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Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
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Pin-Line™ Collet Socket with Wire Wrap Pins
Series 0503
Pin-Line Collet Sockets with Wire Wrap Pins. Features: Rows of socket strips may be mounted on any centers and are end-to-end or side-by-side stackable for .100 [2.54] grid or matrix patterns. Available with wire wrap or solder tail pins. Consult Data Sheet No. 12013 for solder tail pins. Break feature allows strips to be cut to the number of positions desired.
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Communication Test Set
Eye-BERT 100G
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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NRZ Bit Error Rate Tester
Shenzhen Golight Technology Co.,Ltd
BERT integrates pulse pattern generator(PPG) and high sensitivity error detector(ED) to achieve the error rate measurement of data transmission in high speed communication. BERT can support multi-channel output and input and output polarity upset. It provides a best solution for the automated production test of the high speed optical transceiver.
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VME64x IP Carrier Module
DP-VME-5121
Data Patterns DP-VME-5121 VME IP carrier board is a 6U VME bus card that provides an electrical and mechanical interface for four industry standard IP modules. The board provides full data access to the IP modules I/O, ID and memory spaces. The programmable registers are used for configuring and controlling the operation of IP modules.Each IP module supports two interrupt requests. The VME bus interrupt level is software programmable. The software configured interrupt modes are:a.Single level interrupt mode: All IP module interrupts can be mapped to a single VME bus interrupt level.
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VXI
VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in the industry today.Further enhancements of functional capabilities are achieved by the use of VXI IP carriers and VXI M Module carriers. This extends standard functions available from Data Patterns in these mezzanine architectures to the VXI platform.
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Cable Testers
Passage test:Detects open wires, short circuits and faulty wiring. Pass / fail test using a given pattern cable. Finding intermittent connections.Save cable data for documentation purposes. Print wiring diagrams. Printing labels. Log and print error logs.Graphical representation of the wiring of cables, graphical comparison of two cables. Easy, intuitive, graphical tracking of individual wires of a cable.Quickly install quick-mount boards for a variety of connector types such as BNC, RJ45, Sub-D, flat-ribbon connectors, and many more.Easy connection to the PC via USB .Light Director System:LED-led assembly of connectors. Optional also with voice output. High degree of safety due to fault checking during assembly.
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PCIe-6536B, 32-Channel, 25 MHz, 100 MB/s Digital I/O Device
782630-01
The PCIe-6536 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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PXI Digital Waveform Instrument
PXI Digital Waveform Instruments feature up to 32 channels, can sample and generate digital waveforms at up to 200 MHz, and interface with various standard TTL and low-voltage differential signals (LVDS), as well as settable voltage levels. These devices offer per clock cycle, per channel bidirectional control, and phase shifting. They include deep onboard memory with triggering and pattern sequencing. Some models also support doubledatarate (DDR) technology and real-time hardware data comparison. You can use Digital Waveform Devices to create device simulation and complex stimulusresponse tests.
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8-Channel, 200MHz, 512Kb/channel, Data/Pattern Generator
Acute TD3008E
Model / Data Channel / Event Channel / Pattern DepthTD3008E / 8 / 3 / 512Kb/chTD3116B / 16 / 3 / 1Mb/chTD3216B / 16 / 3 / 256Mb/ch
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Reticle Manufacturing
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Central Office Line Simulator
AI-7280
The AI-7280 is a highly flexible central office line simulator. It is designed primarily for the testing and verification of common terminal equipment, including standard telephones, Caller ID devices, SMS (Short Message Service) capable equipment, and any device using an analog Tip/Ring interface circuit. Supplied with the TRsSim software for Windows, it can analyze a telephone''s DTMF characteristics, pulse dialing and flash timing, generate various network tones and ringing patterns. Both Type I (on-hook) and Type II (off-hook) Caller ID is supported using either FSK or DTMF data transmission. As an optional component, the TRsSim software can perform SMS testing to either the ETSI protocol 1 or protocol 2 standards.
