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PXIe-1092, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis
784781-01
PXIe, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis - The PXIe-1092 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and … measurement application requirements. The all-hybrid backplane enables excellent flexibility for instrumentation module placement by accepting PXI Express modules in every slot and PXI hybrid-compatible modules in up to seven slots. It also offers a Timing and Synchronization option that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. The chassis includes a peripheral expansion slot in Slot 10 to provide power only for multiple-slot wide modules.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Analog Bus Extension for PXI
ABex
The ABex (Analog Bus Extension for PXI) is an exceptional test platform that extends to accelerate productivity, development throughput and time to market. Applicable in various industries and technological fields, this platform covers complex test challenges anywhere on the production line.Due to its flexible system architecture with an analog bus backplane and terminal modules, the platform allows the integration of technology specific extensions and extremely short system set up times which result in a reduction of total system costs.
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PXIe-1088, 9-Slot (8 Hybrid Slots), Up to 8 GB/s PXI Chassis
784782-01
PXIe, 9-Slot (8 Hybrid Slots), Up to 8 GB/s PXI Chassis - The PXIe-1088 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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PLTS Measurement And Calibration
N19303B
The new Physical Layer Test System (PLTS) 2024 is the industry standard for signal integrity measurements and data post‑processing high-speed interconnects, such as cables, backplanes, PCBs, and connectors. Signal integrity laboratories worldwide have benefited from the power of PLTS in the R&D prototype test phase.
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PCIe 4.0 Test Platform
PXP-400A
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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PXIe-1082DC, 8-Slot, DC Power Supplies, Up to 8 GB/s PXI Chassis
782946-01
PXIe, 8-Slot, DC Power Supplies, Up to 8 GB/s PXI Chassis—The PXIe‑1082DC features a high-bandwidth backplane to meet a wide range of high-performance test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to four slots. The chassis supports DC inputs from 11 V to 32 V.
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PCIe 2.0 Test Platform
PXP-100B
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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PXIe-1092, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis
786991-01
PXIe, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis - The PXIe-1092 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and measurement application requirements. The all-hybrid backplane enables excellent flexibility for instrumentation module placement by accepting PXI Express modules in every slot and PXI hybrid-compatible modules in up to seven slots. It also offers a Timing and Synchronization option that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. The chassis includes a peripheral expansion slot in Slot 10 to provide power only for multiple-slot wide modules.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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21 Slot, 3U PXIe Chassis
GX7200 Series
The GX7200 Series mainframes are 21-slot PXI chassis that can accommodate up to 20 instruments as well as a PXI Express controller (an embedded CPU or a PXI bus expander interface such as the MXI). The backplane architecture supports Gen 2 PCI Express bus signaling and the use of both x1 or x4 system controllers. By offering a combination of PXI-1, Hybrid, and Express slots, the GX7200 offers users the ultimate in flexibility for general purpose as well as high bandwidth test needs.
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PXIe-1095, 18-Slot, Up to 24 GB/s PXI Chassis
783882-01
PXIe, 18-Slot, Up to 24 GB/s PXI Chassis—The PXIe-1095 features a high-bandwidth backplane and 58 W of power and cooling in every slot to meet a wide range of high-performance test and measurement application needs. The chassis incorporates two hot-swappable power supplies to improve the mean time to repair (MTTR) of the PXI system; it also offers an optional timing and synchronization upgrade that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to five slots.
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PCIe 6.0 Protocol Test Backplane
P5563B
The Keysight P5563B PCIe 6.0 Protocol Test Backplane provides a convenient means for testing PCIe 6.0 add-in cards with a self-contained portable and powered passive backplane. The P5563B provides power required for all combination of exerciser and analyzer with device under test.
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6U And 7U VPX 1 To 15 Slot Power & Ground Only Backplanes
101VPX6xxP-xxxx
Elma’s 6U / 7U VPX power and ground only backplanes provide a cost-effective way to design and test cards using the VPX architecture. The only assigned pins are for 3.3V, 5V and 12V power, and both ground and utility planes are defined.
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32-bit PCI Test Backplane
SKU-014-01
The 32-bit PCI Test Backplane was designed to support production testing/debugging of PCI-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into four 32-bit PCI slots via 7 ft CAT6 cable. The PCI backplane is a versatile platform that allows you to test up to 4 PCI boards at the same time, facilitates easy access to logic signals, provides hot-swap compatibility, and per-slot overcurrent protection.
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High Voltage, Continuity & Hipot, Cable & Wire Harness Test Systems
CableEye HVX, HVX-21
Fast ● Simple ● Precise
Advanced wiring analyzer scans for continuity (opens, shorts), miswires, resistance, capacitance, components (resistors, diodes, LEDs, capacitors) dielectric breakdown, insulation resistance, intermittent connections
HVX (Item 829) 1500 Vdc, 1000 Vac
HVX-21 (Item 829A) 2100 Vdc, 1200 Vac
For diagnostic and Pass/Fail Testing — Permits expanded testing (compared to models in our low voltage product line) for insulation resistance (IRI) and dielectric breakdown (DWV).
All CableEye testers are suitable for production, fault diagnosis, QC (Quality Control), assembly, and prototyping of standard or custom cables. Each combines test, fault location, design, documentation, labeling, and database storage in one instrument. Tests can be performed on long cables (with or without connectors) or no cables (e.g. connectors, backplanes, PCBs, components).
Standard Features & Benefits:- USB certified, PC-based tester for a versatile, fast, robust system with long life-cycle.
- Multilingual, dynamic, graphic-rich display (netlist & wiring schematic) provides clarity and speeds diagnostics.
- 128 Test Points, expandable to 1024 providing flexibility as your product line changes.
- User-selectable voltage to each connection group in the cable simplifies an otherwise complex process, accelerating testing.
