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Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
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EBSD Detector
Symmetry
Electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the micro structural properties of crystalline materials. A high performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality. Symetry is Over 3000 indexed patterns per second (pps). Up to 30x faster than existing CCD-based detectors. Extreme sensitivity for low current and low kV analyses. Megapixel resolution for HR-EBSD applications. High resolution patterns (at least 156 x 128 pixels) at all speeds.
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Thermal Imaging Sensor
3550 FC
Condition monitoring sensor to visualize thermal patterns on multiple assets. Maintenance managers can now collect a more comprehensive variety of key-indicator data — thermal imaging, voltage, current, temperature, and power — on critical equipment to build a real-time picture of an asset's condition. With the right mix of data all in one place, managers can implement planned maintenance and decrease the frequency of preventive rounds.
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Read-Write Analyzers
Guzik Read/Write Analyzers (RWA) work in conjunction with Spinstands to write data to the disk media and read back the signal for detailed analysis. We have two RWA-4000 series available for For Two Dimensional Magnetic Recording (TDMR) and non-TDMR technologies. The RWA 4000 series offer upto 8Gbit/sec maximum write data rate and 3.5 GHz analog bandwidth for all parametric measurements. Each RWA features a pattern generator with 1psec resolution of bit pre-compensation and supports PRML chip integration. Servo writing and processing is provided for Guzik Spinstand models. Select the pre-amplifier (UP14) as well as a variety of enhancements including programmable filters and PRML chip adapters.
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Digital Flight Control Computer
The Digital Flight Control Computer is a Quadruple Redundant Flight Control Computer designed by DRDO and ADE and manufactured by Bharat Electronics Limited. Data Patterns has designed and manufactured the Automated Test Equipment required for the validation of this DFCC.
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Reticle Manufacturing
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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NRZ Bit Error Rate Tester
Shenzhen Golight Technology Co.,Ltd
BERT integrates pulse pattern generator(PPG) and high sensitivity error detector(ED) to achieve the error rate measurement of data transmission in high speed communication. BERT can support multi-channel output and input and output polarity upset. It provides a best solution for the automated production test of the high speed optical transceiver.
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Cots Boards
Built in strict adherence to open architecture standards, Data Patterns designs COTS module products which are used in today's rugged applications and automatic test equipment platforms. Open standard form factors include cPCI, FMC & XMC, IP, MM, PCI, PCMCIA, PMC, VME, VPX and VXI.A portfolio of 'Off the Shelf ' products for testing and on-board applications have been developed by Data Patterns. COTS boards developed have been sold to many customers, in India as well as Europe and North America. They are used for system level products such as Automatic Test Equipment, Rugged Military Electronics, etc.Data Patterns focus on building COTS product is to provide the technological capability to develop system level products with very fast run around times. Use of Data Patterns' COTS module in system level products ensures Data Patterns ability to maintain the products for a significantly longer life cycle. The proximity to the system level engineering team with the COTS development team ensures that end applications are delivered faster, enabling a shorter time to market for the customers
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8-Channel, 200MHz, 512Kb/channel, Data/Pattern Generator
Acute TD3008E
Model / Data Channel / Event Channel / Pattern DepthTD3008E / 8 / 3 / 512Kb/chTD3116B / 16 / 3 / 1Mb/chTD3216B / 16 / 3 / 256Mb/ch
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AC Event Data Loggers
The Track-It™ AC Event Data Logger is a battery powered stand alone compact data logger that records up to 64,000 on/off cycles. Use the Track-It™ AC Event Data Logger to monitor cycle patterns of pumps, blowers and other electrical equipment powered by 120 or 240Vac.
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RF
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and an attitude to utilise the latest technologies.
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Flat Panel Display Test Solutions
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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VXI
VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in the industry today.Further enhancements of functional capabilities are achieved by the use of VXI IP carriers and VXI M Module carriers. This extends standard functions available from Data Patterns in these mezzanine architectures to the VXI platform.
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PXIe-6536, 32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module
779988-01
32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module—The PXIe‑6536 can continuously stream data over the PXI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Avionics Data Bus Tester
Distributed CORVUS
Distributed CORVUS works in conjunction with CORVUS-300 to isolate bus anomalies and fault resolution. The Transmit unit, C-9235-TX, sends 1553 like data pattern through a bus stub and coupler to the Receive unit, C-9235-RX, on another stub. This will measure insertion loss, possible bit errors and correct polarity. The Receive unit can also be used to give a digital scope representation of the active data bus showing signal quality and peak to peak amplitude.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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CMOS/CCD Production Test System
System 1828
The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Communication Test Set
Eye-BERT 100G
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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Telemetry Simulators & Test Transmitters
Command Data Telemetry Simulators offer a dynamic way to create or change a PCM data stream on a word by word basis on the fly. This PCM data stream can be used to modulate an FM or SOQPSK RF output at S-Band or L-Band. In addition to simulating a new telemetry stream, the telemetry simulators can play back and loop an archived data file (which can also be changed on the fly) or create pseudo-random patterns.
