Product

Cryogenic Probe Station

FWPX

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Lake Shore Cryotronics, Inc.

FWPX - Lake Shore Cryotronics, Inc.

Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.

Product

Portable Manual Probing Station

Model W4.0 x L6.5

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D-COAX, Inc.

Model W4.0 x L6.5 - D-COAX, Inc.

This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.

Product

Enhanced Probe Station

EB Series

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EverBeing Int'l Corp

EB Series - EverBeing Int'l Corp

Comprehensive prober for DC and RF. The EB series contains features to step-up your usability to acquire the accurate data you need from your devices. It has a built in probe card slot.

Product

Probe Station

EPS300

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ECOPIA

EPS300 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided.

Product

Custom solutions

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NOVACAM Technologies, Inc.

NOVACAM Technologies, Inc.

Novacam develops custom interferometric solutions to address particular inspection and imaging needs of specialized applications and OEM markets. Our modular interferometer components offer a superior and cost-effective platform for developing high-performance systems and assemblies. We will collaborate with your application experts to devise the optimal combination of inteferometric (OCT) hardware, non-contact fiber-based sensor probes, and system software.As needed, Novacam engineers: develop customized optical probes and inspection stations develop inline probe fixtures for production environments adapt Novacam standard interferometer component modules to suit your application help integrate Novacam systems or components with third-party tools write customized software

Product

Semi-Automatic Probe Station

P300A

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Micromanipulator Company

P300A - Micromanipulator Company

The P300A probe station is the most stable, intuitive, and space efficient 300mm semi-automatic analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300A comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing.

Product

Cryogenic Probe Station

EMPX-HF

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Lake Shore Cryotronics, Inc.

EMPX-HF - Lake Shore Cryotronics, Inc.

The Lake Shore EMPX-H2 probe station enhances standard probe station capabilities with the addition of a ±0.6 T horizontal field electromagnet. All standard C-V, I-V, microwave, and electro-optical probing, plus in-plane horizontal field electromagnetic measurements can be performed on this versatile station. Researchers can use it for testing magneto-transport parameters. The EMPX‑H2 is Lake Shore’s premier probe station for vector-dependent magneto-transport measurements.

Product

Complete Probe Station

BD Series

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EverBeing Int'l Corp

BD Series - EverBeing Int'l Corp

Best for DC and RF probing, the platen lift is designed for smooth raise and contact of your probes simultaneously to your device. It is ideal for probing multiple spots on your device, or through multiple devices.

Product

Hot Chucks

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Materials Development Corporation

Materials Development Corporation

Probe stations to suit all measurement requirementswhether production, engineering or research. See individual data sheets for more details.

Product

Lab Assistant

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SemiProbe

SemiProbe

The SemiProbe Lab Assistant family of probe stations is specifically designed to address the requirements of universities and research personnel. Lab Assistant probe stations provide simplicity, ease of operation, portability, affordability and modularity. Lab Assistant probe stations can be configured for DC or HF/Microwave testing configurations, including an array of sophisticated accessories that are usually only found on much larger, more expensive probing stations.

Product

Line Automation Equipment

5000 Series In-line Handler

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Circuit Check, Inc.

5000 Series In-line Handler - Circuit Check, Inc.

The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.

Product

Probe Card

T90™ Series

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Celadon

T90™ Series - Celadon

The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

Product

Powerful, Fully Integrated Workstation for Emission Microscopy

PEM-1000

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Korima, Inc.

PEM-1000 - Korima, Inc.

The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.

Product

Standard Probe Station Chucks & Accessories

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ABET Technologies, Inc.

ABET Technologies, Inc.

In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.

Product

Fully Manual Systems

SPS-1000, SPS-2000, and SPS-2200

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MicroXact, Inc.

SPS-1000, SPS-2000, and SPS-2200 - MicroXact, Inc.

The SPS-1000, SPS-2000, and SPS-2200 systems are MicroXact’s premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own.

Product

Automated DC Parametric Curve Tracer

MegaTrace

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Robson Technologies, Inc.

MegaTrace - Robson Technologies, Inc.

MegaTrace supports pin counts greater than 625 up to 2160 pins, with 1080 pins being popular. Comprised of a cart that contains the test chassis, PC monitor, drive bus box, and a test interface, MegaTrace is easy to move around and use with other instruments like emission microscopes, probe stations, and other remote testing requirements.

Product

Probe Stations

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Probing Solutions, Inc.

Probing Solutions, Inc.

PSI's 600LS Series Probe Station is designed to exceed performance metrics of equipment priced significantly higher.

Product

Optoelectronics and Photonics

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SemiProbe

SemiProbe

SemiProbe has developed probe stations for a wide variety of optoelectronic and photonic device applications, including light emitting diodes (LEDs), vertical cavity surface emitting lasers (VCSEL) and photo diodes. Testing and handling small, fragile, thin wafers with thousands of die on them poses unique challenges that require innovative solutions.

Product

Analytical Probe Station with Laser Cutting System

LCS- 4000 Series

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MicroXact, Inc.

LCS- 4000 Series - MicroXact, Inc.

The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.

Product

Wafer Test Solutions

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AEM Holdings Ltd

AEM Holdings Ltd

Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.