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Primary Injection Test Systems
Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
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Single-phase Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations. It is further necessary that these expanding testing capabilities be met with a similar improvement in the simplification of a test instrument’s user interface and software control.
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Mobile Testing Power Supply(Microamp)
M8831
M8831 Power supply, a new generation of programmable linear power supply, are designed with high speed dynamic programming output(Voltage 0-30V, 1ms rising time), high current accuracy (0.001mA resolution) and low internal resistance, which can satisfy all the test requirements. The combination of bench-top and system features in these power supplies not only make it possible to option into other equipments, but also make it possible for users to edit program by panel keyboard, which will bring much convenience to users. Meanwhile, the voltage level switch works without relay, which will cause the fast switch between high voltage and low voltage. Moreover, M8831 powr supply provides the best solutions for cellphone research, micro-electronics lab,research institue and special users requiring power supply with low current buthigh accuracy .
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Temperature Forcing System
Wewon Environmental Chambers Co, Ltd.
Wewon Technology specializes in the research, development, production and sales of laboratory testing equipment system services. Through more than ten years of accumulation in the field of equipment, the business of wewon Tech is mainly divided into three fields, namely optical communication, automobile and new energy industry.Specialized equipment from Wewon Environmental Chambers Co., Ltd. includes thermal stream instrument, environmental chambers, walk in chamber, salt fog test chamber, vibration testing machine, xenon lamp aging tester, ultraviolet weather testing equipment, tensile testing machine and various IP protection level test equipment. The system characteristic of Wewon Tech thermal stream temperature test system as below technical parameters mentioned.https://www.wewontech.com/temperature-forcing-system/
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PXIe-6547 , 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
81011-03
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Test Cell Vibration Monitoring System
The Test Cell Vibration Monitoring System is a complete package for monitoring dyno vibration levels generated during engine testing. This system was design to prevent catastrophic dyno failures.
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Portable Telemetry Systems
Lumistar’s portable receivers and test transmitters take the state of the art technology found in the PCI receivers and simulators and install it into a hand held units. Our luggable Telemetry Systems can be configured using our card level products into unique custom solutions.
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PSG RF Analog Signal Generator, 100 kHz to 9 GHz
E8663D
Tackle demanding radar & satcom measurements with metrology-grade performance, including high output power & superior level accuracyUse as an ideal reference in phase noise test systems or for analog-to-digital converter testing with the lowest phase noise in a commercial sourceCharacterize devices & circuits by adding AM, FM, M & pulse modulation to your signalImprove existing test system performance: E8663D is built on the outstanding legacy of the 8663A & is fully code compatible
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68 Pin VHDCI Connector & Cable Accessories
These 68 Way VHDCI connectors & cables provide a high-density 0.5A solution that is suitable for use to 30Vac. We have developed this range of standard connection solutions to simplify the task of integrating products into a test system, the high density and skill levels involved in terminating this connector mean that we strongly recommend that you use our connection solutions. This category of connectors are not compatible with our products, however, are offered for developing a connection solution for use with other vendor’s products. You can also try our Cable Design Tool to graphically design a customized cable assembly.
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2-port Battery Portable Passive Intermodulation Analyzer - iXA Series
iXA
The Kaelus iXA Series Passive Intermodulation (PIM) analyzer is a dual-port, battery powered PIM Test Analyzer. It supports multiple test scenarios such as testing at the top of the tower, the base of the tower, rooftop, in-building for DAS systems and external PIM Finding.No other PIM tester has ever been integrated to this level! The iXA includes a network of electronic switches to change from one-port to two-port measurement seamlessly. In addition, with integrated Range-to-Fault (RTF) on each port, the user can first troubleshoot the system for internal PIM. Then, without reconnection, the user can progress with the external PIM process, making the entire process much more efficient.With integrated RTF on each port, the user can collect four times more range-to-fault data than the standard 1-port PIM Finder solution. Thus, the user can easily locate and swiftly eliminate the strongest PIM source.
