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Communication Test Set
Eye-BERT 100G
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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ACCUplace BullsEye /Recognition Grid
AP-B Series
A unique concept in imaging calibration technology, The ACCUplace Bulls Eye / Recognition Grid allows the end user to calibrate magnification at multiple power levels, as well as test the system’s ability to recognize and locate distinctive shapes within shapes by focusing on the concentric circles.Each Bulls Eye / Recognition Grid target has individual patterns consisting of 5 concentric circles with 0.50mm line width and 0.50mm spacing between circles (10mm Pitch) with a 0.100mm center dot. In addition, each row and column is labeled with X & Y coordinates. The AP-B series is offered on four standard substrates; Chrome on Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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MPI PCB Probe Systems
MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Up to 3.2GHz, DB9 Male Fibre Channel Loopback Tester
F9M-LPBK
This premium loopback tester support speed of up to 3.2GHz and certified to pass the eye-pattern test.
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4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector
CA9806
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
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Rasterizers
LV7300
LV7300 is a 1U half rack size rasterizer. It is compact but supports eye pattern measurement up to 12G-SDI.
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Test Solution
Eye-BERT MicroX
The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Synthesized Clock Generator
CG635
Stanford Research Systems, Inc.
The CG635 generates extremely stable square wave clocks between 1 µHz and 2.05 GHz. The instrument''s high frequency resolution, low jitter, fast transition times, and flexible output levels make it ideal for use in the development and testing of virtually any digital component, system or network. Clocks from 1 µHz to 2.05 GHz. Random jitter <1 ps rms. 16 digits of frequency resolution. 80 ps rise and fall times. CMOS, PECL, ECL, LVDS & RS-485. Phase control and time modulation. PRBS for eye-pattern testing. OCXO and rubidium timebase.
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12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector
CA9806-12
The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
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Oscilloscopes
Anritsu sampling oscilloscope is an ideal solution for Eye pattern analyses and Eye Mask tests. In addition, The excellent performance and high sampling speed reduce measurement times and help hold-down equipment costs.
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Up to 3.2GHz, HSSDC 8Pin Male Fibre Channel Loopback Tester
F8M-LPBK
This premium loopback tester support speed of up to 3.2GHz and certified to pass the eye-pattern test. (Connector: HSSDC 8Pin Male).
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PXIe-6571, 1-Slot, 100 MVector/s PXI Digital Pattern Instrument
786320-01
1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.
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Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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Pattern Generator
S-113
The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.
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PCBA Pattern Analyzer
A222918
The test method in the PCBA mainboard production line today mainly depends on the operator judgment. It is "subjective" testing and the accuracy decreased when the operator works for a long time.
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Accessory for Test Chest 3G Facilitating 'EYE' Analysis
EYE~POD
Designed to interface with Murraypro's Test Chest 3G, the EYE~POD accessory module extends monitoring capability to include SDI envelope parameters from SD through to 3G. Users receive immediate visual indication of the quality of an SDI input signal with regard to both overall signal amplitude and Jitter. Drawing power from TC3G, the coupled-combo may be used on local battery power, or supported with an external mains PSU
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Multistandard Test Pattern Generator
TRF-950
TRF-950 is universal multistandard equipment suitable for analog TV systems and digital video. This generator supports all analog standards (PAL, SECAM, NTSC) and substandards. Digital output offer DV601/656 signal. Generator is installed in low profile case suitable for desktop use as well as for use in Rack 19" stand.
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ACCUplace Land Pattern Kit
APKIT-1
APPLIED IMAGE, in conjunction with Hewlett Packard Corp., has developed a unique, and extremely accurate, pick & place target set designed to check for accuracy and repeatability of your robotic system quickly and easily.
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PRBS Pattern Generator
PRBS Generator
– Internal variable-frequency clock source– Wide operating range, from 10 Gb/s to 28 Gb/s– Small size – 94 x 60 x 20 mm3– Multiple output PRBS patterns– Differential outputs
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Eye P.A.
Eye P.A. enables easy multi-channel 802.11ac packet capture and analysis, making Wi-Fi traffic easy to visualize. At a glance, you can find retries, monitor channel usage, minimize congestion, and shed light on network design and configuration issues.
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PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Pattern Conversion
Wave Wizard
Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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Test Pattern Generators
Video Test Pattern Generator, Portable Monitor Tester, Test Video Audio Signals, HDMI, DVI, SDI, Component Video, HDCP
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Multi-Function Digital Pattern Generator & Logic Analyzer
GP-241xx Series
Multi-function PC digital interface for digital IC and embedded system testing and debugging.
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ACCUplace Grid Indexing Pattern
AP-G Series
Ensuring precise motion and positional accuracy is critical for a number of video analysis systems and automated measuring instruments. The AP-G series is ideally suited for calibrating such elements, in addition to its uses in determining stage squareness, and travel distance image analysis and visual inspection systems where precise motion must be calibrated and measured. All AP-G targets have number/letter indexed columns and rows for easy calibration and are offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Beam Pattern Measurement System
BP100
The BP100 is purpose-made for luminous intensity measurement of lamps, using a diffusely transmitting screen to provide a flat image that can be measured by an imaging photometer. This is a low cost, versatile solution in comparison to the traditional method of measuring lamp properties as a function of angle of emission, using Goniometers that are often costly and dedicated for one specific measurement.
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Video Pattern Generators
A full featured DisplayPort pattern generator. It enables the engineer to define the video timing and the used pattern in full detail. Since both timings and patterns are maintained in he controlling PC, the amount of stored timings and patterns is unlimited.
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Pattern Region of Interest Analysis System
PRIAS
PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
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Pattern Generators
Active Technologies Data Pattern Generators offer a complete and unique portfolio of instruments to address a wide range of applications starting from Digital Logic and Semiconductors characterization, Aerospace & Defense compliance testing, Mixed Signal Systems testing to Signal Integrity experiments.
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DSR Pattern Editor Software
M9192A
The Keysight M9192A DSR Pattern Editor Software adds additional advanced capability to the Keysight M9195A/B PXIe digital stimulus/response (PXI DSR) modules by providing a graphical user interface for the development system. M9195A/B error log files can be dragged-and-dropped into waveform editor which speeds up the debugging of tests; this gives immediate visibility of discrepancies between the expected state in the ATE patterns with that of the DUT.