- Programmable Ramp Up, Ramp Down, Dwell Time (same as Test Time), Trip Current, and Trip Delay (same as Soak Time) adds versatility.
- Current leakage detected during HV test phase provides a measure of insulation resistance up to 1 GΩ (HVX) and 5 GΩ (HVX-21) - any leakage current exceeding a preset limit reveals the presence of moisture, flux, or other contamination on exposed contacts.
- Real-time screening for intermittent connections for pinpointing elusive faults and improving quality.
- Automation scripting in a simple, intuitive language allowing non-programmers to reduce operator error by automating repetitive steps.
- Pop-Up Work Instructions. choose the exact amount of detail, imagery, language and automation you need to ensure your work instructions and tests are carried out flawlessly.
- Flexible tolerancing: optionally define as percentages or absolute terms, as well as asymmetrically (e.g. +0%/-10%) for improved yields.
- Barcode-tracking & archival data-logging to achieve error-proof test process and improved traceability & productivity.
- Print PASS/FAIL labels, test reports (with or without color wiring schematics/netlists) and log reports to satisfy ISO9000 reporting requirements.
- Compatible with laptop and touchscreen PCs for fieldwork and rack/off-bench mounting.
Includes:
CB29 board set (Item 759) for bare wire connections; comprehensive PC software with Database of >200 standard cables; 2 yr Product Support Subscription comprising Warranty, free tech support, and free software upgrades.
Select Add-On Options:
Hardware: 128-point Expansion Modules (attach to base); 4-Wire Kelvin Resistance Measurement, 1 mΩ at 1 A; Advanced Measurements; External Measurement Instrument Port (e.g. 10 GΩ Isolation at 100 V); Remote Control Connector for Deadman Switch; Environmental Sensor
Software: PinMap™ fixture editor, Connector Designer™ connector editor, or Autobuild™ guided assembly modules
camiresearch.com |@CAMI_CableEye |+1.978.266.2655 -
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3U VPX Development Kit
This development kit enables efficient 3U VPX backplane design and software verification.- 3U VPX architecture- One CPU blade, one GPU blade (optional), SOSA-aligned- 1TB NVMe pre-installed in CPU blade- Rear transition module(s) included- Test Frame with backplane pre-installed
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PXIe-1062Q, 8-Slot, Quiet, Up to 3 GB/s PXI Chassis
779633-01
8-Slot, Quiet, Up to 3 GB/s PXI Chassis—The PXIe‑1062Q is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. The NI PXIe‑1062Q has four PXI peripheral slots, one PXI Express slot with system timing capabilities, and two PXI Express hybrid slots that accept both PXI and PXI Express peripheral modules.
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Time Domain Reflectometers and S-Parameter Analyzers
The Teledyne LeCroy WavePulser 40iX and the Teledyne Test Tools T3SP15D are a perfect combination of complimentary products to serve the requirements on testing, validating and troubleshooting cables, backplanes, connectors, transmission lines on boards and interconnect.
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PXIe-1078, 9-Slot, Up to 1.75 GB/s PXI Chassis
781622-01
PXIe, 9-Slot, Up to 1.75 GB/s PXI Chassis—The PXIe‑1078 features a backplane that incorporates a PCI Express connection to every slot to meet a wide range of test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to five slots.
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Multi-Interface Test Backplane
SKU-047-01
The Multi-Interface Test Backplane was designed to support hardware and software designers who need to be able to plug in boards with different interfaces (into the host computer).
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6U cPCI / PXI / PXIe 6021 Full Size Chassis
The WIENER 6021 crate series can be outfitted with cPCI, PXI or PXIe backplanes to provide high performance chassis with highly reliable low-noise power supplies for these bus standards. Typical applications are data acquisition, beam line control and test instrumentation.
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PXIe-1085, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis
781813-01
PXIe, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis—The PXIe‑1085 features a high-bandwidth, all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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Electrical Receiver Conformance Test Application for IEEE 802.3bs/cd
M8091BSCB
IEEE 802.3bs receiver test application for 200GAUI-4 and 400GAUI-8, covering chip-to-module, chip-to-chip, backplane, and copper cable interconnects.
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14-Slot Combination PXIe Chassis
GX7100e Series
The GX7100e Series are 14-slot combination PXIe chassis that accommodate a 3U PXIe embedded controller or a MXI express controller as well as 3U & 6U PXI / PXIe insruments in 4U of rack space. The GX7100e’s unique format includes seven 6U slots and seven 3U slots arranged horizontally to reduce the overall size of the chassis, providing the versatility and high-density necessary to address many PXI / PXIe applications and requirements. The backplane architecture supports Gen 2, 4x4 PCI Express bus signaling and the use of both x1 or x4 system controllers. By offering a combination of PXI-1, Hybrid, and Express slots, the GX7100e offers users the ultimate in flexibility for general purpose as well as high bandwidth test needs.
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PXI Power Supply Modules
Fixed power supply modules provide you with up to four separate voltage outputs isolated from the PXI backplane. Any combination of 3.3V, 5V, 12V or 15V can be specified with a maximum current capability of 4A for the 3.3V option; the software provides on/off control and status monitoring for each output. Dual programmable power supplies are capable of supplying up to 60 Watts of power. These are ideal solution for applications where a self contained test system with a high power supply power capability is required in a PXI format.
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PXIe-1071, 4-Slot, Up to 3 GB/s PXI Chassis
781368-01
PXIe, 4-Slot, Up to 3 GB/s PXI Chassis—The PXIe‑1071 is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. Its compact and lightweight form factor is ideal for minimizing the footprint of your installation, making it ideal for desktop or portable use cases. The PXIe‑1071 accepts PXI Express modules or standard PXI hybrid-compatible modules in every peripheral slot.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