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Non-contact Ultra-High Range Sheet Resistance Measurement System
CRN-100
*Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting*Mapping program software;*1. Arranged in a multipoint pattern measurement is programmed*2. 2-D & 3-D mapping software*Easy operation by Windows 7 system software*Measurement data base link with Excel via CSV format file*Unaffected by contact resistance
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RF & Microwave
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and attitude to utilise the latest technologies.An in-house manufacturing capability and an insatiable demand for fulfilling requirements of Radar, Electronic Warfare and Communication domains, Data Patterns has developed a whole line of building blocks including TR Modules, Up and Down Converters, Power Amplifiers, Transmitters, Combiners and Dividers for specific requirements. A list of products is given below.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Delay Pattern Generator (six-channel Pulse Generator)
DG-8000
*Seamless change: The frequency, pulse width, and other settings can be seamlessly changed during oscillation.*Tracking function: Parameters can be changed at the same time for each channel.*Operation pattern control: The operation pattern option enables continuous operation testing.*Synchronization of multiple generators: The quick synchronization option enables three generators (18 channels) to synchronously output data.
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Simultaneous Multi-Surface Test Interferometer
VeriFire MST
Simplify the complex – multiple surfaces create complex fringe patterns, the Verifire™ MST uses patented wavelength-shifting technology to acquire phase data from multiple surfaces simultaneously. Report key metrics from individual surfaces of parallel windows, transmitted wavefront, as well as precise surface-to-surface information like total thickness variation (TTV), wedge and even material inhomogeneity.
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Portable PD Monitoring of Medium and High Voltage Power Equipment with UHF, AE, and HFCT
PDiagnosticM
Power Monitoring and Diagnostic Technology Ltd.
The PDiagnosticM is a portable system that utilizes UHF, AE, and HFCT sensor modules to monitor PD signals from Medium and High Voltage power equipment.The system is ideal for monitoring critical power assets to find and monitor intermittent PD signals and to analyze the developing PD trends. The PD type is determined by automatic pattern recognition and internal defects can be found at an early stage.The system provides advanced protection with alarm functions and our Deep Learning data analysis capabilities utilizing our proprietary Intelligent Cloud Diagnostic Technology.
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PXI Digital Pattern Instrument
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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CPCI
Modules in compact PCI from Data Patterns are available for Data Acquisition and Control, Simulation, Communication Automatic test equipment, Rugged systems, Fail-safe systems, Computer controlled logic controls, Plant automation and similar requirements. Other I/O functions available from our IP and Mezzanine Module families can be directly integrated into our cPCI systems.Data Patterns has also pioneered cPCI derivatives such as 9U High Voltage systems, Multiple backplane support with Hot Standby Switchover capabilities. Continuous innovation enables MMI options such as CRT & LCD displays, Keyboards, Pointing devices, Finger print security devices and so on.
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Cable Testers
Passage test:Detects open wires, short circuits and faulty wiring. Pass / fail test using a given pattern cable. Finding intermittent connections.Save cable data for documentation purposes. Print wiring diagrams. Printing labels. Log and print error logs.Graphical representation of the wiring of cables, graphical comparison of two cables. Easy, intuitive, graphical tracking of individual wires of a cable.Quickly install quick-mount boards for a variety of connector types such as BNC, RJ45, Sub-D, flat-ribbon connectors, and many more.Easy connection to the PC via USB .Light Director System:LED-led assembly of connectors. Optional also with voice output. High degree of safety due to fault checking during assembly.
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80Gbps Video Analyzer/Generator for DisplayPort 2.0 Testing
M42d
The Teledyne LeCroy quantumdata M42d Video Analyzer/Generator provides functional and will support compliance testing for video, audio and protocol of DisplayPort 2.0 and DisplayPort 1.4. The M42d supports legacy DisplayPort lane rates of 1.62, 2.7, 5.4, 8.1 Gb/s and the new DP 2.0 higher speed lane rates of 10.0, 13.5, & 20.0 Gb/s data rates with the new line coding—128b/132b. The protocol analyzer provides a snap shot status view and deep analysis using captures of incoming DisplayPort 2.0 streams from source devices including DSC/FEC compressed streams. The M42d’s video generator can be used for testing silicon as well as devices such as displays, USB-C adapters, extenders, etc. The video generator offers a large library of standard video timings and test patterns necessary for testing next generation high resolution displays.
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USB Reusable Temperature and Humidity Data Logger
This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports are analyzed to identify trends and patterns, and management decisions can be made to improve practices in areas such as processing and cold chain logistics. Data is easy to archive for record keeping, audits, and compliance with FDA, CDC, HACCP, FSMA and other regulatory requirements.
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Clock Drivers
Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.
