Interoperability Test
assures functionality between two or more systems.
See Also: Interoperability Testing, Functional Test, Standards
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Anite SAS Interoperability Testing
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Access advanced platform for network simulation, currently used by major Tier 1 carriers in their device acceptance programsAccelerate the introduction of new mobile devices with cost-effective, controllable, repeatable and automated lab-based testingQuickly evaluate devices in the integration, interoperability testing and carrier acceptance testing phasesConduct rigorous device testing to achieve superior experience in terms of functionality and quality of voice and data transferTest data performance under fading conditions using the internal fading capability to enable comprehensive performance testing
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NVMe® Technologies
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We have been a leader and expert in NVMe Testing Services for several years providing conformance and interoperability testing. In addition, we also host NVMe Plugfests where storage vendors from around the world come together to test against NVMe standards to qualify them for the NVMe Integrator's List. The NVMe Integrator's List currently consists of configurations that have proven to be interoperable and conformant to NVMe standards.
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Product
P-Series Modular Power Meter (LXI Compliant)
N8262A
Power Meter
The Keysight N8262A P-Series modular power meter enables LAN-based automated measurements of peak, peak-to-average ratio and average power. The N8262A enables fast, efficient, and cost-effective creation and reconfiguration of your ATE system. Owing to LXI test standardization and its interoperability with existing test assets, your system can be up and ready in no time.
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Product
Interoperability Testing Services
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Using our decades of knowledge and experience of Bluetooth, markets and products we'll help you deliver products which are free of defects, minimize field issues, lower development costs and reduce time to market. Teledyne LeCroy offers test services to help in all stages of product development from Specification to Market Launch and beyond.
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Product
Ethernet
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The UNH-IOL has been providing Ethernet testing services since its inception in 1988. We have a strong and wide-reaching industry reputation and participate in many industry organizations including the IEEE, the Ethernet Alliance, and the OpenAlliance. We were honored to receive the IEEE-SA Corporate Member of the year award in 2013 for "unwavering contributions to interoperability testing of IEEE standards".
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Ethernet
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Arasan Chip Systems has a complete portfolio of Fast (10/100) Mbps and Gigabit (10/100/1000) Mbps and now 10Gigabit Ethernet IP. Our high quality IP has completed the rigorous interoperability tests at UNH-IOL laboratories and has been widely licensed. Arasan also provides a portable Ethernet driver.
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Software Solution for Interoperability Testing
COMPRION Network Bridge
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COMPRION Network Bridge provides a direct connection between (e)UICCs and back end servers. This way, remote administration scenarios can be processed in a lab environment independent of a real network or a network simulator. This makes the work of (e)UICC manufacturers, MNOs, SM-DP(+), and SM-SR providers easier. The test effort is reduced significantly, because there is no need for a network simulator and the testing limitations of a real or simulated network do not apply.
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Product
Power Meter
P-Series
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The N8262A is a compact and slim LXI-compliant P-Series modular power meter. The N8262A helps you to reduce your test system size and enables LAN-based automated power measurements. Owing to LXI test standardization and its interoperability with existing test assets, your system can be up and ready in no time.
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Interoperability Testing
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Underwriters Laboratories Inc.
Leverage our expertise to validate that your product not only works as expected with all other relevant devices but also conforms to all appropriate standards and technology platforms. We do this by testing products in real-world scenarios. We are an approved testing laboratory for many IoT and wireless standards bodies, such as Bluetooth SIG, Thread Group, Wireless and Zigbee Alliance, and are actively engaged with key players in 5G. We test interoperability across many industries including appliances, building systems, consumer electronics and vehicles.
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Testing and Training Solutions
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Teledyne LeCroy offers an broad array of testing services and educational training options. From advanced multi-day protocol training courses to device interoperability testing to calibration and testing service, Teledyne LeCroy offers valuable expertise, in-depth knowledge, leading edge testing solution, and top-notch engineers able help move your projects forward. Whether you need your team to come up to speed on the latest technology or you just need more hands getting your product tested and ready for market, we can help.
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Mobile and Wireless
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Our testing enables wireless interoperability between and within your devices. We keep your devices connected through interoperability testing for home and enterprise Wireless networks through our Wireless Testing Services. We ensure that devices work reliably by seamlessly connecting the components within your mobile devices through our MIPI Alliance testing efforts.
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Functional Testing Services
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We manage an in-house team of testing specialists having sufficient experience to perform quality functional testing activities.ImpactQA exhibits cross-browser & cross-platform testing capabilities together with the latest interoperability testing methods to assess functionalities across multi-faceted systems.Unlike other functional testing services, our testing model is loaded with adaptable properties to perform white-box testing and functional testing of Java and .Net applications.
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Integrated Solution for Digital Switching & Fiber Optics Operational Verification
VERTA
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When incorporated into defense/aerospace ATE, Verta enables reliable, error-free bus communication and interoperability tests to verify performance of high-speed, optically networked military weapon assemblies.
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Test Workflow Pro
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Test Systems
Test System
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Benchtop Automated Functional Test
midUTS
Functional Test
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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PXI Integration Platform
ATS-3100
Test Platform
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
