Filter Results By:
Products
Applications
Manufacturers
-
product
Digital Laser Beam Analyzer
ScienceGL offers economic laser beam profiling solutions for laser beam measurement, diagnostics and analysis. The Digital Laser Beam Profiler allows you to analyze laser output quickly and accurately at fraction of the market price. The profiler utilizes our advanced computer graphics engine for best visual perception of the beam in 3D realistic representation. Traditional 2D plot colored by the look up table (LUT) is also available.
-
product
M² Measurement Systems
Thorlabs' M2 Measurement Systems provide self-contained, turn-key solutions for measuring M2, divergence, focus diameter, waist position, Rayleigh length and other laser beam quality metrics. Pre-configured, factory-aligned systems covering wavelength ranges between 250 nm and 2700 nm are available. Choose from among systems that have a scanning-slit beam profiler, a camera beam profiler, or no beam profiler.
-
product
Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
-
product
Large Aperture Beam Profilers
Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
-
product
Specialized Beam Profiler Systems
DataRay offers specialized beam profiler systems. These systems offer solutions for complex applications. The large beam profiling system is suitable for beams up to 200 mm image area, and the line laser profiling system provides for direct measurement of line lasers up to 200 mm in length.
-
product
Fixed Wavelength CW Laser Source (FP) - PXI
Laser 1100 Series
The Laser-1102 is a Continuous Wave (CW) laser source offering high power 850 nm output into multimode fiber with stable output power operation.
-
product
Tunable Laser Source - MATRIQ
The Laser 1000 Series is a fully-compliant micro-ITLA laser with up to four channels in a compact benchtop form factor.Offering 0.01 pm resolution tunability across C or L bands, exceptional power accuracy up to 16.5dBm, and optional dither suppression, this is a versatile and cost-effective general purpose instrument.
-
product
PCI Three-Axis High Performance Laser Board with External Sampling
N1231B
The Keysight N1231B PCI Three-Axis Laser Board with External Sampling is a register based PCI bus board that implements three axes of laser interferometer measurement for position monitoring and closed-loop servo control. There are four external sample inputs along with four data hold inputs that allow easy synchronization with user systems. Several threshold compare registers, with both hardware outputs and interrupt capability, can be used for travel limit and in window or out of window detection functions. The dual mode hardware position outputs, controlled by the hold inputs, provide either a 32-bits/axis parallel interface or a 36-bit multiplexed interface to the 36-bit axis position data at rates up to 20MHz. The user can programmatically access the externally sampled position and velocity data, as well as software sampled position and velocity data, over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
-
product
PCI Three-Axis Laser Board
N1231A
The Keysight N1231A PCI Three-Axis Laser Board is a register based PCI bus board that implements three axes of laser measurement for position monitoring and closed-loop servo control. The hardware outputs, optimized for connection to a DeltaTau PMAC servo control system, provide parallel digital position data at rates up to 4MHz. The same position data along with velocity data is available over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
-
product
Fixed Wavelength CW Laser Source (FP) - MATRIQ
The Laser-1102 is a Continuous Wave (CW) laser source offering high power 850 nm output into multimode fiber with stable output power operation.
-
product
Tunable Laser Source - PXI
Laser 1000 Series
The Laser 1000 Series PXIe module is a Continuous Wave (CW), tunable laser source offering high-power output, narrow 100kHz linewidth and 0.01pm resolution tunability.With seamless PXI integration, it can be easily integrated into new or existing PXI test setups. Save space, lower your costs and improve testing efficiency while delivering reliable and repeatable results in production or research environments.
-
product
Beam Profiler
BladeCam Series
0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
-
product
UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
-
product
Fixed Wavelength CW Laser Source (DFB)
Laser 1200 Series
The Laser 1200 Series is a highly customizable fixed-wavelength Continuous Wave (CW) laser source available in a wide range of wavelengths and powers.With seamless PXI integration, it can be easily integrated into new or existing PXI test setups. Save space, lower your costs and improve testing efficiency while delivering reliable and repeatable results in production or research environments.
-
product
Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
-
product
Thermal Profiler
KIC K2
The latest-generation mobile-friendly profiling technologyThe KIC K2 Thermal Profiler features a compact and robust design that allows it to fit through the tight, heated chambers of lead-free reflow ovens. A plug-and-play hardware and graphical user interface makes profiling both quick and easy. The profile data measured by the K2 can now be viewed on either a PC or on a mobile device using the Profile Viewer App.
-
product
Laser Beam Positioning
Under the trade name of SpotOn we offer a wide variety of computerized position measurement systems.This is a family of cost-effective and versatile solutions to numerous industrial and laboratory applications.Among the measurement applications, are:Measure laser power and centration or displacementAlign beams and QC of optical systemsMeasure target rotation and displacementMonitor vibration, deflection and motion
-
product
Thermal Profiler
SPS Smart Profiler
The SPS Smart Profiler stands out as the best and “smartest” temperature profiling data collection system available. The hardware is the best in temperature tolerance design using an LCP (Liquid Crystal Polymer) enclosure for better protection and faster cool down between profiles. The design of the SPS thermal shields allows for easy and secure opening and closing, durability that meets the most stringent of drop tests, and temperature tolerance capabilities that exceed all previous KIC profiler and shield models.
-
product
Scanning Slit Beam Profilers
DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
-
product
Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
-
product
Extended SWIR Camera For Laser Beam Profiling
BPCam
Princeton Infrared Technologies, Inc.
The Princeton Infrared Technologies’ extended SWIR response T2SL BPCam SWIR camera for laser beam profiling supports extended SWIR wavelength response with TEC cooled operation.
-
product
Multibeam Profiler Sonar
MB2250-N/W
At 2.25 MHz, the MB2250 delivers 3D profile data at levels more akin to a laser line scanner than today's low frequency bathymentry systems. Mountable on Boats, ROVs, UUVs, and Tripods, BlueView's MB2250 is the right tool to take your operation into the next generation of 3D bottom and structure mapping.
-
product
Infrared Laser Diode Modules: 830nm-852nm, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
-
product
Beam Characterization
Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
-
product
Laser Diode Collimators, 520nm - 785nm, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths and power options are available. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete, cost-effective laser solutions.
-
product
Ice Profiler
Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
-
product
Beam Profiling System
BeamCheck
BeamCheck is an integrated laser measurement system designed to measure critical laser beam parameters for laser-based additive manufacturing systems BeamCheck includes a CCD camera for spatial measurements and a NIST-traceable power sensor that will provide a complete analysis of the laser power density profile.
-
product
Capacitors - Beam Lead
Macom Technology Solutions Holdings Inc.
MACOM’s MMI-9000 and 9100 Series Chip Capacitors feature high stand-off voltage and low dielectric loss leveraging nitride/oxide dielectric layers. Gold bonding surfaces, top and bottom provide ease of bonding and minimum contact resistance. MACOMs beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which are features that produce devices with excellent long-term stability.
-
product
Beam Lead Capacitors
Beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which allow for use in military and aerospace designs. Their robust performance and small form factor provide repeatable performance.
-
product
*Beam Propagation Analysis
M²
M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