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Windows Driver & SDK for ADLINK USB DAQ Series Data Acquisition Modules
UD-DASK
ADLINK DASK drivers are the device drivers for custom data acquisition applications for Windows. The DASK driver libraries provide API sets for ADLINK PCI ExpressR, PCI, CompactPCI, PXI and USB data acquisition cards, to access full hardware functionalities, such as buffered/double-buffered data acquisition, pattern generation, digital input/output and etc. For novice users, the built-in CodeCreator utility helps you create your first program in just a few minutes.
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Optical & Electrical Data/Pattern Generators
The Data/Pattern Generators offer both electrical and Optical outputs with standard and custom data patterns. PPG products cover data rates ranging from 100 Mb/s to 28.05 Gb/s.
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Cots Boards
Built in strict adherence to open architecture standards, Data Patterns designs COTS module products which are used in today's rugged applications and automatic test equipment platforms. Open standard form factors include cPCI, FMC & XMC, IP, MM, PCI, PCMCIA, PMC, VME, VPX and VXI.A portfolio of 'Off the Shelf ' products for testing and on-board applications have been developed by Data Patterns. COTS boards developed have been sold to many customers, in India as well as Europe and North America. They are used for system level products such as Automatic Test Equipment, Rugged Military Electronics, etc.Data Patterns focus on building COTS product is to provide the technological capability to develop system level products with very fast run around times. Use of Data Patterns' COTS module in system level products ensures Data Patterns ability to maintain the products for a significantly longer life cycle. The proximity to the system level engineering team with the COTS development team ensures that end applications are delivered faster, enabling a shorter time to market for the customers
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80Gbps Video Analyzer/Generator for DisplayPort 2.0 Testing
M42d
The Teledyne LeCroy quantumdata M42d Video Analyzer/Generator provides functional and will support compliance testing for video, audio and protocol of DisplayPort 2.0 and DisplayPort 1.4. The M42d supports legacy DisplayPort lane rates of 1.62, 2.7, 5.4, 8.1 Gb/s and the new DP 2.0 higher speed lane rates of 10.0, 13.5, & 20.0 Gb/s data rates with the new line coding—128b/132b. The protocol analyzer provides a snap shot status view and deep analysis using captures of incoming DisplayPort 2.0 streams from source devices including DSC/FEC compressed streams. The M42d’s video generator can be used for testing silicon as well as devices such as displays, USB-C adapters, extenders, etc. The video generator offers a large library of standard video timings and test patterns necessary for testing next generation high resolution displays.
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Artificial Intelligence And Machine Learning Testing
AI and ML testing framework can efficiently recognize pitfalls and with constant updates to the algorithms, it is feasible to discover even the negligible error. Essentially, Artificial Intelligence (AI) and Machine Learning (ML) tech are well-trained to process data, identify schemes and patterns, form and evaluate tests without human support. This is made possible with deep learning and artificial neural networks when a machine self-educates based on the given data sets or data extracted from an external source such as the web.
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PCI Fault Insertion Switch Range for Differential Serial Interfaces
50-200/201
Pickering Interfaces, a leading supplier of modular signal switching for electronic test and simulation, is expanding its range of PCI Fault Insertion switching with the introduction of two new modules (models 50-200 and 50-201) designed for use with differential serial interfaces. PCI Fault Insertion Switch Cards for Differential Serial InterfacesThe new modules include the Differential PCI Fault Insertion Switch (model 50-200) which is designed for lower data rate serial interfaces such as CAN and FlexRay, and the High Bandwidth Differential PCI Fault Insertion Switch (model 50-201) which is designed for higher data rate serial interfaces such as AFDX and 1000BaseT Ethernet. Each module allows the introduction of fault connections that include data paths open, data paths shorted together, and data paths shorted to externally applied faults such as power supplies and ground. The software driver defaults to a protective mode where conflicting faults are prevented to avoid accidentally shorting unintended paths, such as power to ground. A separate mode allows complete freedom in setting fault patterns.
