible, even with capable XML editors. ATML Pad overcomes this problem by exposing an application-specific visual interface. ATML Pad manages the complexity of the ATML formats, allowing you to focus on describing your tests. It abstracts XML ID references, allowing you to simply select the referenced item from a list. In addition, ATML Pad can generate XML IDs automatically and ensures that IDs remain unique while you edit the data.ATML Pad allows you to quickly generate complex ATML constructs through a single mouse click. It validates your data during input and on-demand, ensuring that valid ATML documents are produced.ATML Pad interoperates with the NI TestStand ATML Toolkit to deliver automatic code generation solutions that reduce the cost of implementing NI TestStand test programs and ensures their cost-effective long-term maintainability.
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Product
Professional ATLAS WorkStation
PAWS Developer's Studio
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We can provide and fully support PAWS (Professional ATLAS WorkStation), the leading ATLAS development system used by most of the US and European military ATLAS based ATS. The PAWS suite includes full development systems as well as runtime only versions for executing previously developed TPS on an installed base of workshop systems.PAWS Developer's Studio gives you the power to compile, modify, debug, document, and simulate the operation of ATLAS test programs in a modern Windows environment. It offers the visual development capabilities prevalent in the marketplace today specifically tailored for ATLAS TPS development. A full range of the most commonly used ATLAS subsets is supported. A PAWS Toolkit can modify the ATLAS subset to meet the particular ATE (Test Station) configuration. Its output is ready to be executed on the associated debugging PAWS run time system.
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Product
Virtual tester
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Emulate tester patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test programs. Reads the actual ATE program and creates a Verilog /VHDL simulation test bench.
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Product
Automated Test and Programming Station
The Scorpion BRiZ
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The primary goal of an electronic test strategy is to achieve the highest possible test coverage. Often, a combination of test tools and techniques needs to be integrated in order to meet this challenge. A decisive factor in selecting the optimal test strategy is cost. So, choosing a test platform that results in the highest test coverage for your investment is essential.But, what if in addition to test, you require in-system or on-board programming? What would be the best way to handle this while staying within budget and meeting production timelines?
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Product
Integrated Development Environment for the Creation and Execution of IEEE1641 Test Programs
SigBase
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SigBase is an Integrated Development Environment for the creation and execution of IEEE 1641 test programs. It supports the development of tests using flow-charting techniques and the graphical design of signals using newWaveX. It includes fully integrated compilation and signal path allocation software that determines the appropriate instrument and switch path for each signal and test. The run-time system, which is also available as a separate product for use on multiple test stations, controls the operation of the ATS and can provide test results in ATML format.
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Product
JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
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8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Product
XJLink2-3070
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The XJLink2-3070, approved by Keysight Technologies, provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from Keysight (Agilent) i3070 ICT machines.
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Product
Certification Programs
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With the intention of creating confidence among customers and facilitating interoperability across multi-vendor networks, the UNH-IOL has partnered with several industry forums to create certification programs. Testing plays a large part in these certification programs, and the use of independent third-party test houses, like us, is key to their success. We do not certify devices, rather we supply unbiased information these certification programs need to accurately certify devices
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Product
Ring Wave Generator
SKS-1206IA/SKS-1206IB
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Shanghai Sanki Electronic Industries Co., Ltd.
The ring wave generator is fully compliant with the new standards of IEC61000-4-12 and GB/T17626.12. The interface contains standard differences between IEC and Chinese national standards. Users can choose to enter the corresponding interface to perform different Test: Program -controlled high-voltage power supply and electronic switch have the characteristics of high precision, long life and good reproducibility.
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Product
Aging and Life Test Rack
SY2036
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SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
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Product
Electric Vehicle Battery Tester
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The Electric Vehicle Battery Tester (EVT) is designed for testing traction batteries in electric vehicles or HEV batteries in hybrid electric vehicles. The EVT realizes the functions charge and discharge with freely programmable set values for current, voltage, power or resistance in test programs, as well as the registration of the corresponding measured data.