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Ruggedized Ethernet Data Acquisition Systems
Series 7000
The Series 7000 Ruggedized Ethernet DAS brings new capabilities and levels of performance to transducer data acquisition. The ruggedized system is designed for installation in wind tunnels, engine test stands and other facilities where it is desired to locate the DAS on or near the test article, reducing installation and cable costs while improving signal quality and reliability. Each unit is a network appliance which conditions, amplifies and digitizes outputs from transducers. Multiple units are easily combined and distributable for larger installations. Real-time temperature Compensation of gain offset and Excitation Voltage, quality signal conditioning with high gain and a 24-Bit A/D per channel provide a high accuracy and high resolution DAS that will perform across a wide operating range.
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Test Automation System
RT-Tester
Verified Systems International GMBH
Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
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MXG X-Series Microwave Analog Signal Generator, 9 kHz to 40 GHz
N5183B
Get a fast, compact (2U) alternative to the PSG in the lab, depot or fieldAddress demanding tests of radar modules & systems with near-PSG levels of spectral purityCompensate for system loss & drive high-power amplifiers: +19 dBm output power, -55 dBc harmonics & -68 dBc spurious @ 20 GHzReduce calibration time with switching speed 600 sSimulate narrowband chirps & radar antenna scans with up to five internal function generators that can be used with AM, FM, OM pulse modulation
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PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-02
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Micro Ohm Meter 200A
Micro Centurion II
Raytech Digital Micro ohm meter, Micro-Centurion II, was designed for high degree of accuracy to measure very low resistances. This technology was then packed into a portable test system to be used by apparatus manufacturers, rebuild shops, and electrical maintenance crews. This intelligent system has an easy to use operation screen, which allows quick selection of the current level and resistance level to be measured.
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FM Tokenless Transmitter & Receiver
MS 1522
Transmitter and Receiver units are designed to work at 24V DC voltage (nominal) with variation between 19.2 V to 28.8V. The system is designed to work with carrier frequency 1800/2700 Hz and modulated frequency 65Hz/85Hz. For 1800Hz Carrier Frequency RED border is used in Front Panel and for 2700Hz Carrier Frequency BLUE border is used in Front Panel. Maximum power consumed by transmitter and receiver are 1.2W and 8W, respectively. Sense level for receiver is less than –19 dBm and No sense level for receiver is more than –22 dBm with 1mw (0 dBm) transmitter power. The equipment is designed to work satisfactorily with temperature variation from 0°C to 55°C with relative humidity of 95% at 35°C. Suitable test points are provided in the back of the equipment to monitor the necessary parameters.
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±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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Advanced 3D Automatic X-Ray Inspection
V810 S2EX
V810 is "3D Automatic X-ray inspection System" that corresponds to the double side mounting SMT-PCB that is not able to be checked by a transmission-type X-ray machine. It has the ability to detect a wide range of defects, and It have 100% complete defect detection capability in the Hip-defective.And, it is the inspection machine of world's highest level that combines the ability of the ultra-fast test speed and the lowest false call positives further.
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Measurement, Communications & Testing
Process & Analytical Instruments division of AMETEK
Measurement Communications & Testing provides the design, integration and installation of critical communication systems, workflow, life-safety solutions and calibration instruments for temperature, pressure and process control. It also is a leader in level measurement devices, continuous position sensors, hardness testers, force measurement devices and retractable cord reels. In addition, it offers a line of weathering test instrumentation along with laboratory and outdoor testing services.
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Signal Level Meters
Wuhan Sunma Technology Co., Ltd.
Signal Level Meter is specially designed and manufactured for CATV system installation and testing. It‘s a portable instrument, easy to carry with many functions.It can test CATV signal level both at channel and frequency mode. Also it can measure CATV TILT,C/N, trunk cable Voltage, ect. The big character TN LCD clear1y displays all testing results. It especia1ly fit for CATV station as a professional measurement instrument. it can display 2 channels at the same time.
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Automated Shock Test Systems
AutoShock-II Test System
The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.
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Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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Primary Current Injection Testers
Primary Current Injection Tester is designed for testing protective relay and circuit breakers and also testing the turns ratio of current transformers at high variable currents. A test current is injected into the primary side of a system to determine how the system behaves at particular levels of current. This test makes it possible to determine whether the relay will trip and how long the current needs to flow before the trip is initiated.