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PCIe Fast Digital Waveform Acquisition/Pattern Generator - 32 Digital I/O Channels, 1 kS/s up to 125 MS/s Sampling Speed
M2P.7515-X4
The M2p.75xx series of fast digital I/O cards allow to acquire or replay digital patterns with a programmable speed of up to 125 MS/s. The direction can be switched by software between input (digital data acquisition) and output (digital pattern generation). The on-board memory of 1 GByte can be completely used for digital pattern. Furthermore the on-board memory can be switched to a FIFO buffer allowing to continuously stream data in either output or input direction.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Test Pattern Generator Delay & AV Sync Analyzer
VQDM-100
Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QC Instant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurement Multi-channel time-line analysis, including video frames continuity testing 4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels) 2 channels of AV timing analysis, simultaneous measurements of Video and Audio Latencies Real time multi-channel data acquisition via USB port Unique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL page Source of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ Analyzers Multi-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audio Networkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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FMC, XMC & PMC
The FPGA Mezzanine Card is used by Data Patterns to implement signal interface with external world compatible FPGAs mounted on the FMC carrier there are primarily used for high speed analog interface for digitization (ADCs) and waveform generation (DACs). This form factor is also utilized for special I/O Interfaces such as various avionic protocols and buses. FMC I/O signals may be routed via front panel connectors or through Mezzanine connectors that route the signal back to the carrier board for routing through rear I/O of the Chassis. The system interface is designed for routing to FPGAs using a VITA 57 0.05 Pitch Terminal Array Assembly.
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Compact Anechoic Chambers
If you have mmmwave or THz antenna phased-array that require Over the Air measurements, MilliBox has the equipment and tools that you need. With the help of MilliBox compact anechoic chamber system, you can plot radiation pattern , collect data from those plots, and assess your antenna performance easily and precisely.
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Ocean Surface Monitor
Current Monitor™
sigma S6 Current Monitor™ is a radar-based monitoring system that delivers ocean surface current data from moving stations and both current and bathymetry from fixed locations with high spatial resolution. This greatly improves the management of marine-based activities such as predicting oil slick drift patterns, enhancing navigational safety, and protecting vulnerable coastlines.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Renewable Energy Loggers
Data Loggers measure AC & DC circuits for Renewable Energy installations. Record directional flow of current, determine patterns when your system is importing or exporting to the grid.
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PCIe-6535B, 32-Channel, 10 MHz, 40 MB/s Digital I/O Device
782629-01
The PCIe-6535 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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32-CH 80 MB/s High-Speed Digital I/O Card
PCIe-7300A
ADLINK PCIe-7300A is an ultra-high-speed digital I/O card. It consists of 32 digital input/output channels. High performance designs and state-of-the-art technology make this card ideal for a wide range of applications, such as high-speed data transfer, digital pattern generation and digital pattern capture applications, and logic analyzer applications. Trigger signals are available to start the data acquisition of pattern generation.
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Infrastructure
dsTest
dsTest offers server emulation and client simulation capabilities for comprehensive testing of 3GPP core network interface functionality and performance. Select the interfaces required to accomplish your testing goals–surround a network element with client simulators that simulate client activity, or provision a server emulator with the interfaces necessary to support end-to-end testing, test agents and proxies using both client simulation and server emulation. Test your LTE, EPC, eMBMS, SMS, WLAN Offload, VoLTE and CIoT networks, or gather Big Data to support the identification of patterns and that will provide new business opportunities, revenues, and efficiencies to network operations.
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PXIe-6535, 32-Channel, 10 MHz, 40 MB/s PXI Digital I/O Module
780695-01
32-Channel, 10 MHz, 40 MB/s PXI Digital I/O Module—The PXIe‑6535 can continuously stream data over the PXI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