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Product
PathWave Test Executive For Manufacturing Developer Version
KS8328A
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PathWave Test Executive for Manufacturing (PTEM) is a plug-in that enhances the user experience in developing automated test programs using PathWave Test Automation Platform (TAP). With powerful PathWave Test Executive software, we eliminate the need to maintain or develop a test platform by users, especially in a manufacturing environment where a high mix of products exist, the maintenance, enhancement, and control of it could become challenging. Development of a test execution platform should not be a priority for valuable resources, instead optimizing and improving test coverage should be the key area of focus.
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Product
PCI Based JTAG Controller
PCI-1149.1/Turbo
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The PCI-1149.1/Turbo is a powerful PCI-based JTAG/boundary-scan controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Product
CMT - Tester
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VPC G12 interface - interchangeable fixturesQuick exchange of test applicationMinimum of equipment in the fixture - fixture only as contacting interfaceManual fixtures ATXFixture identification - automatic test program loadingConnection to external meas. instrumentsControled by SCADUS / LabViewSelftest of internal cards and connected instrumentsCentral test program, configuration and datalog files location possibility (server)Uninterruptible power supply for PC
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Product
Data Logging and Analysis With Tecap
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Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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Product
In Circuit Test Service
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In Circuit Test Program Development. Provide you with programming and fixture build as well as schematic review. Will order the fixture from one of our preferred vendors or any Fixture Vendor you prefer.
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Product
Pattern Conversion
Wave Wizard
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Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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Product
Promira™ Serial Platform
TP500110
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The Promira™ Serial Platform is our most advanced serial device ever. This new, powerful platform offers many benefits over our previous generation of host adapters:*Integrated level shifting ensures you'll be able to work at a variety of voltages ranging from 0.9 to 5.0 volts without needing any costly accessory boards.*High-speed USB connectivity to the host system provides high performance and convenience for benchtop programming, testing, and emulation.*Ethernet connectivity is convenient for benchtop work, and it also enables remote control for your automation needs.*With the ability to provide a total of 200 mA of power, Promira platform can easily power your project, simplifying connectivity and troubleshooting.*New architecture enables you to download applications to the Promira platform - Upgrade your device when you need new features and you'll never wait for that emergency delivery in the middle of your project.
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Product
Image Sensor Test System
IP750
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Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Amplifiers
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Gigacom supplies custom amplifiers to several Test Ranges to support on going test programs. We have experience designing solid state amplifiers operating at power levels up to 1KW and from HF to X-Band.
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Product
High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
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The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Each digital channel features a wide drive / sense voltage range of -14 V to +26 V (maximum swing of 24 volts) which can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) for DC measurements.
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Product
Test Module
FailSim
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FailSim simulates a faulty component and allows the user to quickly and simply improve the actual fault detection of a test program. The result represents a definitive conclusion for tested or untested components.
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Product
Modular Relay Board
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Alliance Support Partners, Inc.
An increasing number of electronics products are being assembled in panels of 8 or more to minimize production cost. These products are typically tested with in-circuit tests (ICT) followed by power-on functional tests. Normally, ICT requires isolation of power and ground while measurements are being performed. Functional tests, including in-system programming (ISP), require board power to be applied. The Modular Relay Board (MRB) is designed to switch power onto each individual board and to disconnect sensitive signals during functional test.
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Product
Furniture Testing
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We can test to ANSI/BIFMA or any government, military or industrial test standard. American Testing Laboratory can design a specific furniture testing program tailored to meet your particular needs.
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Product
Integrated Test Facility
ITF
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The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
790406-12
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The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Product
Vector Network Analyzer (VNA) Simulator – Advanced
S94051B
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S94051B puts Keysight’s industry-leading network analyzer software portfolio into your computer. Dive deeper into data captured on an instrument with support for time domain, spectrum analysis, gain compression, and all the other software applications you use on your instrument. You can also develop and troubleshoot test programs on your computer before deploying them to the instrument. S94051B is a superset of S94050B and contains the S-parameter functionality.
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-08
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The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Product
Test Programming
TestAssistant II
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From a front-end graphical user interface to a back-end relational database, TestAssistant II organizes and maintains everything necessary for testing. Tester interfaces, wires, connectors, adapter cables, and other complex sub-assemblies are graphically represented.
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Product
Environmental Stress Screening
ESS
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Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