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Zero Bias Schottky Detectors
Fairview Microwave’s line of coaxial packaged zero bias Schottky detectors feature matched inputs for excellent VSWR, voltage sensitivity levels that range from 100 to 500 mV/mW for small signal detection, negative video output polarity, and can withstand maximum input power levels up to +20 dBm CW. Operating temperature range covers 0°C to +90°C and storage temperature of -65°C to +125°C. These zero bias Schottky detectors utilize compact cylindrical package outlines that are made of passivated stainless steel and offer a variety of popular input/output SMA and BNC connector configurations that make them ideal for use with precision test and measurement, instrumentation, and subsystems assemblies. Numerous applications include power measurement, leveling pulsed signal sources, AM noise measurements, radar or missile guidance systems, monitoring system level performance, and pulsed RF measurements.
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Cots Boards
Built in strict adherence to open architecture standards, Data Patterns designs COTS module products which are used in today's rugged applications and automatic test equipment platforms. Open standard form factors include cPCI, FMC & XMC, IP, MM, PCI, PCMCIA, PMC, VME, VPX and VXI.A portfolio of 'Off the Shelf ' products for testing and on-board applications have been developed by Data Patterns. COTS boards developed have been sold to many customers, in India as well as Europe and North America. They are used for system level products such as Automatic Test Equipment, Rugged Military Electronics, etc.Data Patterns focus on building COTS product is to provide the technological capability to develop system level products with very fast run around times. Use of Data Patterns' COTS module in system level products ensures Data Patterns ability to maintain the products for a significantly longer life cycle. The proximity to the system level engineering team with the COTS development team ensures that end applications are delivered faster, enabling a shorter time to market for the customers
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High Voltage Battery Test System
9300 Series
NH Research, Inc. (NHR) has released the new 9300 series, a higher-voltage / higher-power version of its popular single-channel 9210 series battery test systems. The 9210 Series provided a 12kW power module operating at 40V, 120V, or 600V and which allowed paralleling with similar systems to increase the power, whereas the new 9300 system provides a 100kW power module with a software-selectable high voltage range (1200VDC / 167A) and high-current range (600VDC / 333A) allowing for efficient testing of single-voltage and double-voltage Electric vehicle (EV) batteries as well as high-voltage Energy Storage Systems (ESS) used in grid-tied applications. The 9300 further extends NHR’s family of high-power battery test and emulation capabilities which are ideal for analyzing a battery performance under xEV drive cycles and grid-storage profiles such as PJM and time-shifting profiles. Like the successful 9200 and 9210 systems, the 9300 modules are independent allowing for testing of multiple batteries, each with a different test plan, power levels and start/stop times. When higher power is needed, the 9300 modules may be paralleled providing 200kW, 300kW or up to 1.2MW capability. This modular power capability allows a system to be sized to the power levels needed today while ensuring expansion capability should additional power be needed in the future.
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Shock & Drop Testing
Shock testing is often performed as part of a hardware qualification or design process. Information obtained during shock testing can improve the survivability of products as well as verify that they will perform properly in service. These types of tests require special transducers and measurement systems to record and process the high level, high frequency response.
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Battery Extra Load Units
BXL Series
BXL is an extra load unit designed to be used with DV Power’s BLU series battery testers. However, this unit is a universal add-on device. Because of that, it is compatible, as an additional load, with any other discharge/capacity tester in the market.In case when discharge current exceeds the capacity of a single BLU device, BXL can increase the discharge capacity. There are no limitations on the number of extra load units that can be connected in parallel to the main battery tester.A system of BLU and BXL instruments enables performing the capacity test in an accurate, user-friendly way. Also, all instruments are in accordance with battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.These units can be used on any type of battery string, such as lead-acid, Li-Ion, Ni-Cd, etc. They test battery strings with voltages in the range of 5,25 – 500 V DC. On the other hand, current up to 250 A can be discharged through the BXL internal structure.The instrument simulates a constant resistance load during the discharge test. Several resistances can be set for different battery nominal voltage levels. This makes BXL extremely flexible in selecting its load capabilities.
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Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
